XTRA:AFXMedical Equipment
How Carl Zeiss Meditec’s New Crossbeam 750 FIB-SEM At Carl Zeiss Meditec (XTRA:AFX) Has Changed Its Investment Story
Carl Zeiss Meditec recently unveiled the ZEISS Crossbeam 750 FIB-SEM, a high-precision focused ion beam-scanning electron microscope that combines new Gemini 4 electron optics with real-time “see while you mill” imaging for advanced semiconductor, materials science, and life sciences workflows.
The system’s ability to deliver background-free, real-time endpointing and sub-nanometer precision for TEM lamellae and 3D analysis could deepen the company’s role in cutting-edge chip and materials...