View Future GrowthJEOL 과거 순이익 실적과거 기준 점검 4/6JEOL은 연평균 20.3%의 비율로 수입이 증가해 온 반면, Electronic 산업은 수입이 3.6% 증가했습니다. 매출은 연평균 11%의 비율로 증가했습니다. JEOL의 자기자본이익률은 15.3%이고 순이익률은 12.3%입니다.핵심 정보20.28%순이익 성장률19.77%주당순이익(EPS) 성장률Electronic 산업 성장률15.34%매출 성장률11.00%자기자본이익률15.25%순이익률12.32%최근 순이익 업데이트31 Mar 2026최근 과거 실적 업데이트공시 • May 10JEOL Ltd. to Report Fiscal Year 2026 Results on May 15, 2026JEOL Ltd. announced that they will report fiscal year 2026 results at 3:00 PM, Tokyo Standard Time on May 15, 2026공시 • Dec 06JEOL Ltd. to Report Q3, 2026 Results on Feb 13, 2026JEOL Ltd. announced that they will report Q3, 2026 results on Feb 13, 2026공시 • Sep 26JEOL Ltd. to Report Q2, 2026 Results on Nov 14, 2025JEOL Ltd. announced that they will report Q2, 2026 results on Nov 14, 2025공시 • Jun 27JEOL Ltd. to Report Q1, 2026 Results on Aug 13, 2025JEOL Ltd. announced that they will report Q1, 2026 results on Aug 13, 2025공시 • Mar 15JEOL Ltd. to Report Fiscal Year 2025 Results on May 15, 2025JEOL Ltd. announced that they will report fiscal year 2025 results on May 15, 2025공시 • Dec 04JEOL Ltd. to Report Q3, 2025 Results on Feb 12, 2025JEOL Ltd. announced that they will report Q3, 2025 results on Feb 12, 2025모든 업데이트 보기Recent updates공시 • May 15JEOL Ltd., Annual General Meeting, Jun 25, 2026JEOL Ltd., Annual General Meeting, Jun 25, 2026.공시 • May 10JEOL Ltd. to Report Fiscal Year 2026 Results on May 15, 2026JEOL Ltd. announced that they will report fiscal year 2026 results at 3:00 PM, Tokyo Standard Time on May 15, 2026공시 • Feb 02JEOL Ltd. (TSE:6951) announces an Equity Buyback for 2,500,000 shares, representing 4.88% for ¥12,870 million.JEOL Ltd. (TSE:6951) announces a share repurchase program. Under the program, the company will repurchase up to 2,500,000 shares, representing 4.88% of its issued share capital, for ¥12,870 million. Shares will be repurchased at a price of ¥5,148 per share. Under the offer the company will repurchase 2,300,000 shares from Nikon Corporation. The purpose of the program is returning profits to shareholders and to enable the agile implementation of capital policies in response to changes in the business environment. If the number of tendered shares exceed the number of shares to be purchased then the actual number of shares purchased may exceed the number of shares to be purchased as a result of unit adjustment on a pro rata basis. The offer is valid till March 4, 2026. As of September 30, 2025, the company had 51,181,974 shares (excluding treasury shares) and 350,826 shares in treasury.공시 • Dec 06JEOL Ltd. to Report Q3, 2026 Results on Feb 13, 2026JEOL Ltd. announced that they will report Q3, 2026 results on Feb 13, 2026공시 • Sep 26JEOL Ltd. to Report Q2, 2026 Results on Nov 14, 2025JEOL Ltd. announced that they will report Q2, 2026 results on Nov 14, 2025공시 • Jun 27JEOL Ltd. to Report Q1, 2026 Results on Aug 13, 2025JEOL Ltd. announced that they will report Q1, 2026 results on Aug 13, 2025공시 • May 15JEOL Ltd., Annual General Meeting, Jun 26, 2025JEOL Ltd., Annual General Meeting, Jun 26, 2025.공시 • Mar 15JEOL Ltd. to Report Fiscal Year 2025 Results on May 15, 2025JEOL Ltd. announced that they will report fiscal year 2025 results on May 15, 2025공시 • Dec 04JEOL Ltd. to Report Q3, 2025 Results on Feb 12, 2025JEOL Ltd. announced that they will report Q3, 2025 results on Feb 12, 2025공시 • Nov 26JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406).JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406) on November 22, 2024. Post the closing of the transaction, Kobe Steel will not hold any stake in Japan Superconductor Technology. For the period ending March 31, 2024, Japan Superconductor Technology, Inc. reported total revenue of ¥4.14 billion. The expected completion of the transaction is January 6, 2025.공시 • Sep 27JEOL Ltd. to Report Q2, 2025 Results on Nov 08, 2024JEOL Ltd. announced that they will report Q2, 2025 results on Nov 08, 2024공시 • Sep 04JEOL Ltd. Announces the Release of the New CROSS SECTION POLISHER IB-19540CP / COOLING CROSS SECTION POLISHER IB-19550CCP for Electron MicroscopesJEOL Ltd. announced the release of the New CROSS SECTION POLISHER IB-19540CP /COOLING CROSS SECTION POLISHER IB-19550CCP for Electron Microscopes on September 4, 2024. CROSS SECTION POLISHER™(CP)is widely utilized in the fields of electronic parts, ceramics, life science, metal, battery, and polymer. The mechanical high-quality uniform cross section can be easily prepared for complex materials and fragile specimens. With a sales record of over 2,000 units since its launch in 2003, the CP has been an essential tool for pre-treatment. The IB-19540CP /IB-19550CCP have been advanced with enhanced user-friendliness. Incorporation of the new GUI and IoT (Internet of Things) further improves ease of use and enables remote control and milling process monitoring by PC. High throughput ion source and high throughput cooling system enable preparation of a smooth cross section rapidly with less damages. Main features: New GUI and Internet of Things (IoT) - Incorporation of a new GUI makes the operation steps easy to understand. Easy setup is possible by following the flowchart on the control panel. Preset functions are available for saving and recalling process conditions tailored to specific applications or specimen types. Connecting to LAN provides remote access and control through a web browser to the CP. Monitoring and adjusting the milling process over multiple CPs is possible. High throughput ion source: High throughput ion source is equipped as a standard. The ion current density has been improved by optimizing the ion-source electrode and increasing the accelerating voltage. The standard cross section milling rate is now 1,200 µm/h and it will help reduce the time required for processing. Milling of 1 h, Si equivalent, Edge distance: 100 µm. High throughput cooling system: The high throughput cooling system and the new GUI enable automatic operation from cooling to return to room temperature. Thus, the waiting time has been reduced and it helps shorten the time required for work. It is possible to vacuum around the liquid nitrogen tank from the CP side to maintain cooling retention time and specimen cooling temperature. Annual Unit Sales Target - 180 units/year.공시 • Jul 31JEOL Ltd. Announces New Schottky Field Emission Scanning Electron Microscope JSM-IT810 ReleasedJEOL Ltd. announced the release of the new Schottky Field Emission Scanning Electron Microscope JSM-IT810 on July 28, 2024. Field Emission Scanning Electron Microscopes (FESEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis. The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the “SEM Center” for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages. Main Features: 1. Automatic Observation and Analysis Function “Neo Action”: All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work. 2. Automatic Calibration Function “SEM Automatic Adjustment Package”: This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration. 3. “Live Function”: This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping. 4. EDS Integration: Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.공시 • May 30JEOL Ltd. Announces the Release of the New Electron Microscope JEM-120iJEOL Ltd. announced the release of the new electron microscope JEM-120i developed with the concepts of “Compact”, “Easy To Use”, and “Expandable” on May 30, 2024. Electron microscopes are utilized in a wide range of fields from biotechnology to nano technology, polymers, and advanced materials. With the expansion of application, usages are also expanding, which requires a tool that is easy-to-use for research and testing purposes. To satisfy such needs, the JEM-120i has evolved into a next-generation microscope that is easy to use, from operation to maintenance, for both beginner and experienced users. Compact: The JEM-120i adopts a totally new appearance and compact design that fits any installation location. The footprint has been reduced by more than 50%, and the volume occupied by the instrument is less than one-third of that of conventional models, enabling effective use of space. The instrument height is lower than 1,800mm, which fits just about any installation room. Easy to Use: The enhanced TEM control system and fully automated apertures eliminated the need for switching the magnification mode and selecting an aperture. The JEM-120i provides seamless observations from low to high magnification. It takes only 4 steps from loading a specimen to completing an observation. After inserting the specimen holder, clicking the Start Button automatically performs observation preparation operations such as voltage increase and emission start. A wide area image is captured at the same time, and clicking the target field of view will complete the stage movement. Standard “Butler mode” assists data acquisition. Even a beginner can capture data easily. Expandable: In addition to the standard multi-function camera, a bottom-mount camera of higher pixel count can be selected as an option. Attachments such as the scanning image observation function (STEM), elemental analysis function (EDS), and cryo observation function can be applied, regardless of instrument configuration. The instrument can be expanded at any time to meet the changing needs of microscopy over time. The proven scripting function (PyJEM) with the high-end models, can create an algorithm for automation. The automation can increase the utilization rate of the instrument and improve data output efficiency. Main Specifications: Resolution- 0.2 nm (HC), 0.14 nm (HR). Accelerating voltage- 20-120kV. Magnification- 50-1,200,000 (HC), 50-1,500,000 (HR). Standard camera- JEOL CMOS camera (NeoView) 4M pixel, 30fps. Field of view search/adjustment/recording. Optional camera- JEOL CMOS camera (SightSKY) 19M pixel, 58fps. Cameras made by other companies can also be mounted. Main unit dimensions: W 840mm/D 1,734mm/H 1,782mm.공시 • May 16JEOL Ltd., Annual General Meeting, Jun 26, 2024JEOL Ltd., Annual General Meeting, Jun 26, 2024.공시 • May 15JEOL Ltd. Announces Resignation of Gon-Emon Kurihara as ChairmanJEOL Ltd. announced the resignation of Gon-emon Kurihara as chairman of the company due to expiration of term.공시 • Mar 02JEOL Ltd. to Report Fiscal Year 2024 Results on May 14, 2024JEOL Ltd. announced that they will report fiscal year 2024 results on May 14, 2024공시 • Nov 27JEOL Ltd. to Report Q3, 2024 Results on Feb 09, 2024JEOL Ltd. announced that they will report Q3, 2024 results on Feb 09, 2024공시 • Aug 31JEOL Ltd. to Report Q2, 2024 Results on Nov 10, 2023JEOL Ltd. announced that they will report Q2, 2024 results on Nov 10, 2023공시 • Jun 03JEOL Ltd. to Report Q1, 2024 Results on Aug 10, 2023JEOL Ltd. announced that they will report Q1, 2024 results on Aug 10, 2023공시 • May 14JEOL Ltd., Annual General Meeting, Jun 28, 2023JEOL Ltd., Annual General Meeting, Jun 28, 2023.공시 • Feb 01JEOL Ltd. Announces its Launch of the FIB-SEM system “JIB-PS500i”JEOL Ltd. announced its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required. This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs. Main Features: The FIB column enables processing with a large-current Ga ion beam up to 100nA. The high-current processing is particularly effective in preparing cross section samples for large-area imaging and analysis. In addition, the FIB column is set to a shorter working distance. Along with a newly-developed power supply, it has led to greatly improved processing performance at a low accelerating voltage. A newly-developed super conical lens system is built into the SEM column, greatly improving the image resolution at a low accelerating voltage. This superb imaging is very useful to check the end-point milling status of lamella specimen using the SEM. The JIB-PS500i adopts a large specimen chamber and a newly-developed specimen stage, increasing the stage movement range, and thus accommodating a large specimen. In addition, a newly-developed STEM detector that can be used with the stage tilt at 90 degrees, allows for a seamless transition from the TEM specimen preparation to STEM observation. For the operating GUI, the “SEM center”, which has been well received in the JSM-IT800 series of high-resolution scanning electron microscopes is employed, enabling full integration of EDS analysis. A double tilt cartridge and a dedicated TEM holder allows for more precise alignment while making specimen transfer between TEM and FIB easier.매출 및 비용 세부 내역JEOL가 돈을 벌고 사용하는 방법. 최근 발표된 LTM 실적 기준.순이익 및 매출 추이OTCPK:JELL.F 매출, 비용 및 순이익 (JPY Millions)날짜매출순이익일반관리비연구개발비31 Mar 26179,35322,09745,60611,40531 Dec 25190,14716,24342,97911,89630 Sep 25191,52017,62243,23511,78630 Jun 25200,48619,46142,97911,53231 Mar 25196,69518,68842,97911,97831 Dec 24203,81131,49442,60911,27530 Sep 24192,85225,10441,39211,14430 Jun 24182,01923,87640,72311,13231 Mar 24174,33621,70439,74110,26431 Dec 23161,87114,71038,75011,25930 Sep 23166,66418,11738,15711,14030 Jun 23162,50416,33937,47010,84131 Mar 23162,68917,83036,44110,39131 Dec 22155,28618,21335,2789,12730 Sep 22149,78315,84233,9828,90130 Jun 22143,47014,73032,5288,73831 Mar 22138,40812,27831,2358,51631 Dec 21126,0278,77930,3348,47630 Sep 21114,4195,47829,5038,25930 Jun 21113,2854,39328,8678,02331 Mar 21110,4393,74528,2958,06431 Dec 20112,6914,41528,0067,94230 Sep 20115,5196,06228,3087,97530 Jun 20119,4497,05228,5637,98731 Mar 20117,2435,35929,1167,75631 Dec 19117,7846,49228,9237,59430 Sep 19115,6795,78828,5017,49730 Jun 19110,0735,09428,2347,34931 Mar 19111,2895,94027,8447,18431 Dec 18110,0396,32327,6407,13930 Sep 18110,5936,64427,4336,75430 Jun 18108,7275,92527,0886,38531 Mar 18104,5704,53226,7816,04431 Dec 17101,8173,71026,1365,18730 Sep 1795,9612,43125,7685,18330 Jun 1796,42669525,6015,60631 Mar 1799,69859525,8336,12931 Dec 16101,484-30625,7806,69830 Sep 16105,28922326,4527,05030 Jun 16108,2591,97726,7427,05831 Mar 16107,3734,08926,4646,47931 Dec 15107,5405,84426,7316,14230 Sep 15103,2015,53625,9975,66430 Jun 1597,5974,56825,7165,290양질의 수익: JELL.F는 고품질 수익을 보유하고 있습니다.이익 마진 증가: JELL.F의 현재 순 이익률 (12.3%)은 지난해 (9.5%)보다 높습니다.잉여현금흐름 대비 순이익 분석과거 순이익 성장 분석수익추이: JELL.F의 수익은 지난 5년 동안 연평균 20.3%로 크게 증가했습니다.성장 가속화: 지난 1년간 JELL.F 의 수익 증가율(18.2%)은 5년 평균(연간 20.3%)보다 낮습니다.수익 대 산업: JELL.F의 지난 1년 수익 증가율(18.2%)은 Electronic 업계의 10.6%를 상회했습니다.자기자본이익률높은 ROE: JELL.F의 자본 수익률(15.3%)은 낮음으로 평가됩니다.총자산이익률투하자본수익률우수한 과거 실적 기업을 찾아보세요7D1Y7D1Y7D1YTech 산업에서 과거 실적이 우수한 기업.View Financial Health기업 분석 및 재무 데이터 상태데이터최종 업데이트 (UTC 시간)기업 분석2026/06/25 03:16종가2026/06/15 00:00수익2026/03/31연간 수익2026/03/31데이터 소스당사의 기업 분석에 사용되는 데이터는 S&P Global Market Intelligence LLC에서 제공됩니다. 아래 데이터는 이 보고서를 생성하기 위해 분석 모델에서 사용됩니다. 데이터는 정규화되므로 소스가 제공된 후 지연이 발생할 수 있습니다.패키지데이터기간미국 소스 예시 *기업 재무제표10년손익계산서현금흐름표대차대조표SEC 양식 10-KSEC 양식 10-Q분석가 컨센서스 추정치+3년재무 예측분석가 목표주가분석가 리서치 보고서Blue Matrix시장 가격30년주가배당, 분할 및 기타 조치ICE 시장 데이터SEC 양식 S-1지분 구조10년주요 주주내부자 거래SEC 양식 4SEC 양식 13D경영진10년리더십 팀이사회SEC 양식 10-KSEC 양식 DEF 14A주요 개발10년회사 공시SEC 양식 8-K* 미국 증권에 대한 예시이며, 비(非)미국 증권에는 해당 국가의 규제 서식 및 자료원을 사용합니다.별도로 명시되지 않는 한 모든 재무 데이터는 연간 기간을 기준으로 하지만 분기별로 업데이트됩니다. 이를 TTM(최근 12개월) 또는 LTM(지난 12개월) 데이터라고 합니다. 자세히 알아보기.분석 모델 및 스노우플레이크이 보고서를 생성하는 데 사용된 분석 모델에 대한 세부 정보는 당사의 Github 페이지에서 확인하실 수 있으며, 보고서 활용 방법에 대한 가이드와 YouTube 튜토리얼도 제공하고 있습니다.Simply Wall St 분석 모델을 설계하고 구축한 세계적 수준의 팀에 대해 알아보세요.산업 및 섹터 지표산업 및 섹터 지표는 Simply Wall St가 6시간마다 계산하며, 프로세스에 대한 자세한 내용은 Github에서 확인할 수 있습니다.분석가 소스JEOL Ltd.는 10명의 분석가가 다루고 있습니다. 이 중 5명의 분석가가 우리 보고서에 입력 데이터로 사용되는 매출 또는 수익 추정치를 제출했습니다. 분석가의 제출 자료는 하루 종일 업데이트됩니다.분석가기관Masahiro NakanomyoBarclaysMayako OuchiBofA Global ResearchShuhei NakamuraGoldman Sachs7명의 분석가 더 보기
공시 • May 10JEOL Ltd. to Report Fiscal Year 2026 Results on May 15, 2026JEOL Ltd. announced that they will report fiscal year 2026 results at 3:00 PM, Tokyo Standard Time on May 15, 2026
공시 • Dec 06JEOL Ltd. to Report Q3, 2026 Results on Feb 13, 2026JEOL Ltd. announced that they will report Q3, 2026 results on Feb 13, 2026
공시 • Sep 26JEOL Ltd. to Report Q2, 2026 Results on Nov 14, 2025JEOL Ltd. announced that they will report Q2, 2026 results on Nov 14, 2025
공시 • Jun 27JEOL Ltd. to Report Q1, 2026 Results on Aug 13, 2025JEOL Ltd. announced that they will report Q1, 2026 results on Aug 13, 2025
공시 • Mar 15JEOL Ltd. to Report Fiscal Year 2025 Results on May 15, 2025JEOL Ltd. announced that they will report fiscal year 2025 results on May 15, 2025
공시 • Dec 04JEOL Ltd. to Report Q3, 2025 Results on Feb 12, 2025JEOL Ltd. announced that they will report Q3, 2025 results on Feb 12, 2025
공시 • May 15JEOL Ltd., Annual General Meeting, Jun 25, 2026JEOL Ltd., Annual General Meeting, Jun 25, 2026.
공시 • May 10JEOL Ltd. to Report Fiscal Year 2026 Results on May 15, 2026JEOL Ltd. announced that they will report fiscal year 2026 results at 3:00 PM, Tokyo Standard Time on May 15, 2026
공시 • Feb 02JEOL Ltd. (TSE:6951) announces an Equity Buyback for 2,500,000 shares, representing 4.88% for ¥12,870 million.JEOL Ltd. (TSE:6951) announces a share repurchase program. Under the program, the company will repurchase up to 2,500,000 shares, representing 4.88% of its issued share capital, for ¥12,870 million. Shares will be repurchased at a price of ¥5,148 per share. Under the offer the company will repurchase 2,300,000 shares from Nikon Corporation. The purpose of the program is returning profits to shareholders and to enable the agile implementation of capital policies in response to changes in the business environment. If the number of tendered shares exceed the number of shares to be purchased then the actual number of shares purchased may exceed the number of shares to be purchased as a result of unit adjustment on a pro rata basis. The offer is valid till March 4, 2026. As of September 30, 2025, the company had 51,181,974 shares (excluding treasury shares) and 350,826 shares in treasury.
공시 • Dec 06JEOL Ltd. to Report Q3, 2026 Results on Feb 13, 2026JEOL Ltd. announced that they will report Q3, 2026 results on Feb 13, 2026
공시 • Sep 26JEOL Ltd. to Report Q2, 2026 Results on Nov 14, 2025JEOL Ltd. announced that they will report Q2, 2026 results on Nov 14, 2025
공시 • Jun 27JEOL Ltd. to Report Q1, 2026 Results on Aug 13, 2025JEOL Ltd. announced that they will report Q1, 2026 results on Aug 13, 2025
공시 • May 15JEOL Ltd., Annual General Meeting, Jun 26, 2025JEOL Ltd., Annual General Meeting, Jun 26, 2025.
공시 • Mar 15JEOL Ltd. to Report Fiscal Year 2025 Results on May 15, 2025JEOL Ltd. announced that they will report fiscal year 2025 results on May 15, 2025
공시 • Dec 04JEOL Ltd. to Report Q3, 2025 Results on Feb 12, 2025JEOL Ltd. announced that they will report Q3, 2025 results on Feb 12, 2025
공시 • Nov 26JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406).JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406) on November 22, 2024. Post the closing of the transaction, Kobe Steel will not hold any stake in Japan Superconductor Technology. For the period ending March 31, 2024, Japan Superconductor Technology, Inc. reported total revenue of ¥4.14 billion. The expected completion of the transaction is January 6, 2025.
공시 • Sep 27JEOL Ltd. to Report Q2, 2025 Results on Nov 08, 2024JEOL Ltd. announced that they will report Q2, 2025 results on Nov 08, 2024
공시 • Sep 04JEOL Ltd. Announces the Release of the New CROSS SECTION POLISHER IB-19540CP / COOLING CROSS SECTION POLISHER IB-19550CCP for Electron MicroscopesJEOL Ltd. announced the release of the New CROSS SECTION POLISHER IB-19540CP /COOLING CROSS SECTION POLISHER IB-19550CCP for Electron Microscopes on September 4, 2024. CROSS SECTION POLISHER™(CP)is widely utilized in the fields of electronic parts, ceramics, life science, metal, battery, and polymer. The mechanical high-quality uniform cross section can be easily prepared for complex materials and fragile specimens. With a sales record of over 2,000 units since its launch in 2003, the CP has been an essential tool for pre-treatment. The IB-19540CP /IB-19550CCP have been advanced with enhanced user-friendliness. Incorporation of the new GUI and IoT (Internet of Things) further improves ease of use and enables remote control and milling process monitoring by PC. High throughput ion source and high throughput cooling system enable preparation of a smooth cross section rapidly with less damages. Main features: New GUI and Internet of Things (IoT) - Incorporation of a new GUI makes the operation steps easy to understand. Easy setup is possible by following the flowchart on the control panel. Preset functions are available for saving and recalling process conditions tailored to specific applications or specimen types. Connecting to LAN provides remote access and control through a web browser to the CP. Monitoring and adjusting the milling process over multiple CPs is possible. High throughput ion source: High throughput ion source is equipped as a standard. The ion current density has been improved by optimizing the ion-source electrode and increasing the accelerating voltage. The standard cross section milling rate is now 1,200 µm/h and it will help reduce the time required for processing. Milling of 1 h, Si equivalent, Edge distance: 100 µm. High throughput cooling system: The high throughput cooling system and the new GUI enable automatic operation from cooling to return to room temperature. Thus, the waiting time has been reduced and it helps shorten the time required for work. It is possible to vacuum around the liquid nitrogen tank from the CP side to maintain cooling retention time and specimen cooling temperature. Annual Unit Sales Target - 180 units/year.
공시 • Jul 31JEOL Ltd. Announces New Schottky Field Emission Scanning Electron Microscope JSM-IT810 ReleasedJEOL Ltd. announced the release of the new Schottky Field Emission Scanning Electron Microscope JSM-IT810 on July 28, 2024. Field Emission Scanning Electron Microscopes (FESEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis. The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the “SEM Center” for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages. Main Features: 1. Automatic Observation and Analysis Function “Neo Action”: All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work. 2. Automatic Calibration Function “SEM Automatic Adjustment Package”: This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration. 3. “Live Function”: This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping. 4. EDS Integration: Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.
공시 • May 30JEOL Ltd. Announces the Release of the New Electron Microscope JEM-120iJEOL Ltd. announced the release of the new electron microscope JEM-120i developed with the concepts of “Compact”, “Easy To Use”, and “Expandable” on May 30, 2024. Electron microscopes are utilized in a wide range of fields from biotechnology to nano technology, polymers, and advanced materials. With the expansion of application, usages are also expanding, which requires a tool that is easy-to-use for research and testing purposes. To satisfy such needs, the JEM-120i has evolved into a next-generation microscope that is easy to use, from operation to maintenance, for both beginner and experienced users. Compact: The JEM-120i adopts a totally new appearance and compact design that fits any installation location. The footprint has been reduced by more than 50%, and the volume occupied by the instrument is less than one-third of that of conventional models, enabling effective use of space. The instrument height is lower than 1,800mm, which fits just about any installation room. Easy to Use: The enhanced TEM control system and fully automated apertures eliminated the need for switching the magnification mode and selecting an aperture. The JEM-120i provides seamless observations from low to high magnification. It takes only 4 steps from loading a specimen to completing an observation. After inserting the specimen holder, clicking the Start Button automatically performs observation preparation operations such as voltage increase and emission start. A wide area image is captured at the same time, and clicking the target field of view will complete the stage movement. Standard “Butler mode” assists data acquisition. Even a beginner can capture data easily. Expandable: In addition to the standard multi-function camera, a bottom-mount camera of higher pixel count can be selected as an option. Attachments such as the scanning image observation function (STEM), elemental analysis function (EDS), and cryo observation function can be applied, regardless of instrument configuration. The instrument can be expanded at any time to meet the changing needs of microscopy over time. The proven scripting function (PyJEM) with the high-end models, can create an algorithm for automation. The automation can increase the utilization rate of the instrument and improve data output efficiency. Main Specifications: Resolution- 0.2 nm (HC), 0.14 nm (HR). Accelerating voltage- 20-120kV. Magnification- 50-1,200,000 (HC), 50-1,500,000 (HR). Standard camera- JEOL CMOS camera (NeoView) 4M pixel, 30fps. Field of view search/adjustment/recording. Optional camera- JEOL CMOS camera (SightSKY) 19M pixel, 58fps. Cameras made by other companies can also be mounted. Main unit dimensions: W 840mm/D 1,734mm/H 1,782mm.
공시 • May 16JEOL Ltd., Annual General Meeting, Jun 26, 2024JEOL Ltd., Annual General Meeting, Jun 26, 2024.
공시 • May 15JEOL Ltd. Announces Resignation of Gon-Emon Kurihara as ChairmanJEOL Ltd. announced the resignation of Gon-emon Kurihara as chairman of the company due to expiration of term.
공시 • Mar 02JEOL Ltd. to Report Fiscal Year 2024 Results on May 14, 2024JEOL Ltd. announced that they will report fiscal year 2024 results on May 14, 2024
공시 • Nov 27JEOL Ltd. to Report Q3, 2024 Results on Feb 09, 2024JEOL Ltd. announced that they will report Q3, 2024 results on Feb 09, 2024
공시 • Aug 31JEOL Ltd. to Report Q2, 2024 Results on Nov 10, 2023JEOL Ltd. announced that they will report Q2, 2024 results on Nov 10, 2023
공시 • Jun 03JEOL Ltd. to Report Q1, 2024 Results on Aug 10, 2023JEOL Ltd. announced that they will report Q1, 2024 results on Aug 10, 2023
공시 • May 14JEOL Ltd., Annual General Meeting, Jun 28, 2023JEOL Ltd., Annual General Meeting, Jun 28, 2023.
공시 • Feb 01JEOL Ltd. Announces its Launch of the FIB-SEM system “JIB-PS500i”JEOL Ltd. announced its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required. This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs. Main Features: The FIB column enables processing with a large-current Ga ion beam up to 100nA. The high-current processing is particularly effective in preparing cross section samples for large-area imaging and analysis. In addition, the FIB column is set to a shorter working distance. Along with a newly-developed power supply, it has led to greatly improved processing performance at a low accelerating voltage. A newly-developed super conical lens system is built into the SEM column, greatly improving the image resolution at a low accelerating voltage. This superb imaging is very useful to check the end-point milling status of lamella specimen using the SEM. The JIB-PS500i adopts a large specimen chamber and a newly-developed specimen stage, increasing the stage movement range, and thus accommodating a large specimen. In addition, a newly-developed STEM detector that can be used with the stage tilt at 90 degrees, allows for a seamless transition from the TEM specimen preparation to STEM observation. For the operating GUI, the “SEM center”, which has been well received in the JSM-IT800 series of high-resolution scanning electron microscopes is employed, enabling full integration of EDS analysis. A double tilt cartridge and a dedicated TEM holder allows for more precise alignment while making specimen transfer between TEM and FIB easier.