View Past PerformanceJEOL バランスシートの健全性財務の健全性 基準チェック /66JEOLの総株主資本は¥149.5B 、総負債は¥12.1Bで、負債比率は8.1%となります。総資産と総負債はそれぞれ¥234.1Bと¥84.6Bです。 JEOLの EBIT は¥30.7Bで、利息カバレッジ比率-74.8です。現金および短期投資は¥38.0Bです。主要情報8.07%負債資本比率JP¥12.06b負債インタレスト・カバレッジ・レシオ-74.8x現金JP¥38.05bエクイティJP¥149.51b負債合計JP¥84.63b総資産JP¥234.14b財務の健全性に関する最新情報更新なしすべての更新を表示Recent updatesお知らせ • Feb 02JEOL Ltd. (TSE:6951) announces an Equity Buyback for 2,500,000 shares, representing 4.88% for ¥12,870 million.JEOL Ltd. (TSE:6951) announces a share repurchase program. Under the program, the company will repurchase up to 2,500,000 shares, representing 4.88% of its issued share capital, for ¥12,870 million. Shares will be repurchased at a price of ¥5,148 per share. Under the offer the company will repurchase 2,300,000 shares from Nikon Corporation. The purpose of the program is returning profits to shareholders and to enable the agile implementation of capital policies in response to changes in the business environment. If the number of tendered shares exceed the number of shares to be purchased then the actual number of shares purchased may exceed the number of shares to be purchased as a result of unit adjustment on a pro rata basis. The offer is valid till March 4, 2026. As of September 30, 2025, the company had 51,181,974 shares (excluding treasury shares) and 350,826 shares in treasury.お知らせ • Dec 06JEOL Ltd. to Report Q3, 2026 Results on Feb 13, 2026JEOL Ltd. announced that they will report Q3, 2026 results on Feb 13, 2026お知らせ • Sep 26JEOL Ltd. to Report Q2, 2026 Results on Nov 14, 2025JEOL Ltd. announced that they will report Q2, 2026 results on Nov 14, 2025お知らせ • Jun 27JEOL Ltd. to Report Q1, 2026 Results on Aug 13, 2025JEOL Ltd. announced that they will report Q1, 2026 results on Aug 13, 2025お知らせ • May 15JEOL Ltd., Annual General Meeting, Jun 26, 2025JEOL Ltd., Annual General Meeting, Jun 26, 2025.お知らせ • Mar 15JEOL Ltd. to Report Fiscal Year 2025 Results on May 15, 2025JEOL Ltd. announced that they will report fiscal year 2025 results on May 15, 2025お知らせ • Dec 04JEOL Ltd. to Report Q3, 2025 Results on Feb 12, 2025JEOL Ltd. announced that they will report Q3, 2025 results on Feb 12, 2025お知らせ • Nov 26JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406).JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406) on November 22, 2024. Post the closing of the transaction, Kobe Steel will not hold any stake in Japan Superconductor Technology. For the period ending March 31, 2024, Japan Superconductor Technology, Inc. reported total revenue of ¥4.14 billion. The expected completion of the transaction is January 6, 2025.お知らせ • Sep 27JEOL Ltd. to Report Q2, 2025 Results on Nov 08, 2024JEOL Ltd. announced that they will report Q2, 2025 results on Nov 08, 2024お知らせ • Sep 04JEOL Ltd. Announces the Release of the New CROSS SECTION POLISHER IB-19540CP / COOLING CROSS SECTION POLISHER IB-19550CCP for Electron MicroscopesJEOL Ltd. announced the release of the New CROSS SECTION POLISHER IB-19540CP /COOLING CROSS SECTION POLISHER IB-19550CCP for Electron Microscopes on September 4, 2024. CROSS SECTION POLISHER™(CP)is widely utilized in the fields of electronic parts, ceramics, life science, metal, battery, and polymer. The mechanical high-quality uniform cross section can be easily prepared for complex materials and fragile specimens. With a sales record of over 2,000 units since its launch in 2003, the CP has been an essential tool for pre-treatment. The IB-19540CP /IB-19550CCP have been advanced with enhanced user-friendliness. Incorporation of the new GUI and IoT (Internet of Things) further improves ease of use and enables remote control and milling process monitoring by PC. High throughput ion source and high throughput cooling system enable preparation of a smooth cross section rapidly with less damages. Main features: New GUI and Internet of Things (IoT) - Incorporation of a new GUI makes the operation steps easy to understand. Easy setup is possible by following the flowchart on the control panel. Preset functions are available for saving and recalling process conditions tailored to specific applications or specimen types. Connecting to LAN provides remote access and control through a web browser to the CP. Monitoring and adjusting the milling process over multiple CPs is possible. High throughput ion source: High throughput ion source is equipped as a standard. The ion current density has been improved by optimizing the ion-source electrode and increasing the accelerating voltage. The standard cross section milling rate is now 1,200 µm/h and it will help reduce the time required for processing. Milling of 1 h, Si equivalent, Edge distance: 100 µm. High throughput cooling system: The high throughput cooling system and the new GUI enable automatic operation from cooling to return to room temperature. Thus, the waiting time has been reduced and it helps shorten the time required for work. It is possible to vacuum around the liquid nitrogen tank from the CP side to maintain cooling retention time and specimen cooling temperature. Annual Unit Sales Target - 180 units/year.お知らせ • Jul 31JEOL Ltd. Announces New Schottky Field Emission Scanning Electron Microscope JSM-IT810 ReleasedJEOL Ltd. announced the release of the new Schottky Field Emission Scanning Electron Microscope JSM-IT810 on July 28, 2024. Field Emission Scanning Electron Microscopes (FESEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis. The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the “SEM Center” for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages. Main Features: 1. Automatic Observation and Analysis Function “Neo Action”: All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work. 2. Automatic Calibration Function “SEM Automatic Adjustment Package”: This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration. 3. “Live Function”: This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping. 4. EDS Integration: Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.お知らせ • May 30JEOL Ltd. Announces the Release of the New Electron Microscope JEM-120iJEOL Ltd. announced the release of the new electron microscope JEM-120i developed with the concepts of “Compact”, “Easy To Use”, and “Expandable” on May 30, 2024. Electron microscopes are utilized in a wide range of fields from biotechnology to nano technology, polymers, and advanced materials. With the expansion of application, usages are also expanding, which requires a tool that is easy-to-use for research and testing purposes. To satisfy such needs, the JEM-120i has evolved into a next-generation microscope that is easy to use, from operation to maintenance, for both beginner and experienced users. Compact: The JEM-120i adopts a totally new appearance and compact design that fits any installation location. The footprint has been reduced by more than 50%, and the volume occupied by the instrument is less than one-third of that of conventional models, enabling effective use of space. The instrument height is lower than 1,800mm, which fits just about any installation room. Easy to Use: The enhanced TEM control system and fully automated apertures eliminated the need for switching the magnification mode and selecting an aperture. The JEM-120i provides seamless observations from low to high magnification. It takes only 4 steps from loading a specimen to completing an observation. After inserting the specimen holder, clicking the Start Button automatically performs observation preparation operations such as voltage increase and emission start. A wide area image is captured at the same time, and clicking the target field of view will complete the stage movement. Standard “Butler mode” assists data acquisition. Even a beginner can capture data easily. Expandable: In addition to the standard multi-function camera, a bottom-mount camera of higher pixel count can be selected as an option. Attachments such as the scanning image observation function (STEM), elemental analysis function (EDS), and cryo observation function can be applied, regardless of instrument configuration. The instrument can be expanded at any time to meet the changing needs of microscopy over time. The proven scripting function (PyJEM) with the high-end models, can create an algorithm for automation. The automation can increase the utilization rate of the instrument and improve data output efficiency. Main Specifications: Resolution- 0.2 nm (HC), 0.14 nm (HR). Accelerating voltage- 20-120kV. Magnification- 50-1,200,000 (HC), 50-1,500,000 (HR). Standard camera- JEOL CMOS camera (NeoView) 4M pixel, 30fps. Field of view search/adjustment/recording. Optional camera- JEOL CMOS camera (SightSKY) 19M pixel, 58fps. Cameras made by other companies can also be mounted. Main unit dimensions: W 840mm/D 1,734mm/H 1,782mm.お知らせ • May 16JEOL Ltd., Annual General Meeting, Jun 26, 2024JEOL Ltd., Annual General Meeting, Jun 26, 2024.お知らせ • May 15JEOL Ltd. Announces Resignation of Gon-Emon Kurihara as ChairmanJEOL Ltd. announced the resignation of Gon-emon Kurihara as chairman of the company due to expiration of term.お知らせ • Mar 02JEOL Ltd. to Report Fiscal Year 2024 Results on May 14, 2024JEOL Ltd. announced that they will report fiscal year 2024 results on May 14, 2024お知らせ • Nov 27JEOL Ltd. to Report Q3, 2024 Results on Feb 09, 2024JEOL Ltd. announced that they will report Q3, 2024 results on Feb 09, 2024お知らせ • Aug 31JEOL Ltd. to Report Q2, 2024 Results on Nov 10, 2023JEOL Ltd. announced that they will report Q2, 2024 results on Nov 10, 2023お知らせ • Jun 03JEOL Ltd. to Report Q1, 2024 Results on Aug 10, 2023JEOL Ltd. announced that they will report Q1, 2024 results on Aug 10, 2023お知らせ • May 14JEOL Ltd., Annual General Meeting, Jun 28, 2023JEOL Ltd., Annual General Meeting, Jun 28, 2023.お知らせ • Feb 01JEOL Ltd. Announces its Launch of the FIB-SEM system “JIB-PS500i”JEOL Ltd. announced its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required. This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs. Main Features: The FIB column enables processing with a large-current Ga ion beam up to 100nA. The high-current processing is particularly effective in preparing cross section samples for large-area imaging and analysis. In addition, the FIB column is set to a shorter working distance. Along with a newly-developed power supply, it has led to greatly improved processing performance at a low accelerating voltage. A newly-developed super conical lens system is built into the SEM column, greatly improving the image resolution at a low accelerating voltage. This superb imaging is very useful to check the end-point milling status of lamella specimen using the SEM. The JIB-PS500i adopts a large specimen chamber and a newly-developed specimen stage, increasing the stage movement range, and thus accommodating a large specimen. In addition, a newly-developed STEM detector that can be used with the stage tilt at 90 degrees, allows for a seamless transition from the TEM specimen preparation to STEM observation. For the operating GUI, the “SEM center”, which has been well received in the JSM-IT800 series of high-resolution scanning electron microscopes is employed, enabling full integration of EDS analysis. A double tilt cartridge and a dedicated TEM holder allows for more precise alignment while making specimen transfer between TEM and FIB easier.財務状況分析短期負債: JELL.Fの 短期資産 ( ¥168.8B ) が 短期負債 ( ¥65.3B ) を超えています。長期負債: JELL.Fの短期資産 ( ¥168.8B ) が 長期負債 ( ¥19.4B ) を上回っています。デット・ツー・エクイティの歴史と分析負債レベル: JELL.F総負債よりも多くの現金を保有しています。負債の削減: JELL.Fの負債対資本比率は、過去 5 年間で75.5%から8.1%に減少しました。債務返済能力: JELL.Fの負債は 営業キャッシュフロー によって 十分にカバー されています ( 123.5% )。インタレストカバレッジ: JELL.F支払う利息よりも稼ぐ利息の方が多いので、利息支払い の補償は問題になりません。貸借対照表健全な企業の発掘7D1Y7D1Y7D1YTech 業界の健全な企業。View Dividend企業分析と財務データの現状データ最終更新日（UTC時間）企業分析2026/04/14 05:25終値2026/01/16 00:00収益2025/12/31年間収益2025/03/31データソース企業分析に使用したデータはS&P Global Market Intelligence LLC のものです。本レポートを作成するための分析モデルでは、以下のデータを使用しています。データは正規化されているため、ソースが利用可能になるまでに時間がかかる場合があります。パッケージデータタイムフレーム米国ソース例会社財務10年損益計算書キャッシュ・フロー計算書貸借対照表SECフォーム10-KSECフォーム10-Qアナリストのコンセンサス予想+プラス3年予想財務アナリストの目標株価アナリストリサーチレポートBlue Matrix市場価格30年株価配当、分割、措置ICEマーケットデータSECフォームS-1所有権10年トップ株主インサイダー取引SECフォーム4SECフォーム13Dマネジメント10年リーダーシップ・チーム取締役会SECフォーム10-KSECフォームDEF 14A主な進展10年会社からのお知らせSECフォーム8-K* 米国証券を対象とした例であり、非米国証券については、同等の規制書式および情報源を使用。特に断りのない限り、すべての財務データは1年ごとの期間に基づいていますが、四半期ごとに更新されます。これは、TTM（Trailing Twelve Month）またはLTM（Last Twelve Month）データとして知られています。詳細はこちら。分析モデルとスノーフレーク本レポートを生成するために使用した分析モデルの詳細は当社のGithubページでご覧いただけます。また、レポートの使用方法に関するガイドやYoutubeのチュートリアルも掲載しています。シンプリー・ウォールストリート分析モデルを設計・構築した世界トップクラスのチームについてご紹介します。業界およびセクターの指標私たちの業界とセクションの指標は、Simply Wall Stによって6時間ごとに計算されます。アナリスト筋JEOL Ltd. 6 これらのアナリストのうち、弊社レポートのインプットとして使用した売上高または利益の予想を提出したのは、 。アナリストの投稿は一日中更新されます。11 アナリスト機関Masahiro NakanomyoBarclaysMayako OuchiBofA Global ResearchShuhei NakamuraGoldman Sachs8 その他のアナリストを表示
お知らせ • Feb 02JEOL Ltd. (TSE:6951) announces an Equity Buyback for 2,500,000 shares, representing 4.88% for ¥12,870 million.JEOL Ltd. (TSE:6951) announces a share repurchase program. Under the program, the company will repurchase up to 2,500,000 shares, representing 4.88% of its issued share capital, for ¥12,870 million. Shares will be repurchased at a price of ¥5,148 per share. Under the offer the company will repurchase 2,300,000 shares from Nikon Corporation. The purpose of the program is returning profits to shareholders and to enable the agile implementation of capital policies in response to changes in the business environment. If the number of tendered shares exceed the number of shares to be purchased then the actual number of shares purchased may exceed the number of shares to be purchased as a result of unit adjustment on a pro rata basis. The offer is valid till March 4, 2026. As of September 30, 2025, the company had 51,181,974 shares (excluding treasury shares) and 350,826 shares in treasury.
お知らせ • Dec 06JEOL Ltd. to Report Q3, 2026 Results on Feb 13, 2026JEOL Ltd. announced that they will report Q3, 2026 results on Feb 13, 2026
お知らせ • Sep 26JEOL Ltd. to Report Q2, 2026 Results on Nov 14, 2025JEOL Ltd. announced that they will report Q2, 2026 results on Nov 14, 2025
お知らせ • Jun 27JEOL Ltd. to Report Q1, 2026 Results on Aug 13, 2025JEOL Ltd. announced that they will report Q1, 2026 results on Aug 13, 2025
お知らせ • May 15JEOL Ltd., Annual General Meeting, Jun 26, 2025JEOL Ltd., Annual General Meeting, Jun 26, 2025.
お知らせ • Mar 15JEOL Ltd. to Report Fiscal Year 2025 Results on May 15, 2025JEOL Ltd. announced that they will report fiscal year 2025 results on May 15, 2025
お知らせ • Dec 04JEOL Ltd. to Report Q3, 2025 Results on Feb 12, 2025JEOL Ltd. announced that they will report Q3, 2025 results on Feb 12, 2025
お知らせ • Nov 26JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406).JEOL Ltd. (TSE:6951) agreed to acquire an additional majority stake in Japan Superconductor Technology, Inc. from Kobe Steel, Ltd. (TSE:5406) on November 22, 2024. Post the closing of the transaction, Kobe Steel will not hold any stake in Japan Superconductor Technology. For the period ending March 31, 2024, Japan Superconductor Technology, Inc. reported total revenue of ¥4.14 billion. The expected completion of the transaction is January 6, 2025.
お知らせ • Sep 27JEOL Ltd. to Report Q2, 2025 Results on Nov 08, 2024JEOL Ltd. announced that they will report Q2, 2025 results on Nov 08, 2024
お知らせ • Sep 04JEOL Ltd. Announces the Release of the New CROSS SECTION POLISHER IB-19540CP / COOLING CROSS SECTION POLISHER IB-19550CCP for Electron MicroscopesJEOL Ltd. announced the release of the New CROSS SECTION POLISHER IB-19540CP /COOLING CROSS SECTION POLISHER IB-19550CCP for Electron Microscopes on September 4, 2024. CROSS SECTION POLISHER™(CP)is widely utilized in the fields of electronic parts, ceramics, life science, metal, battery, and polymer. The mechanical high-quality uniform cross section can be easily prepared for complex materials and fragile specimens. With a sales record of over 2,000 units since its launch in 2003, the CP has been an essential tool for pre-treatment. The IB-19540CP /IB-19550CCP have been advanced with enhanced user-friendliness. Incorporation of the new GUI and IoT (Internet of Things) further improves ease of use and enables remote control and milling process monitoring by PC. High throughput ion source and high throughput cooling system enable preparation of a smooth cross section rapidly with less damages. Main features: New GUI and Internet of Things (IoT) - Incorporation of a new GUI makes the operation steps easy to understand. Easy setup is possible by following the flowchart on the control panel. Preset functions are available for saving and recalling process conditions tailored to specific applications or specimen types. Connecting to LAN provides remote access and control through a web browser to the CP. Monitoring and adjusting the milling process over multiple CPs is possible. High throughput ion source: High throughput ion source is equipped as a standard. The ion current density has been improved by optimizing the ion-source electrode and increasing the accelerating voltage. The standard cross section milling rate is now 1,200 µm/h and it will help reduce the time required for processing. Milling of 1 h, Si equivalent, Edge distance: 100 µm. High throughput cooling system: The high throughput cooling system and the new GUI enable automatic operation from cooling to return to room temperature. Thus, the waiting time has been reduced and it helps shorten the time required for work. It is possible to vacuum around the liquid nitrogen tank from the CP side to maintain cooling retention time and specimen cooling temperature. Annual Unit Sales Target - 180 units/year.
お知らせ • Jul 31JEOL Ltd. Announces New Schottky Field Emission Scanning Electron Microscope JSM-IT810 ReleasedJEOL Ltd. announced the release of the new Schottky Field Emission Scanning Electron Microscope JSM-IT810 on July 28, 2024. Field Emission Scanning Electron Microscopes (FESEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis. The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the “SEM Center” for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages. Main Features: 1. Automatic Observation and Analysis Function “Neo Action”: All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work. 2. Automatic Calibration Function “SEM Automatic Adjustment Package”: This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration. 3. “Live Function”: This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping. 4. EDS Integration: Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.
お知らせ • May 30JEOL Ltd. Announces the Release of the New Electron Microscope JEM-120iJEOL Ltd. announced the release of the new electron microscope JEM-120i developed with the concepts of “Compact”, “Easy To Use”, and “Expandable” on May 30, 2024. Electron microscopes are utilized in a wide range of fields from biotechnology to nano technology, polymers, and advanced materials. With the expansion of application, usages are also expanding, which requires a tool that is easy-to-use for research and testing purposes. To satisfy such needs, the JEM-120i has evolved into a next-generation microscope that is easy to use, from operation to maintenance, for both beginner and experienced users. Compact: The JEM-120i adopts a totally new appearance and compact design that fits any installation location. The footprint has been reduced by more than 50%, and the volume occupied by the instrument is less than one-third of that of conventional models, enabling effective use of space. The instrument height is lower than 1,800mm, which fits just about any installation room. Easy to Use: The enhanced TEM control system and fully automated apertures eliminated the need for switching the magnification mode and selecting an aperture. The JEM-120i provides seamless observations from low to high magnification. It takes only 4 steps from loading a specimen to completing an observation. After inserting the specimen holder, clicking the Start Button automatically performs observation preparation operations such as voltage increase and emission start. A wide area image is captured at the same time, and clicking the target field of view will complete the stage movement. Standard “Butler mode” assists data acquisition. Even a beginner can capture data easily. Expandable: In addition to the standard multi-function camera, a bottom-mount camera of higher pixel count can be selected as an option. Attachments such as the scanning image observation function (STEM), elemental analysis function (EDS), and cryo observation function can be applied, regardless of instrument configuration. The instrument can be expanded at any time to meet the changing needs of microscopy over time. The proven scripting function (PyJEM) with the high-end models, can create an algorithm for automation. The automation can increase the utilization rate of the instrument and improve data output efficiency. Main Specifications: Resolution- 0.2 nm (HC), 0.14 nm (HR). Accelerating voltage- 20-120kV. Magnification- 50-1,200,000 (HC), 50-1,500,000 (HR). Standard camera- JEOL CMOS camera (NeoView) 4M pixel, 30fps. Field of view search/adjustment/recording. Optional camera- JEOL CMOS camera (SightSKY) 19M pixel, 58fps. Cameras made by other companies can also be mounted. Main unit dimensions: W 840mm/D 1,734mm/H 1,782mm.
お知らせ • May 16JEOL Ltd., Annual General Meeting, Jun 26, 2024JEOL Ltd., Annual General Meeting, Jun 26, 2024.
お知らせ • May 15JEOL Ltd. Announces Resignation of Gon-Emon Kurihara as ChairmanJEOL Ltd. announced the resignation of Gon-emon Kurihara as chairman of the company due to expiration of term.
お知らせ • Mar 02JEOL Ltd. to Report Fiscal Year 2024 Results on May 14, 2024JEOL Ltd. announced that they will report fiscal year 2024 results on May 14, 2024
お知らせ • Nov 27JEOL Ltd. to Report Q3, 2024 Results on Feb 09, 2024JEOL Ltd. announced that they will report Q3, 2024 results on Feb 09, 2024
お知らせ • Aug 31JEOL Ltd. to Report Q2, 2024 Results on Nov 10, 2023JEOL Ltd. announced that they will report Q2, 2024 results on Nov 10, 2023
お知らせ • Jun 03JEOL Ltd. to Report Q1, 2024 Results on Aug 10, 2023JEOL Ltd. announced that they will report Q1, 2024 results on Aug 10, 2023
お知らせ • May 14JEOL Ltd., Annual General Meeting, Jun 28, 2023JEOL Ltd., Annual General Meeting, Jun 28, 2023.
お知らせ • Feb 01JEOL Ltd. Announces its Launch of the FIB-SEM system “JIB-PS500i”JEOL Ltd. announced its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required. This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs. Main Features: The FIB column enables processing with a large-current Ga ion beam up to 100nA. The high-current processing is particularly effective in preparing cross section samples for large-area imaging and analysis. In addition, the FIB column is set to a shorter working distance. Along with a newly-developed power supply, it has led to greatly improved processing performance at a low accelerating voltage. A newly-developed super conical lens system is built into the SEM column, greatly improving the image resolution at a low accelerating voltage. This superb imaging is very useful to check the end-point milling status of lamella specimen using the SEM. The JIB-PS500i adopts a large specimen chamber and a newly-developed specimen stage, increasing the stage movement range, and thus accommodating a large specimen. In addition, a newly-developed STEM detector that can be used with the stage tilt at 90 degrees, allows for a seamless transition from the TEM specimen preparation to STEM observation. For the operating GUI, the “SEM center”, which has been well received in the JSM-IT800 series of high-resolution scanning electron microscopes is employed, enabling full integration of EDS analysis. A double tilt cartridge and a dedicated TEM holder allows for more precise alignment while making specimen transfer between TEM and FIB easier.