お知らせ • Jun 24
Park Systems Engages Global Audience with Multilingual Showcase of Park FX AFM Solutions
Park Systems Corp. successfully hosted a global interactive online showcase for the Park FX Large Sample AFM Series, bringing together a worldwide audience for an in-depth exploration of its advanced metrology solutions. The event highlighted Park's most recent additions to its AFM product family, including the Park FX200, FX300, FX200 IR, and FX300 IR, through live-streamed demonstrations, and simultaneous multilingual breakout sessions. Originally introduced at key industry events, the Park FX Large sample AFM Series was presented in a consolidated, digital-first format for the first time. Participants across Asia, Europe, and the Americas joined the event, which was broadcast in three different time zones and supported by regional breakout sessions in English, Japanese and Chinese. This global engagement effort marked a major milestone in Park Systems' digital strategy for customer engagement and interaction. The highlight of the main session was a keynote interview with Dr. Sang-Joon Cho, Executive Vice President of Research Equipment Business Unit, who provided insights into Park Systems' vision for next-generation metrology in semiconductor and materials research. Following the keynote, a live demonstration of the Park FX300 IR system showcased the complete workflow--from probe auto-exchange to laser alignment, PiFM spectroscopy, and Smart Analysis™?-based chemical imaging--emphasizing speed, automation, and high resolution. To accommodate different time zones and market needs, the online event was held in three sessions covering Asia, Europe, and the America. Each region conducted its own format of breakout or follow-up sessions, delivering tailored presentations in multiple languages such as Japanese, Chinese, and English. These sessions provided opportunities for deeper discussion, regional use case sharing, and live Q&A conducted in participants' native languages. The Park FX Large Sample AFM series is designed for advanced nanoscale analysis on sample sizes up to 300 mm, serving both research and industrial applications. The systems feature automated tip exchange, StepScan™? for multi-point measurements, and optional Fan Filter Units (FFU) for cleanroom operation. The infrared models (Park FX200 IR and FX300 IR) integrate PiFM spectroscopy to simultaneously deliver topographic and chemical information with high spatial resolution. In addition to the live sessions, Park Systems introduced its SmartSimulator™?, an interactive online demo that allows prospective users to remotely explore key AFM workflows, such as probe handling, scan configuration, and post-scan analysis. The demo also provides 2D and 3D image views in line profiling and region histogram profiling modes, offering users a hands-on feel for how intuitive and user-friendly Park Systems' AFM systems are -- all without needing physical access to the instrument. This digital tool supports early-stage customer engagement and serves as a scalable asset in Park's continued commitment to customer satisfaction. Tailored breakout sessions and live Q&A discussions were actively conducted across key regions including Japan, Greater China, the Americas, and Europe. Each regional team adapted the main showcase content to better align with local customer needs, delivering presentations in native languages and focusing on applications most relevant to their markets. By combining rich technical content with flexible digital access, the online showcase reinforced Park Systems' position at the forefront of nanoscale metrology innovation. The company plans to apply this format to upcoming launches of its next-generation AFM systems, ensuring customers around the world can continue to access new technologies in engaging, efficient ways.