Advantest（VANA）株式概要株式会社アドバンテストは、半導体、コンポーネント・テストシステム製品、メカトロニクス関連製品の製造・販売を日本、米州、欧州、アジアで展開しています。 詳細VANA ファンダメンタル分析スノーフレーク・スコア評価2/6将来の成長3/6過去の実績6/6財務の健全性6/6配当金0/6報酬株価収益率（ 57.4 x）は、 Semiconductor業界平均（ 61.8 x）を下回っています。収益は年間14.89%増加すると予測されています 過去1年間で収益は132.9%増加しました リスク分析German市場と比較した過去 3 か月間の株価の変動すべてのリスクチェックを見るVANA Community Fair Values Create NarrativeSee what others think this stock is worth. Follow their fair value or set your own to get alerts.Your Fair Value€Current Price€162.0018.5% 割安 内在価値ディスカウントGrowth estimate overAnnual revenue growth rate5 Yearstime period%/yrDecreaseIncreasePastFuture02t2016201920222025202620282031Revenue JP¥2.2tEarnings JP¥716.2bAdvancedSet Fair ValueView all narrativesAdvantest Corporation 競合他社AIXTRONSymbol: XTRA:AIXAMarket cap: €5.5bSUSS MicroTecSymbol: XTRA:SMHNMarket cap: €1.7bInfineon TechnologiesSymbol: XTRA:IFXMarket cap: €77.3bPVA TePlaSymbol: XTRA:TPEMarket cap: €891.3m価格と性能株価の高値、安値、推移の概要Advantest過去の株価現在の株価JP¥162.0052週高値JP¥170.0052週安値JP¥39.60ベータ1.21ヶ月の変化36.13%3ヶ月変化22.73%1年変化309.09%3年間の変化720.25%5年間の変化867.16%IPOからの変化7,281.25%最新ニュースお知らせ • Apr 28Advantest Corporation, Annual General Meeting, Jul 31, 2026Advantest Corporation, Annual General Meeting, Jul 31, 2026.お知らせ • Apr 24Advantest Corporation Introduces Pin Scale 5000B Digital Test Solution To Extend Capabilities Of V93000 EXA Scale Test PlatformAdvantest Corporation announced Pin Scale 5000B, an enhanced digital test solution for the V93000 EXA Scale Platform designed to address the growing test requirements of advanced artificial intelligence (AI) and high-performance computing (HPC) devices. AI and HPC semiconductor capabilities and complexity are growing swiftly, driven by advanced process nodes, heterogeneous integration and chiplet-based architectures. These devices require significantly higher structural and functional test coverage and processing of rapidly increasing volumes of test data. The Pin Scale 5000B card significantly expands available vector memory, offering deep and scalable storage capacity aligned with industry demands. Hardware and software facilitate optimal memory usage in chiplet-based architectures, reducing customers’ overall consumption and associated costs while addressing evolving memory requirements for the future. The new card also enables customers to efficiently scale their existing test programs and hardware configurations in response to evolving device requirements. This solution is engineered to accommodate contemporary scan fabric architectures, enabling concurrent testing of multiple IP cores using a streaming approach. Its new hardware capabilities allow test results to be observed across multiple cores within a single test pattern execution, enabling instantaneous insights into error distribution among the cores. These capabilities help improve structural coverage and core-level visibility, significantly reducing test times and cost-of-test. The Pin Scale 5000B delivers high-bandwidth test access, offering data rates up to 5 Gbps through the proven pin electronics architecture of the Pin Scale 5000. Pin Scale 5000B is a fully compatible superset of the established Pin Scale 5000, complementing the V93000 portfolio. The Pin Scale 5000B digital test instrument is now ramping with key customers.お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2026 Results on Apr 27, 2026Advantest Corporation announced that they will report fiscal year 2026 results at 3:30 PM, Tokyo Standard Time on Apr 27, 2026お知らせ • Jan 28Advantest Corporation Revises Consolidated Earnings Guidance for the Year Ending March 31, 2026Advantest Corporation revised consolidated earnings guidance for the year ending March 31, 2026. For the year, the company expects the net sales to be JPY 1,070,000 million, operating income to be JPY 454,000 million, net income of JPY 328,500 million, net income attributable to owners of the parent to be JPY 328,500 million or basic earnings per share to be JPY 452.34 against net sales to be JPY 950.0 billion, operating income to be JPY 374.0 billion, net income of JPY 275.0 billion.お知らせ • Dec 12Advantest Corporation to Report Q3, 2026 Results on Jan 28, 2026Advantest Corporation announced that they will report Q3, 2026 results on Jan 28, 2026お知らせ • Dec 11+ 1 more updateAdvantest Corporation Unveils T2000 AiR2X Air-Cooled SoC and Power Analog Test SolutionAdvantest Corporation announced the T2000 AiR2X, a next-generation air-cooled test system engineered to meet rising demand for compact, cost-efficient testers in evaluation and high-mix, low-volume production environments. The new solution is fully compatible with the conventional T2000 test system and delivers twice the test resources of the previous air-cooled T2000 AiR test system, while maintaining low power and air-cooling requirements. The T2000 AiR2X addresses multiple converging market factors, including end-of-life support for legacy systems such as the T6500 series and T7700 series, and ongoing replacement needs across compact air-cooled testers. With a multitude of air-cooled SoC test systems in operation worldwide, the new T2000 AiR2X solution positions Advantest to meet sustained demand in this growing market. With its flexible measurement configuration, the T2000AR2X supports up to 12 measurement modules, including functional/SCAN test, high-precision DC and automotive device DC testing up to 320V. The system's unique multisite controller function significantly reduces test time during volume production. The T2000 AiR 2X incorporates Advantest's T2000 RECT550 performance board, which flexibly supports a wide range of configurations, along with a unified support infrastructure and expandable module options, adopting the same program environment used in the T2000. In addition, the Rapid Development Kit (RDK) significantly reduces the effort required for program creation and debugging, contributing to shorter platform migration and implementation times. Initial device evaluations are underway, confirming broad application coverage for the T2000 AiR2 X across industrial MCUs, consumer ASICs, battery-monitoring ICs for automotive and mobile devices, and power analog applications. The system will enter general availability later this month.最新情報をもっと見るRecent updatesお知らせ • Apr 28Advantest Corporation, Annual General Meeting, Jul 31, 2026Advantest Corporation, Annual General Meeting, Jul 31, 2026.お知らせ • Apr 24Advantest Corporation Introduces Pin Scale 5000B Digital Test Solution To Extend Capabilities Of V93000 EXA Scale Test PlatformAdvantest Corporation announced Pin Scale 5000B, an enhanced digital test solution for the V93000 EXA Scale Platform designed to address the growing test requirements of advanced artificial intelligence (AI) and high-performance computing (HPC) devices. AI and HPC semiconductor capabilities and complexity are growing swiftly, driven by advanced process nodes, heterogeneous integration and chiplet-based architectures. These devices require significantly higher structural and functional test coverage and processing of rapidly increasing volumes of test data. The Pin Scale 5000B card significantly expands available vector memory, offering deep and scalable storage capacity aligned with industry demands. Hardware and software facilitate optimal memory usage in chiplet-based architectures, reducing customers’ overall consumption and associated costs while addressing evolving memory requirements for the future. The new card also enables customers to efficiently scale their existing test programs and hardware configurations in response to evolving device requirements. This solution is engineered to accommodate contemporary scan fabric architectures, enabling concurrent testing of multiple IP cores using a streaming approach. Its new hardware capabilities allow test results to be observed across multiple cores within a single test pattern execution, enabling instantaneous insights into error distribution among the cores. These capabilities help improve structural coverage and core-level visibility, significantly reducing test times and cost-of-test. The Pin Scale 5000B delivers high-bandwidth test access, offering data rates up to 5 Gbps through the proven pin electronics architecture of the Pin Scale 5000. Pin Scale 5000B is a fully compatible superset of the established Pin Scale 5000, complementing the V93000 portfolio. The Pin Scale 5000B digital test instrument is now ramping with key customers.お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2026 Results on Apr 27, 2026Advantest Corporation announced that they will report fiscal year 2026 results at 3:30 PM, Tokyo Standard Time on Apr 27, 2026お知らせ • Jan 28Advantest Corporation Revises Consolidated Earnings Guidance for the Year Ending March 31, 2026Advantest Corporation revised consolidated earnings guidance for the year ending March 31, 2026. For the year, the company expects the net sales to be JPY 1,070,000 million, operating income to be JPY 454,000 million, net income of JPY 328,500 million, net income attributable to owners of the parent to be JPY 328,500 million or basic earnings per share to be JPY 452.34 against net sales to be JPY 950.0 billion, operating income to be JPY 374.0 billion, net income of JPY 275.0 billion.お知らせ • Dec 12Advantest Corporation to Report Q3, 2026 Results on Jan 28, 2026Advantest Corporation announced that they will report Q3, 2026 results on Jan 28, 2026お知らせ • Dec 11+ 1 more updateAdvantest Corporation Unveils T2000 AiR2X Air-Cooled SoC and Power Analog Test SolutionAdvantest Corporation announced the T2000 AiR2X, a next-generation air-cooled test system engineered to meet rising demand for compact, cost-efficient testers in evaluation and high-mix, low-volume production environments. The new solution is fully compatible with the conventional T2000 test system and delivers twice the test resources of the previous air-cooled T2000 AiR test system, while maintaining low power and air-cooling requirements. The T2000 AiR2X addresses multiple converging market factors, including end-of-life support for legacy systems such as the T6500 series and T7700 series, and ongoing replacement needs across compact air-cooled testers. With a multitude of air-cooled SoC test systems in operation worldwide, the new T2000 AiR2X solution positions Advantest to meet sustained demand in this growing market. With its flexible measurement configuration, the T2000AR2X supports up to 12 measurement modules, including functional/SCAN test, high-precision DC and automotive device DC testing up to 320V. The system's unique multisite controller function significantly reduces test time during volume production. The T2000 AiR 2X incorporates Advantest's T2000 RECT550 performance board, which flexibly supports a wide range of configurations, along with a unified support infrastructure and expandable module options, adopting the same program environment used in the T2000. In addition, the Rapid Development Kit (RDK) significantly reduces the effort required for program creation and debugging, contributing to shorter platform migration and implementation times. Initial device evaluations are underway, confirming broad application coverage for the T2000 AiR2 X across industrial MCUs, consumer ASICs, battery-monitoring ICs for automotive and mobile devices, and power analog applications. The system will enter general availability later this month.お知らせ • Oct 30Advantest Corporation Unveils MTe - Unified, Scalable Test Platform for Power Semiconductor DevicesAdvantest Corporation announced the MTe power test platform. The cutting-edge MTe redefines test efficiency and scalability to address test requirements for the fast-growing power semiconductor market. Increasing market demand for electrification across automotive, industrial, renewable energy, telecommunication and data infrastructure applications is pushing semiconductor manufacturers to achieve higher performance and lower cost of test (CoT). The MTe platform responds to these needs by combining modular hardware architecture, ultimate system scalability and advanced digital control, redefining the standard in power semiconductor test performance and efficiency. Designed with Advantest technology, MTe provides significant footprint reduction and optimized resource distribution without performance degradation--a key enabler to attract major IDM and OSAT players. The MTe platform is able to address emerging wide-bandgap semiconductor (e.g., SiC and GaN) challenges, as well as the integration of digital IP cores on power devices (e.g., IPM and IPD), providing high bandwidth capture, best-in-class gate driver control, dynamic (and short-circuit) test up to 10kA, and flexible high-voltage digital capabilities. Aligned with Advantest's history of providing scalable test platforms, MTe distributed computing architecture provides significant multisite test efficiency, enabling a high-parallel-test solution with optimized throughput. The MTe platform is now available worldwide. Early evaluations by customers in automotive and industrial power applications have confirmed significant productivity and throughput gains compared with legacy testers.お知らせ • Oct 28+ 2 more updatesAdvantest Corporation Revises Consolidated Earnings Guidance for the Year Ending March 31, 2026Advantest Corporation revised consolidated earnings guidance for the year ending March 31, 2026. For the year the company now expects the Net Sales of JPY 950,000 million, Operating income of JPY 374,000 million, Net income of JPY 275,000 million, Basic earnings per share of JPY 378.06 as compared to previous guidance of Net Sales of JPY 835,000 million, Operating income of JPY 300,000 million, Net income of JPY 221,500 million, Basic earnings per share of JPY 302.71. In CY2025, the semiconductor industry growth is likely to continue to be driven by AI-related semiconductors. In the semiconductor tester industry, tester demand is expected to exceed the previous year’s level, driven by factors such as the increasing complexity and enhanced performance, as well as rising production volumes of AI-related semiconductors. Based on this outlook and the progress made for the six-month period ended September 30, 2025, Advantest has revised its full-year consolidated earnings forecast for the current fiscal year as shown above. .お知らせ • Oct 06+ 1 more updateAdvantest America, Inc. Announces It Is Reinventing Semiconductor Testing with the Power of Real-Time Artificial IntelligenceAdvantest America announced it is reinventing semiconductor testing with the power of real-time artificial intelligence (AI). Advantest is combining advanced machine learning (ML) from NVIDIA with the Advantest Cloud Solutions Real-Time Data Infrastructure (ACS RTDI™?) to drive a shift from traditional test workflows to adaptive AI-driven systems. NVIDIA has selected ACS RTDI for high-volume production to power its latest AI-enabled applications for Blackwell and next-generation devices --aiming to deliver breakthrough efficiency, reduced costs, and improved yields. Testing has long been the cornerstone of chip manufacturing, ensuring every device meets exacting standards of quality and performance. Traditionally, this required weeks of data collection, fault analysis, and test deployment cycles. ACS RTDI moves testing from validation to prediction--transforming semiconductor production into an AI-driven, continuously adaptive process. Integrated with NVIDIA AI inference, ACS RTDI could bring real-time intelligence to semiconductor testing. For NVIDIA Blackwell and future devices, massive data streams are ingested through ACS Data-Feed-Forward cross-insertion, where GPU-accelerated compute optimizes the test set for every chip. This scalable GPU architecture expands seamlessly, supporting the concurrent training of multiple ML models--enabling non-stop operation to drive yield gains, dynamically optimized test coverage, and sharp reductions in latency, power, and cost. Scaling AI Across Production: ACS RTDI has demonstrated its robustness at high-volume production sites worldwide, securely supporting AI/ML-driven test automation across diverse applications. Its flexible architecture --separating data preparation, algorithms, and decisioning--empowers manufacturers to rapidly adapt as production needs evolve. Advantest also plans to incorporate NVIDIA's NeMo and NVIDIA NIM microservices into ACS semiconductor test analytics solutions. These technologies will curate heterogeneous production data, evaluate models, and deploy AI agents capable of running generative AI applications directly in the test environment. Through this integration, Advantest is setting the stage for the next wave of semiconductor innovation --where AI not only accelerates the chip development process but also transforms how such chips are tested, validated, and delivered to market.お知らせ • Sep 30Advantest Corporation Launches Power Optimization Solution to Enhance Energy Efficiency and Sustainability in Semiconductor TestingAdvantest Corporation launched its new Advantest Power Optimization Solution (APOS) for the V93000 system-on-chip (SoC) test platform. Designed to improve energy efficiency without compromising performance, the APOS software enables foundries and outsourced semiconductor assembly and test (OSAT) providers to achieve their sustainability goals while reducing operational costs. With energy consumption representing a significant operational expense, semiconductor companies are actively seeking ways to optimize power usage. Developed by Advantest's production service team, APOS provides a comprehensive power-saving framework, allowing users to visualize and manage V93000 tester power consumption in real time, helping to lower electricity costs while maintaining high throughput and test accuracy. In addition, APOS contributes to corporate sustainability efforts by improving tester energy efficiency and thereby reducing the overall carbon footprint. The APOS software has already been installed on V93000 test systems at multiple customer sites, yielding positive results in reducing test costs and strengthening environmental initiatives. Smart power management - APOS expands Advantest's Smart TestCell (STC) ecosystem, which leverages advanced automation and resource management to enable smart semiconductor manufacturing. APOS automatically enables/disables selected test cards based on real-world tester scenarios, reducing unnecessary power consumption. Real-time visualization - APOS Client Display provides an intuitive dashboard with real-time insights into power usage and card type, status and quantity used. Centralized control and reporting - The APOS Dashboard integrates with the Testcell Central System (TCS) Server Web Dashboard to centrally manage test-floor power-saving data and utilizes the history record for reporting and further optimization. The Advantest Power Optimization solution for the V93000 test platform is available now to the global market.お知らせ • Sep 18Advantest Corporation Expands 7038 System-Level Test Platform with Right-Sized Single Test Rack Solution for High-Volume ManufacturingAdvantest Corporation announced its 7038 Single Test Rack (STR) system-level test (SLT) and burn-in test (BI) solution. The 7038 STR extends the company's proven 7038 SLT platform with a lower-cost architecture optimized for slot-based automated test solutions, enabling right-sized SLT deployment in the production of artificial intelligence (AI), high-performance compute (HPC), automotive, and other low- to mid-volume devices. The new 7038 STR delivers liquid-cooled thermal management of up to 1.4 kW per test site, enabling robust testing of today's most complex and power-hungry devices. Like the 7038 dual-rack test solution, the 7038 STR will also offer air-cooled thermal management for even more cost-effective test. With asynchronous test capability for up to 48 sites, the system offers a single-vendor turnkey solution that includes socket interface boards (SIBs), sockets, device multi-zone thermal management, software management and control, and an integrated automated handler. This single-source approach eliminates the need to obtain multiple components from different suppliers, streamlining deployment and reducing risk for customers. As device complexity and power requirements continue to rise in the HPC, AI, and automotive markets, the need for advanced SLT and BI solutions has grown significantly. In particular, automotive makers investing heavily in advanced driver assistance systems (ADAS) and telematics processing need a mid-power solution that goes beyond air-cooled thermal solutions for SLT. The 7038 STR provides a solution that can scale with the power and size increase of these processors. Air-cooled systems are limited to approximately 100 W per device, while the 7038 STR's liquid-cooled design supports the higher power levels demanded by next-generation processors with future upgrade capabilities exceeding 1.4 kW. "The 7038 STR represents the next evolution of system-level and burn-in test portfolio. The 7038 STR is especially suited for mid- to low-volume production environments where customers require advanced SLT/BI capabilities without the higher investment and larger footprint of dual-rack systems. Its compatibility with the broader 7038 product family means that customers can easily migrate test programs and hardware between the single- and dual-rack configurations as their production volumes grow. In addition, the system is fully compatible with ATS ActivATE360™?, Advantest's intuitive test management software. ActivATE provides turnkey real-time monitoring, logging, and control across device temperature, current, and power, simplifying program development and ensuring smooth integration into customer test environments. The 7038 Single Test Rack solution is available immediately, with pricing dependent on slot configuration, sites per slot, and thermal requirements.お知らせ • Sep 12Advantest Corporation to Report Q2, 2026 Results on Oct 28, 2025Advantest Corporation announced that they will report Q2, 2026 results on Oct 28, 2025お知らせ • Sep 09Advantest Introduces Advanced Mask CD-SEM* E3660Advantest Corporation announced the release of its next-generation CD-SEM* E3660, engineered for the dimensional metrology of photomasks and EUV masks used in cutting-edge semiconductor manufacturing. Compared to the previous generation's E3650, the E3660 delivers more than a 20% improvement in CD reproducibility, enabling process engineers to meet the stringent requirements of mask manufacturing at the 2nm node and beyond. By reinforcing lithography process control in advanced device fabrication, the E3660 furthers Advantest's vision of providing holistic test solutions across the semiconductor value chain. In semiconductor device fabrication, continuous scaling and pattern complexity are driving a sharp increase in lithographic hotspots--locations where multi-patterning and pattern transfer become particularly error-prone. Masks used to form wafer circuitry are evolving, with higher layer counts and more intricate geometries. This, in turn, has significantly increased the number of required metrology sites, demanding measurement systems with both higher throughput and superior reproducibility. The industry is also transitioning toward curvilinear mask patterns, enabled by advances in multi-beam mask writing and high-performance computing. These patterns are expected to see large-scale deployment around 2027 with the adoption of High Numerical Aperture EUV lithography in device production. To ensure design-to-mask fidelity under these conditions, CD-SEMs must not only provide highly reproducible critical dimension measurements but also generate SEM images with greater fidelity to true pattern contours. Moreover, metrology solutions must evolve to incorporate curvature-sensitive algorithms capable of quantifying deviations between complex mask features and original design intent. Leading up to the development of the E3660, Advantest has collaborated with imec, to validate the correlation of CD-SEM results obtained from the "E3650" with those from Advantest's previous generation CD-SEMs and EDA-based reference data. This enabled Advantest to improve metrology reliability and work with imec to advance the development and validation of new measurement techniques for curvilinear geometries. The E3660 platform reflects the outcome of this collaboration, achieving the reproducibility required for 2nm node mask manufacturing, enabling high-throughput measurement to handle increasing site counts, and providing unique measurement functions for curvilinear patterns. By integrating these capabilities, the E3660 is positioned to deliver robust metrology support for the next generation of mask R&D and production environments. Advantest will initially target the E3660 for deployment at Merchant Mask Shops, where commercial mask manufacturers produce masks for external customers, and Captive Mask Shops, which are in-house mask production facilities of semiconductor manufacturers. This activity establishes the E3660 as a core evaluation tool for advanced mask development and production qualification. Critical Dimension Scanning Electron Microscope: an electron microscope specialized for high-precision measurement of fine pattern dimensions on semiconductor wafers and masks.お知らせ • Sep 04Advantest Corporation to Present Latest Test Solutions At SEMICON Taiwan 2025Advantest Corporation will present its latest test solutions at SEMICON Taiwan 2025 on Sept. 10-12 at the TaiNEX 1 & 2 in Taipei. At this year's SEMICON Taiwan, Advantest will present innovative, sustainable test technology guided by its new corporate vision, "Be the most trusted and valued test solution company in the semiconductor value chain." Moreover, Advantest's Taiwanese subsidiary will commemorate its 30th anniversary, celebrating decades of service to Taiwan's rapidly growing semiconductor market.お知らせ • Aug 04Advantest Corporation to Showcase Latest Memory Test Solutions At Future of Memory and Storage 2025Advantest Corporation will showcase its latest memory test systems and solutions at the Future of Memory and Storage 2025 (formerly known as Flash Memory Summit) on Aug. 5-7 at the Santa Clara Convention Center in Santa Clara, California. Advantest is a gold sponsor of the event. Product Highlights: Advantest's booth #634 will be in Hall B of the convention center. The company will feature its end-to-end memory test solutions for testing next-generation memory chips, such as high-bandwidth memory (HBM), DRAM, NAND flash, non-volatile memory (NVM) and protocol storage devices. Advantest will also highlight its new T5801 ultra-high-speed DRAM test system that supports the latest advancements in high-speed memory technologies, including GDDR7, LPDDR6, and DDR6.お知らせ • Jun 13Advantest Corporation to Report Q1, 2026 Results on Jul 29, 2025Advantest Corporation announced that they will report Q1, 2026 results at 9:00 AM, Tokyo Standard Time on Jul 29, 2025お知らせ • May 12Advantest Corporation to Showcase Latest Test Solutions At Semicon Southeast Asia 2025Advantest Corporation will feature its latest test solutions at SEMICON Southeast Asia 2025 on May 20-22 at the Sands Expo and Convention Centre in Singapore. Located in Hall A on Level 1 at Booth #L1511, Advantest will showcase a wide range of solutions that address the technology challenges in the era of complexity. Through this broad product portfolio, Advantest can cater to diverse customer needs, optimizing efficiency to enable critical applications like high-performance computing (HPC), AI, automotive, and 5G/IoT, while supporting crucial technologies such as silicon photonics, high-bandwidth memory (HBM) and 2.5D/3D packaging. Advantest's product highlights will include: NEW SiConic, a scalable solution for automated silicon validation. Designed to address the increasing complexity of advanced systems-on-chip (SoCs), SiConic enables design verification (DV) and silicon validation (SV) engineers to achieve faster sign-off with unparalleled reliability, efficiency and collaboration. Solutions for the V93000 EXA Scale test system, including the Wave Scale RF20ex high-bandwidth RF IC test card, the PMUX02 advanced power multiplexer, the DC Scale XHC32 ultra-high-current power supply card, and the high-speed Pin Scale Multilevel Serial HSIO instrument. Extending the V93000 test system's capabilities to support high-volume production of silicon photonics and co-packaged optics devices via a partnership with FormFactor. The HA1200 die-level handler that can be linked with a tester to utilize Advantest's unique active thermal control technology to test singulated and/or partially assembled dies. ACS Real-Time Data Infrastructure (ACS RTDI™?), a solution platform that automates the process of converting insights into actionable production steps within the same test insertion in milliseconds, optimizing yield, improving quality and reducing time to market. ACS Gemini™? software development platform, which acts as the digital twin to ACS RTDI™? to allow customers to develop, simulate and debug machine learning applications in a virtual environment. NEW Advantest Power Optimization Solution (APOS), a software solution designed to optimize the power management during the V93000 tester's power-on period. It enables foundries and outsourced semiconductor assembly and test (OSAT) providers to achieve their sustainability goals while reducing operational costs.お知らせ • May 08Advantest Corporation Unveils SiConic Test Engineering: Unified, Scalable Bench Environment for Debug and ValidationAdvantest Corporation unveiled SiConic Test Engineering (TE), the newest addition to the SiConic family introduced in February 2025. SiConic TE offers test engineers the ability to bring up and validate structural and functional tests over high-speed I/O (HSIO) interfaces in a scalable bench environment, enabling earlier validation and debug without occupying valuable ATE systems. SiConic Link flexibly connects to standard evaluation boards through functional interfaces like USB, PCIe, control interfaces, and GPIOs. This is the foundation for SiConic TE to enable test engineers to rapidly validate and debug design verification (DV) and design for test (DFT) content in SiConic's unified environment on the bench. Building on the V93000 test system's leadership in scan over USB or PCIe, SiConic's unified environment brings native DV test content to test engineering without the error-prone and lengthy conversion and debug cycles typical for bring-up of advanced functional tests on ATE. Integrating seamlessly with SiConic Link hardware and the SmarTest 8 software platform, SiConic TE provides users with comprehensive access to functional HSIO links for enhanced throughput and rich trace capabilities during test execution. By enabling smoother handoffs between silicon validation (SV), DV and TE teams, SiConic TE fosters tighter cross-domain collaboration. Through its unified test environment and shared ecosystem, SiConic TE improves the correlation between bench, ATE and SLT systems. The tool's optimized engineering resources allow bring-up and debug to be offloaded from ATE to the bench, freeing up valuable tester capacity and enabling more effective scaling. In addition, tight integration with leading EDA partners enables cross-functional collaboration with leading EDA partners enables Cross-functional collaboration with DV and DFT teams, improving test content development and speeding first-silicon success. Advantest developed SiConic TE in close collaboration with leading customers and EDA partners to ensure seamless integration into existing design and validation flows.お知らせ • Apr 25+ 1 more updateAdvantest Corporation, Annual General Meeting, Jun 27, 2025Advantest Corporation, Annual General Meeting, Jun 27, 2025.お知らせ • Mar 18Advantest Corporation to Showcase Latest IC Test Solutions at SEMICON China 2025, March 26-28 in ShanghaiAdvantest Corporation will showcase its latest test solutions at SEMICON China 2025 on March 26-28 at the Shanghai New International Expo Centre in Shanghai. Advantest will highlight its broad portfolio of test technology for applications, including advanced memory, automotive, RF wireless communications and CMOS image sensors. Advantest will be located at booth #4431 in Hall N4. This year's digital display will feature key test solutions that enable innovation and technology essential to daily lives, including: NEW T5801 Ultra-High-Speed DRAM test system, engineered to support the latest advancements in high-speed memory technologies, including GDDR7, LPDDR6 and DDR6. NEW solutions for the V93000 EXA Scale test system, including the Wave Scale RF20ex high-bandwidth RF IC test card, the PMUX02 advanced power multiplexer, the DC Scale XHC32 ultra-high-current power supply card, and the high-speed Pin Scale Multilevel Serial HSIO instrument. T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive, power analog and CMOS image sensors. T6391 test system for high-speed, high-accuracy and high-voltage measurement demands to test emerging display driver ICs. ACS TE-Cloud™?, a one-stop test engineering solution platform, offering a complete test development environment with an integrated set of software tools for V93000 test program development. ACS Real-Time Data Infrastructure (ACS RTDI™?), a solution platform that automates the process of converting insights into actionable production steps within the same test insertion in milliseconds, optimizing yield, improving quality and reducing time to market.お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2025 Results on Apr 25, 2025Advantest Corporation announced that they will report fiscal year 2025 results on Apr 25, 2025お知らせ • Feb 27Advantest Corporation to Showcase IC Test Solutions at IESA Vision Summit 2025Advantest Corporation will showcase its latest test solutions at IESA Vision Summit 2025 on March 5-7 at the Mahatma Mandir, Convention and Exhibition Centre in Gandhinagar, Gujarat, India. Advantest will highlight its broad portfolio of leading-edge test technology for applications, including advanced memory, automotive, artificial intelligence (AI) and high-performance computing (HPC). The IESA Vision Summit is the premier platform dedicated to advancing India's semiconductor and electronics ecosystem, bringing together industry leaders, government policymakers, innovators and experts to discuss cutting-edge technologies, emerging trends and transformative collaborations. As a global leader in providing semiconductor test solutions, Advantest is eager to show its support for India's emerging semiconductor industry. The company is a gold sponsor for this year's event. Product Displays: Advantest will be located at booth #212 in Hall 1. This year's digital display will feature key test solutions that enable innovation and technology essential to daily lives, including: NEW SiConic, a scalable solution for automated silicon validation. Designed to address the increasing complexity of advanced systems-on-chip (SoCs), SiConic enables design verification (DV) and silicon validation (SV) engineers to achieve faster sign-off with unparalleled reliability, efficiency and collaboration. NEW solutions for the V93000 EXA Scale test system, including the Wave Scale RF20ex high-bandwidth RFIC test card, the DC Scale XHC32 ultra-high-current power supply card and the high-speed Pin Scale Multilevel Serial HSIO instrument. NEW T5801 Ultra-High-Speed DRAM test system, engineered to support the latest advancements in high-speed memory technologies - including GDDR7, LPDDR6 and DDR6 - critical to meeting the growing demands of artificial intelligence (AI), high-performance computing (H PC) and edge applications. Instruments for the V93000EXA Scale test system that enable the testing of power and analog devices, such as battery management systems (BMS), automotive and power ICs, including the new PMUX02 advanced power multiplexer and the Pin Scale 5000 digital card.お知らせ • Feb 20Advantest Introduces Siconic: Groundbreaking Solution for Automated Silicon ValidationAdvantest Corporation unveiled SiConic: a scalable solution for automated silicon validation. Designed to address the increasing complexity of advanced systems-on-chip (SoCs), SiConic enables design verification (DV) and silicon validation (SV) engineers to achieve faster sign-off with unparalleled reliability, efficiency and collaboration. Debuting next week at DVCon in San Jose, Calif., SiConic signals Advantest’s commitment to transforming the R&D process for its customers. The semiconductor industry is facing unprecedented challenges. Growing SoC design complexity, together with the adoption of 3D packaging and heterogeneous integration, is straining traditional validation workflows. DV and SV teams are under pressure to reduce time-to-market and time-to-quality – even as more devices with more intricate features are being developed within constrictive timelines. Reusing the wealth of verification content developed in pre-silicon would provide an efficiency and quality breakthrough. However, the industry lacks the automated flow and tools to reliably re-use and extend verification tests for silicon validation. SiConic’s ecosystem – including EDA partners such as Cadence, Siemens and Synopsys – overcomes this barrier to reuse, enabling engineering efficiency and accelerated test execution on real silicon. SiConic Explorer, the platform’s software backbone, offers an automated flow by integrating seamlessly with EDA verification tools based on the Accellera Portable Test and Stimulus Standard (PSS), e.g., the Cadence Perspec System Verifier. In addition, integration with debuggers, such as Lauterbach’s TRACE32 debugging tool, accelerates the bring-up of complex multi-IP test cases. SiConic Link is the hardware foundation of the SiConic solution on a bench. With its high-speed I/O (HSIO) capability, SiConic Link supports protocols such as PCIe and USB to enable functional validation with high throughput and rich tracing capabilities during test execution. The test instrument provides control interfaces (e.g., JTAG, SPI) and general-purpose I/Os, improves the debugging workflow and provides extensive control and observability of the device in its target board environment. With SiConic, DV engineers can now leverage familiar pre-silicon techniques, expanding their functional coverage in post-silicon. Similarly, SV engineers benefit from seamless load, set parameters and debug of PSS-based or manually directed content on silicon, thereby enabling rapid and reliable device bring-up and functional characterization. The highly portable solution can be easily scaled for use by distributed global R&D teams collaborating on a complex SoC with diverse IP blocks. SiConic enables confident sign-off decisions through team collaboration and data-driven insights – building trust with customers receiving early samples and expecting reliable ramp and operation during the lifetime of their systems. Leading Advantest IC customers and EDA partners are already working with SiConic and seeing the benefits of its performance and productivity advantages.お知らせ • Feb 13Advantest Corporation to Showcase Latest Test Solutions at SEMICON Korea 2025, Feb. 19-21, in SeoulAdvantest Corporation will showcase its latest test solutions at SEMICON Korea 2025 on Feb. 19-21 at COEX in Seoul, South Korea. Advantest will highlight its broad portfolio of test technology for applications, including advanced memory, 5G, artificial intelligence (AI) and high-performance computing (HPC). In addition, as one of the founding members of SEMI's Semiconductor Climate Consortium (SCC), the company plans to promote its ESG initiatives at this year's show.お知らせ • Feb 12Advantest Corporation Unveils T5801 Ultra-High-Speed Memory Test System to Power Next-Generation DRAM DevicesAdvantest Corporation announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge platform is engineered to support the latest advancements in high-speed memory technologies – including GDDR7, LPDDR6, and DDR6 – critical to meeting the growing demands of artificial intelligence (AI), high-performance computing (HPC) and edge applications. Increasingly complex, high-speed memory technologies are pushing the boundaries of data center and AI performance. The T5801 is tailored to address this challenge by enabling accurate and efficient mass production testing for the highest-speed memory devices. Featuring an innovative Front-End Unit (FEU) architecture, the system is uniquely equipped to handle the rigorous requirements of next-generation DRAM modules, delivering industry-leading performance of up to 36Gbps PAM3 and 18Gbps NRZ. The T5801 builds on Advantest’s market leadership in DRAM test solutions, including the proven T5503 series and V93000HSM systems. Its support for PAM3, a first in JEDEC-standard DRAMs, highlights the system’s capacity to handle memory innovations such as GDDR7, which is central to achieving ultra-low latency in all AI environments. Its scalable testing infrastructure enables a seamless transition from engineering R&D to production, offering flexible configurations and full compatibility with existing handlers and interfaces. Already in use by strategic memory customers, the T5801 DRAM test system will be released to the global market early next year. To learn more about the ultra-high-speed T5801, as well as Advantest’s full line of automated test equipment and materials, visit booth P201 at SEMICON Korea 2025, February 19-21, at COEX in Seoul, South Korea. Note to Editors: GDDR7 = Graphics Double Data Rate 7; LPDDR6 = Low Power Double Data Rate 6; DDR6 = Double Data Rate 6; PAM3 = Pulse Amplitude Modulation 3.お知らせ • Dec 13Advantest Corporation to Report Q3, 2025 Results on Jan 29, 2025Advantest Corporation announced that they will report Q3, 2025 results on Jan 29, 2025お知らせ • Dec 09Advantest Corporation Launches KGD Test Cell for Power SemiconductorsAdvantest Corporation announced an integrated test cell designed to maximize die-level test yields for wide-bandgap (WBG) devices essential to power semiconductors. The Advantest Known Good Die (KGD) Test Cell combines the company’s CREA MT series power device testers with the new HA1100 die prober. Demand for power semiconductors continues to grow with the rapid escalation of electric vehicles (EV) and power infrastructure. WBG devices, particularly silicon carbide (SiC) and gallium nitride (GaN), are essential for the design and manufacture of power semiconductors, enabling them to be smaller, faster and more efficient than silicon-based devices. However, screening for failures in WBG devices is challenging, as the probe card, chuck and devices can be damaged due to the high voltage and current at which they operate. Essentially serving as a one-stop shop for efficient equipment management, the Advantest KGD test cell solution helps reduce customers’ manufacturing costs. CREA’s proprietary probe card interface (PCI) technology can eliminate damage risk. However, if damage does occur, Advantest can investigate it using the test cell, allowing customers to minimize downtime. The HA1100 die prober for the CREA MT series test systems enables the assembly of dies in power modules using only passed (KGD) die, ensuring no failed die find their way into the module. This prevents yield loss at module test, thus reducing the loss of final multi-die assembled power modules. Currently under development, the HA1100 die prober will be released to the global market in the second quarter of 2025.お知らせ • Dec 05Advantest Launches ACS Gemini – New Developer Platform for Accelerating ACS RTDI Application DevelopmentAdvantest Corporation announced the launch of its new software development platform ACS Gemini, which allows customers to develop, simulate and debug machine learning applications in a virtual environment. The digital twin of ACS RTDI, ACS Gemini is part of Advantest’s mission to enable customers and partners to utilize data analytics in developing artificial intelligence (AI) and machine learning (ML) solutions for semiconductor testing. In recent years, manufacturing costs for semiconductors have increased significantly due to their growing complexity. Analysts at McKinsey & Company predict that implementing AI and ML could lower manufacturing costs by 40%, as many engineers use these technologies to optimize efficiency in manufacturing. ACS Gemini improves efficiency by providing customers with a seamlessly integrated experience that optimizes design-to-production proficiency in the virtual ACS RTDI environment. The digital twin software solution is composed of the ACS Software Development Kit, Reference Application Development Model, and Containerized applications publishable to the ACS Container Hub™. These elements enable customers to simulate valuable test results in a virtual production setting. ACS Gemini saves customers time and cost in engineering debugging, design vs. production correlation, and cloud deployment of apps – ultimately saving valuable tester time. Overall, the solution accelerates ML application development, simulates testing results, and shortens the time-to-deployment of ML applications on the production test floor. Advantest’s ACS RTDI is a real-time data infrastructure platform-as-a-service that securely collects, analyzes, stores and monitors semiconductor test data to empower customers to automate the process of converting insights into actionable test decisions within milliseconds. This helps customers and partners reduce test time, optimize quality and reliability and enhance smart packaging. The solution will be available to the global market in early 2025.お知らせ • Nov 19+ 1 more updateAdvantest Announces Advanced Power Multiplexer for V93000 EXA Scale Test PlatformAdvantest Corporation announced a new power multiplexer developed specifically for use on the V93000 EXA Scale SoC test platform. The PMUX02 Power MUX offers unprecedented capabilities for multi-site testing of power and analog devices, including battery management systems (BMS), automotive, and power management ICs. With 22 switches – nearly double the switch density of its predecessor – and an extended voltage range of ±160 volts (V), PMUX02 will help streamline and reduce the cost-of-test for these high-pin-count, mixed-signal devices. A power mux switches between multiple power sources and instruments to provide uninterrupted power and measurement to devices under test (DUTs). Electric vehicles (EVs) are a key driver behind the need for advanced power muxes. Increasing the number of cells stacked in an EV’s battery module improves its efficiency, and stacks of 24+ cells require the BMS to operate at 150V or higher. Moreover, as automotive ICs become increasingly complex with higher pin counts, more parallel sites are required to increase throughput, requiring more multiplexers. PMUX02 provides a denser array of relays in the test head and uses the system bus for communication, eliminating I2C driver circuitry and freeing up valuable loadboard space. Up to 16 PMUX02 cards can be installed in an EXA Scale system; the exact number depends heavily on the specific customer application and site count. An optional air cooling kit is also available. PMUX02 is fully compatible with its predecessor, PMUX01, enabling customers to utilize the same loadboards for their applications. In addition, PMUX02 is integrated into Advantest’s SmarTest 8 control software environment and takes advantage of the same powerful routing tools as PMUX01—which is crucial for agile application development. Customers are already harnessing the power of the PMUX02 Power MUX for BMS and power management IC projects. The PMUX02 will be available to the global market beginning in early 2025.お知らせ • Oct 30+ 1 more updateAdvantest Corporation Declares Interim Dividend for the Year Ending March 31, 2025Advantest Corporation at its board meeting held on October 30, 2024 resolved interim dividend of JPY 19.00 per share for the year ending March 31, 2025, the company paid JPY 65.00 per share in the previous year. Record date is September 30, 2024. Effective Date is December 2, 2024.お知らせ • Sep 13Advantest Corporation to Report Q2, 2025 Results on Oct 30, 2024Advantest Corporation announced that they will report Q2, 2025 results on Oct 30, 2024お知らせ • Jul 03Advantest Corporation to Showcase Latest Test Technology at SEMICON West 2024Advantest Corporation will showcase its latest IC test solutions at SEMICON West 2024 on July 9-11 at the Moscone Center in San Francisco. Advantest will highlight its broad portfolio of test technology for applications, including AI and high-performance computing (HPC), 5G, automotive and advanced memory. In addition, as one of the founding members of SEMI's Semiconductor Climate Consortium (SCC), the company plans to promote its ESG initiatives at 2024's SEMICON West. Product Displays: Advantest will be located at booth #1039 in the South Hall. This year’s display will feature key test solutions that enable innovation and technology essential to its daily lives. Products include: NEW: The DC Scale XHC32 power supply, offering 32 channels with an unprecedented total current of up to 640A and unique safety capabilities for unmatched equipment protection to optimize test of AI, HPC, and other high-current devices; Pin Scale Multilevel Serial that is both the first native and fully integrated HSIO instrument expanding the V93000 EXA Scale platform to address signaling requirements for advanced communication interfaces; HA1200, offering die test capability with active thermal control to enable at-speed 100% test coverage before the dies are assembled into 2.5D/3D packages; CREA’s power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer, single-die, substrate, PKG, and module, typically used in industrial and automotive applications; T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive and power analog, and IP Engine 4 test solutions for fastest image processing to reduce CIS testing time and costs; ACS Real-Time Data Infrastructure (ACS RTDI™), an open solutions ecosystem enabling streaming data access and real-time analytics with integrated test software and hardware monitoring and control to improve semiconductor device yield, quality, and capacity; Next-generation Flash/NVM test solutions, such as T5851-STM32G, capable of testing and covering the latest generation of embedded protocol NAND devices with UFS/PCIe interface up to 32 Gbps and T5230 with a combined array architecture to reduce test cost for NAND/NVM wafer test, including DRAM wafer-level burn-in (WLBI).お知らせ • Jun 15Advantest Corporation to Report Q1, 2025 Results on Jul 31, 2024Advantest Corporation announced that they will report Q1, 2025 results on Jul 31, 2024お知らせ • May 22Advantest Corporation to Exhibit Latest Test Solutions At SEMICON Southeast Asia, May 28-30, 2024Advantest Corporation will feature its latest test solutions at SEMICON Southeast Asia 2024 on May 28-30, 2024 at the Malaysia International Trade and Exhibition Centre (MITEC) in Kuala Lumpur, Malaysia. Advantest is a gold sponsor of this year's event. In Hall 3 booth #1008, Advantest will exhibit a broad range of test solutions that enable critical applications like high-performance computing (HPC), AI, automotive, and 5G/IoT. Advantest's digital display will include: Test Platforms and Handlers: NEW: The DC Scale XHC32 power supply offers 32 channels with an unprecedented total current of up to 640A and unique safety capabilities for unmatched equipment protection to optimize test of AI, HPC, and other high-current devices. Pin Scale Multilevel Serial that is both the first native and fully integrated HSIO instrument expanding the V93000 EXA Scale platform to address signaling requirements for advanced communication interfaces. HA1200, offering die test capability with active thermal control to enable at-speed 100% test coverage before the dies are assembled into 2.5D/3D packages. CREA's power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer, single-die, substrate, PKG, and module, typically used in industrial and automotive applications. Next-generation Flash/NVM test solutions, such as T5851-STM32G capable of testing and covering the latest generation of embedded protocol NAND devices with UFS/PCIe interface up to 32 Gbps and T5230 with a combined array architecture to reduce test cost for NAND/NVM wafer test, including DRAM wafer-level burn-in (WLBI). Global Services Field service solutions focused on increasing customers' automation efficiency by creating a test cell solution complete with handlers and testers for high-volume manufacturing.お知らせ • Apr 28+ 2 more updatesAdvantest Corporation, Annual General Meeting, Jun 28, 2024Advantest Corporation, Annual General Meeting, Jun 28, 2024.お知らせ • Mar 15Advantest Corporation to Report Fiscal Year 2024 Results on Apr 26, 2024Advantest Corporation announced that they will report fiscal year 2024 results on Apr 26, 2024お知らせ • Mar 12Advantest to Exhibit Latest Test Solutions at SEMICON China, March 20-22 in ShanghaiAdvantest Corporation will feature its latest test solutions at SEMICON China 2024 on March 20-22 at the Shanghai New International Exhibit Center (SNIEC). In a unique application-based exhibit, Advantest will highlight how its test technology enables innovations in high-performance computing (HPC), AI, automotive, IoT and 5G. Advantest aims to develop test technology that supports a safe, secure and sustainable society, showcasing its sustainability initiatives at this year's event. AI/HPC: NEW: Pin Scale Multilevel Serial that is both the first native and fully integrated HSIO instrument expanding the V93000 EXA Scale platform to address signaling requirements for advanced communication interfaces. NEW: HA1200, offering die test capability with active thermal control to enable at-speed 100% test coverage before the dies are assembled into 2.5D/3D packages. NEW: 2kW active thermal solution for M487x package handler series, offering thermal control capabilities to enable 100% test coverage for high computing ICs at final test. Automotive: CREA’s power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer, single-die, substrate, PKG, and module, typically used in industrial and automotive applications. T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive and power analog, and IP Engine 4 test solutions for fastest image processing to reduce CIS testing time and costs. T6391 test system with LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs. IoT/5G: V93000 Wave Scale millimeter OTA enables far-field/near-field parametric OTA testing for millimeter wave applications (5GNR2, WiGiG, Car Radar). The solution covers multi-site testing for mass production and could be easily integrated into existing test infrastructure. Wave Scale RF, designed for cost-efficient production of 5G and Wi-Fi communication ICs, including WiFi 7 and WiFi 6E devices. Data Storage and Management: NEW: T5230 memory test system adopts a combined array architecture to reduce test cost for NAND/NVM wafer test, including wafer-level burn-in (WLBI). Wide-ranging DRAM turn-key test solutions, including wafer-level burn-in, DRAM wafer test, core final test, and at-speed interface test. T5830 SSTH memory wafer test system, offering a small economic footprint and full CP test coverage for eFlash/Smart Card and NOR/NAND flash.お知らせ • Feb 29Advantest Corporation Announces Management Changes, Effective April 1, 2024Advantest Corporation announced that the Board of Directors at its meeting held on February 28, 2024, resolved to change the company’s representative directors as follows. Reason for the changes: As the company’s next mid-term management plan starts in fiscal year 2024, the Chief Executive Officer of the Advantest Group and the President of Advantest Corporation are to be changed in order to realize even greater progress for the Advantest Group in the rapidly changing, fast-growing semiconductor industry. The company appointed Douglas Lefever as Representative Director, Senior Executive Officer, Group CEO from Representative Director, Corporate Vice President, Group COO; Yoshiaki Yoshida as Director, Chairperson of the Board from Representative Director, President, Group CEO. Effective date: April 1, 2024. Douglas Lefever (December 10, 1970): May 1993- Completed BSE of Mechanical Engineering, The University of Michigan; May 1995- Completed Master of Science in Mechanical Engineering, The University of Texas at Austin; June 1998- Joined Advantest America Inc.; June 2004- Completed Master of Business Administration (MBA) Northwestern University; September 2008- Vice President, Business Development, Advantest America Inc.; August 2014-Executive Officer, Advantest Corporation; September 2014- Director, President and CEO, Advantest America Inc.; June 2017- Managing Executive Officer, Advantest Corporation; June 2019- Executive Vice President, System Test Business Unit (present position); June 2020- Director, Managing Executive Officer Customer Relations & Corporate Strategy Leader, Applied Research & Venture Team; June 2021- Director, Senior Executive Officer CSO (Chief Strategy Officer); January 2023- Representative Director, Corporate Vice President, Group COO (present position).お知らせ • Feb 02Advantest Corporation Revises Earnings Forecast for the Year Ending March 31, 2024Advantest Corporation revised earnings forecast for the year ending March 31, 2024. For the period, the company expected net sales of ¥480,000 million, operating income of ¥85,000 million and net income attributable to owners of the parent of ¥64,500 million.お知らせ • Dec 16Advantest Corporation to Report Q3, 2024 Results on Jan 31, 2024Advantest Corporation announced that they will report Q3, 2024 results on Jan 31, 2024お知らせ • Dec 12+ 1 more updateAdvantest Corporation Launches Real-Time Data Infrastructure (Rtdi™?) Platform Driving the Next Generation of Semiconductor TestAdvantest Corporation announced that its newly launched ACS Real-Time Data Infrastructure (RTDI™?) has been accepted by multiple major data analytics companies as part of an industry-wide collaboration to accelerate data analytics and artificial intelligence (AI)/machine learning (ML) decision-making within a single, integrated platform. ACS RTDI is a real-time data infrastructure that securely collects, analyzes, stores and monitors semiconductor test data to empower customers to automate the process of converting insights into actionable test decisions within milliseconds. This helps customers and partners reduce test time, optimize quality and reliability and enhance smart packaging. The ACS RTDI platform integrates data sources across the entire IC manufacturing supply chain while employing low-latency edge computing and analytics in a secure True Zero Trust™? environment. This innovative infrastructure minimizes the need for human intervention, streamlining overall data utilization across multiple inserted and supporting customers' databases. Because cyber security remains a top concern among customers, the ACS RTDI platform was architected to be reliable and safe, ensuring hassle-free OS revisions, which protects data from unauthorized access or loss by leveraging True Zero Trust. Overall, the new ACS ecosystem will enable customers to boost quality, yield, and operational efficiencies, and to accelerate product development and new product introductions for years to come.お知らせ • Dec 07Advantest Corporation Targets NAND Flash/NVM Market with New Group of Memory Test ProductsAdvantest Corporation announced three new additions to its suite of memory test products. The new offerings are designed to target NAND Flash and non-volatile memory (NVM) devices, which face extreme pressure to bring down test costs and cost of ownership on the test floor. The new products include the T5230 memory wafer test solution; the STM32G third-generation protocol NAND system-level test module for the T5851 memory tester; and the T5835 high-speed wafer-sort interface option. The T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability. The T5851-STM32G module is designed to cover the latest generation of protocol NAND devices, including UFS4.0 and PCIe Gen 5 ball grid array (BGA) packaged devices for high-speed system-level NAND testing at up to 32Gbps. Fully upgradeable and compatible with existing T5851 systems, the new module delivers tester-per-DUT (device under test) performance and is qualified for high-volume manufacturing, qualification, reliability and characterization. Created as an option for the proven T5835 multifunction memory test system, the new high-speed wafer- Sort interface enables high-speed NAND Flash/NVM wafer probing (up to 5.4Gbps) with 4,096 full I/O channels. Raw NAND die inside solid-state drives (SSDs) require increasingly higher-speed functionality, necessitating evaluation and test of die performance at the wafer level, not just in package-level final test. The solution delivers high-speed probe interface with wafer-level evaluation of memory core test functionalities during engineering production, contributing to the T5835's overall value by delivering wider test coverage.お知らせ • Nov 10Advantest Corporation to Showcase Latest Test Solutions at SEMICON Europa 2023, Nov. 14-17, in Munich, GermanyAdvantest Corporation will showcase its latest IC test solutions at SEMICON Europa 2023 on Nov. 14-17 at the Messe Munich in Munich, Germany. Under the theme "Beyond the Technology Horizon," Advantest will highlight its wide portfolio of test technology for applications including automotive, 5G, AI and high-performance computing (HPC). This year's SEMICON Europa will happen in conjunction with productronica, a trade fair focusing on the newest innovations and trends in electronics manufacturing. Advantest will be located at booth #317 in Hall B1. This year's digital display will feature key products, including: V93000 EXA Scale SoC test systems, highlighting automotive test solutions and the new XPS128+HV universal VI and power supply card that lowers the cost of test for power management ICs and other high-voltage devices. CREA's power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer DIE and module, typically used in industrial and automotive applications. ACS open solutions ecosystem enabling streaming data access and real-time analytics with integrated test software and hardware monitoring and control to improve semiconductor device yield, quality, and capacity.お知らせ • Nov 01+ 1 more updateAdvantest Corporation Provides Earnings Forecast for the Year Ending March 31, 2024Advantest Corporation provided Earnings Forecast for the year ending March 31, 2024. For the period, the company expected Net sales of JPY 470,000 million, Operating income of JPY 80,000 million, Net income of JPY 60,000 million, Net income attributable to owners of the parent of JPY 60,000 million.お知らせ • Oct 25Advantest Corporation Announces A New Active Thermal Control (ATC) Option for Its M4841 High-Volume Device HandlerAdvantest Corporation announced a new Active Thermal Control (ATC) option for its M4841 high-volume device handler. ATC 2.0 provides dynamic regulation of temperature fluctuations caused by automotive semiconductors self-heating during test, helping to ensure more accurate production test of up to 16 advanced systems-on-chip (SoCs) in parallel with higher throughput and shorter test times. Massive amounts of data processing are required for devices used to power electric vehicles (EVs) and other fast-growing, data-intensive automotive applications such as infotainment systems and forthcoming Level 4 autonomous driving. Advances in semiconductor manufacturing processes bring improvements in functionality as well as enhanced power efficiency for these advanced devices. As a result, thermal design power is actually increasing, causing devices to self-heat during test and making it more difficult to control test temperature. This creates a need for handlers that can perform prompt, stable device temperature management. Replacing the handler’s prior passive thermal control technology, integrated ATC enables the M4841 to provide a stable, consistent test environment with fast response and high load-tracking characteristics that maintain the device’s internal temperature at the set test temperature, even if dynamic heat fluctuation occurs during the test. This stability enables users to build test programs with unparalleled implementation flexibility – in turn, significantly enhancing overall test productivity. Advantest’s M4841 handler with ATC 2.0 enables high-throughput test of up to 16 devices in parallel, yielding very high device volumes and supporting a range of complex ICs and packages. Its advanced performance capabilities and features make the M4841 the optimal test handler for high-volume production of devices used in consumer products such as portable digital equipment and automotive systems. The new ATC option for the M4841 handler will be available in April 2024.お知らせ • Oct 05Advantest Corporation to Showcase Latest Semiconductor Test Solutions At the International Test Conference in Anaheim, CaliforniaAdvantest Corporation announced that it will feature its latest test solutions for advanced ICs at the 2023 International Test Conference (ITC) on Oct. 8-13 at the Disneyland Convention Center in Anaheim, California. International Test Conference is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. Advantest is a proud Platinum sponsor of ITC 2023 and will also sponsor the IEEE Automotive, Reliability, Test & Safety Workshop (ARTS) and Silicon Lifecycle Management Workshop (SLM), which will take place in conjunction with this year’s event. Products and Demos: Advantest's product showcase in booth #217 will highlight the company’s broad portfolio, including ATE, device interface, System Level Test (SLT) and analytics solutions that add customer value to the evolving semiconductor value chain. This year's digital displays will include: V93000 EXA Scale SoC test systems, including the new XPS128+HV universal VI and power supply card that lowers the cost of test for power management ICs and other high-voltage devices; DUT Scale Duo interface for the V93000 EXA Scale SoC test systems that extends DUT board space for high-volume testing and is compatible with existing DUT boards; Link Scale channel cards for the V93000 platform that improve test coverage and boost throughput in high-quality testing of complex SoCs, adding software-based functional test and HSIO SCAN test capabilities; The ACS open solutions ecosystem that is a family of products and services based on a single scalable data platform that enables third-party developers and customers to develop valuable data insights powered by the ACS Real-Time Data Infrastructure. Using real-time machine learning solutions, customers can turn these valuable insights into production-worthy actions across the entire semiconductor value chain resulting in increased yields, more rapid time-to-market, accelerated time-to-volume, and superior quality for suppliers; Advantest’s System Level Test platforms that achieve cost-effective structural test coverage (SCAN, MBIST, LBIST etc.) over functional high-speed IO interface, which can be leveraged to test over 700 DFT-enabled DUTs on ATS 7038. The seamless portability of the structural test patterns developed for ATE platform (Advantest V93000) on to ATS 7038 will be featured as well.お知らせ • Sep 28Advantest Corporation Receives PCI Express(R) Gen 5 Certification for MPT3000 Solid-State Drive Test SystemsAdvantest Corporation announced that its MPT3000 solid-state drive (SSD) test system has become the world's first SSD production tester to be certified by PCI-SIG(R) for high-speed compliance testing of PCI Express(R) (PCIe(R)) fifth-generation (Gen 5 or 5.0) devices. Advantest completed the rigorous testing process and was awarded certification in August 2023. Previously approved for PCIe 4.0 compliance testing, the MPT3000 is now also approved for official PCIe 5.0 compliance and certification testing. The PCIe 5.0 certification was awarded specifically to two key products in the MPT3000 family: the MPT3000ES3 for engineering and the MPT3000HVM3 for high-volume manufacturing.お知らせ • Sep 16Advantest Corporation to Report Q2, 2024 Results on Oct 31, 2023Advantest Corporation announced that they will report Q2, 2024 results on Oct 31, 2023お知らせ • Aug 03Advantest Corporation to Showcase Latest Memory and SSD System-Level Test Solutions At Flash Memory Summit 2023Advantest Corporation will showcase its latest storage and memory test solutions at Flash Memory Summit 2023 on Aug. 8-10 at the Santa Clara Convention Center in Santa Clara, California. Advantest is again a gold sponsor of this year's event. Advantest's booth #634 will be located in Hall B of the convention center. This year's display will feature the MPT3000HVM3 test system that addresses test requirements associated with PCI Express fifth generation (PCIe Gen 5), Compute Express Link (CXL) and NVMe solid state drives (SSDs). Its latest innovation, the HVM3, provides broad capabilities to handle virtually any SSD, from the highest-performing enterprise drives to the most cost-effective client devices. Advantest will also exhibit its all-in-one, turnkey NAND test solution, the T5835, as well as the T5503HS2, a DRAM tester for LPDDR5/X, DDR5 and GDDR6 devices. Additionally, Advantest will display its inteXcell, the first-ever fully integrated and unified test infrastructure to combine broad test coverage with high-throughput handling. The platform integrates the T5835 tester with minimal-footprint test cells for high-speed, parallel final test of up to 1,536 advanced memory ICs. Two new additions to Advantest's lineup this year are the Independent Thermal Control (ITC) device interface board and the Engineering Thermal Chamber (ETC) for the MPT3000. Both provide QA and R&D teams with advanced, accurate thermal control on a per-DUT level during device characterization or small lot production testing, helping QA and engineering teams to characterize and qualify Gen 5 products, including SSDs and CXL memory solutions. Both extend MPT3000's feature set to a wider set of use cases.お知らせ • Jun 21Advantest Corporation to Exhibit Latest IC Test Solutions at SEMICON China, June 29- July 1 in ShanghaiAdvantest Corporation will feature its latest test solutions at SEMICON China 2023 on June 29-July 1 at the Shanghai New International Expo Center in Shanghai. Under the theme "Beyond the Technology Horizon," Advantest will highlight its contributions to test technology, including advanced memory, 5G, AI, high-performance computing (HPC) and nanotechnology, as well as its ESG initiatives. Advantest's product showcase in booth #E3423 in Hall E3 will feature how the company is adding customer value to the evolving semiconductor value chain through its broad range of test solutions and services. This year's exhibit will include: EXA Scale EX test station for the V93000 platform, which increases tester capacity in IC engineering labs by four times without increased footprint, supporting a seamless transition of test content from lab to fab and lowering facility costs. DUT Scale Duo interface for the V93000 EXA Scale SoC test systems extends DUT board space for high-volume testing and is compatible with existing DUT boards. Link Scale channel cards for the V93000 platform that improve test coverage and boost throughput in high-quality testing of complex SoCs, adding software-based functional test and HSIO SCAN test capabilities. T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive and power analog, and IP Engine 4 test solutions for fastest image processing to reduce CIS testing time and costs. LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs when combined with the T6391 test system. inteXcell, the first-ever fully integrated and unified test infrastructure to combine the T5835 tester into minimal-footprint test cells, ideal for advanced memory IC final testing. T5830ES memory test system that is highly flexible and offers all of the capabilities needed to perform wafer testing and final testing of price-sensitive flash memories.お知らせ • Jun 16Advantest Corporation to Report Q1, 2024 Results on Jul 26, 2023Advantest Corporation announced that they will report Q1, 2024 results on Jul 26, 2023お知らせ • May 19Advantest Corporation Declares Year End Dividend for the Year Ended March 31, 2023, Payable on June 5, 2023Advantest Corporation declared year-end dividend of JPY 70.00 per share against JPY 70.00 per share paid a year ago. Effective date is June 5, 2023. Record date is March 31, 2023.お知らせ • May 09Advantest Corporation Ships 10,000th V93000 SoC Test SystemAdvantest Corporation announced it has shipped its 10,000(th) V93000 system-on-chip (SoC) test system to longtime customer Infineon Technologies, the world's number one automotive semiconductor supplier. The milestone system is a V93000 configuration developed to address the diverse test needs of power, analog, microcontroller and sensor ICs used in automotive and microcontroller applications. Ever-increasing semiconductor content in today's automobiles is creating a pressing need for the V93000's combination of advanced test capabilities and leading cost-of-test savings. In the more than two decades since its introduction, the flexible, scalable V93000 has become Advantest's SoC test platform. The company offers a wide range of V93000 options together with complementary test instruments including universal analog and digital test cards, RF instrumentation and mixed-signal cards, and best-in-class DPS and floating-power VI cards as well as the user-friendly SmarTest system software environment. The newest V93000 offering is the EXA Scale generation system for testing a wide range of devices, from current and future generations of low-costInternet of Things (IoT) chips to high-end automotive devices, highly integrated multicore processors, and advanced digital ICs up to the exascale performance class.お知らせ • Feb 01+ 2 more updatesAdvantest Corporation Provides Dividend Guidance for the Year Ending March 31, 2023Advantest Corporation provided dividend guidance for the year ending March 31, 2023. For the year, the company expects to pay dividend of ¥70.00 against ¥70.00 paid last year.お知らせ • Jan 25Advantest Corporation to Showcase Latest Semiconductor Test Solutions At SEMICON KoreaAdvantest Corporation will feature its latest test solutions for advanced ICs at SEMICON Korea on Feb. 1-3 at COEX in Seoul, South Korea. The company will highlight its contributions to leading-edge test technology, including advanced memory, 5G, AI, high-performance computing (HPC) and nanotechnology, as well as its ESG initiatives. Exhibition: The company's product showcase in booth #C510 will feature how the company is adding customer value to the evolving semiconductor value chain through its broad range of test solutions and services. This year's digital displays will include: New inteXcell, first-ever fully integrated and unified test infrastructure to combine the T5835 tester into minimal-footprint test cells, ideal for advanced memory IC final testing; New E5620 Defect Review Scanning Electron Microscope (DR-SEM) for precision review and classification of ultra-small photomask defects; New XPS128+HV universal VI and power supply card for V93000 EXA Scale SoC test system that lowers the cost of test for power management ICs and other high-voltage devices; New DUT Scale Duo interface for the V93000 EXA Scale SoC test systems extends DUT board space for high-volume testing and is compatible with existing DUT boards; New LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs when combined with the T6391 SoC tester; T2000 SoC test systems with improving Rapid Development Kit (RDK) usability, which accelerates test program development for all SoCs, including complex automotive and power analog applications; MPT3000 solid state drive (SSD) test systems addressing test requirements associated with PCI Express fifth generation (PCIe Gen 5), Compute Express Link™ (CXL™) and NVMe SSDs.お知らせ • Dec 16Advantest Corporation to Report Q3, 2023 Results on Jan 31, 2023Advantest Corporation announced that they will report Q3, 2023 results on Jan 31, 2023お知らせ • Dec 08Advantest Corporation to Showcase Latest IC Test Solutions At SEMICON JapanAdvantest Corporation will feature over a dozen of its latest products and services at the SEMICON Japan trade show on December 14-16 in Tokyo. Under the theme Beyond the Technology Horizon, Advantest’s exhibit will showcase its contributions to accelerating the development of revolutionary test technology, including AI, high-performance computing (HPC), cloud-based technologies and high-power ICs. In addition to showcasing advanced test technologies, Advantest will also highlight its ESG initiatives and action plans. Exhibition: The company’s product showcase in booth #1549, located in East Hall 1, will demonstrate how the company is adding customer value to the evolving semiconductor value chain through various test solutions and services. This year’s displays will include: NEW: inteXcell, first-ever fully integrated and unified test infrastructure to combine the T5835 tester into minimal-footprint test cells, ideal for advanced memory IC final testing; NEW: E5620 Defect Review Scanning Electron Microscope (DR-SEM) for precision review and classification of ultra-small photomask defects; NEW: XPS128+HV universal VI and power supply card for V93000 EXA Scale SoC test system that lowers the cost of test for power management ICs and other high-voltage devices; NEW: LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs when combined with the T6391 SoC tester; T2000 SoC test systems with improving Rapid Development Kit (RDK) usability, which accelerates test program development for all SoCs, including complex automotive and power analog applications; NEW: MPT3000 solid state drive (SSD) test systems addressing test requirements associated with PCI Express fifth generation (PCIe Gen 5), Compute Express Link™ (CXL™) and NVMe SSDs; Die level test for 2.5D and 3D package devices with accurate die alignment technology; ACS open ecosystem enabling streaming data access and real-time analytics with integrated test software and hardware monitoring and control to improve semiconductor device yield, quality, and capacity; Software solutions and services, including CONNECT+ and Adaptive Probe Cleaning.お知らせ • Dec 03Advantest Corporation Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask DefectsAdvantest Corporation unveiled the E5620 Defect Review Scanning Electron Microscope its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to contribute appreciably to production quality improvements in next-generation photomasks and shorter mask manufacturing turnaround times. Like its predecessor, the E5620 implements Advantest's highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. The system has a number of improvements specifically to target future mask requirements. E5620 Key New Features, HigSpatatial Resolution, Highly Stable, Fully Automatic Image Capture, mpatible with Mask Inspection n Systems, Elemental Composition Analysis Option, Backscattered Electron Analysis Option, T E5620 0 DR-SEM is available for purchase now. Advantest will share further details regarding its new E5620 DR-SEM during SEMICON Japan 2022, December 14-16, at Tokyo Big Sight.お知らせ • Nov 30Advantest Introduces New inteXcell Series of High-Performance, Economical Test Cells for Advanced Memory ICsAdvantest Corporation has launched inteXcell, a new line of minimal-footprint test cells designed to address demanding final-test requirements presented by the increasing bit densities, lower power consumption and faster interface speeds of future memory devices. This new final test cell infrastructure integrates a T5835 memory tester optimized for use in high-productivity test cells and is designed to adopt future memory solutions. With inteXcell, ICs can be tested on the same platform from initial engineering through mass production. inteXcell is the first ever fully integrated and unified test solution to combine broad test coverage with high-throughput handling in a highly flexible system architecture. Early units can test up to 1,536 devices in parallel with high speed and high accuracy. The new test cells have a compact structure that enables up to 384 simultaneous measurements per cell and uses only one-third of the floor space occupied by conventional test systems. Since each cell uses independent asynchronous testing, inteXcell can be configured anywhere from one to four testers, enabling high equipment utilization and streamlined cell-based maintenance. The inteXcell platform is expected to begin shipping to customers in the second quarter of 2023. Orders are now being taken by Advantest.お知らせ • Nov 23+ 1 more updateAdvantest Corporation Expands T6391 Display Driver Tester Capabilities with New Per-Pin Digitizer and Comparator (LCD HP)Advantest Corporation announced its new LCD HP (high-performance) per-pin digitizer and comparator module. Developed for use with the T6391 display driver test system, the LCD HP module features two key performance improvements. First, it improves measurement precision 5x compared to the previous module, making it ideally suited to accommodate the testing demands of advanced display driver ICs (DDICs) for high-end smartphones and augmented/virtual reality (AR/VR) applications. Second, it can handle high-voltage testing up to ±40V, enabling the module to address the high-reliability testing demands of brand-new automotive DDICs. Display panels used in devices such as OLEDs for smartphones and AR/VR glasses require very high gradation. In turn, the DDICs for these displays need to subdivide the output voltage into finer, more narrow steps, so high-precision voltage measurement is needed to test them. The higher the gradation, the more precise the voltage measurement must be. At the same time, DDICs for the automotive market have typically contained separate chips for the source and gate drivers and the timing and touch controllers. Now that these functions will all be integrated into a single chip, demand for a tester capable of testing all device functionality in one insertion is growing rapidly. The LCD HP module achieves noise reduction and uniform measurement accuracy between channels in the test system to enable high-precision measurement. It covers test requirements of new advanced DDICs for high-end smartphone and AR/VR applications, enabling the tester to support high-gradation testing with measurement accuracy of ±200mV. In addition, by supporting high-voltage testing up to ±40V with certain loads, the module enables functional testing of automotive DDICs that reflect their actual operations. The T6391 LCD HP module is highly compatible with existing modules, enabling fast, easy integration with the customer’s test setup. Currently in evaluation with a leading display IC provider, the new module is expected to be available for customer purchase in the second quarter of 2023. To learn more about the LCD HP module and Advantest’s full line of test and measurement offerings, please visit the company in booth 1549 during SEMICON Japan 2022, December 14-16, at Tokyo Big Sight.お知らせ • Oct 26Advantest Launches Universal VI and Power Supply Card for V93000EXA Scale SoC Test SystemAdvantest Corporation announced the latest addition to its Extended Power Supply (XPS) card series: the DC Scale XPS128+HV. This universal voltage-current (VI) instrument combines a high channel count (128 channels per card) with per-channel voltage ranges of up to +24V creating a test solution that efficiently addresses the test requirements for high-voltage devices such as USB Power Delivery components and charger functionalities in power management ICs (PMICs). The XPS128+HV provides full channel compatibility with the existing XPS256 card, enabling efficient, highly parallel test of power management devices with enhanced capability for high-voltage applications while continuing to cover existing applications in the low-voltage domain. The new card meets these device requirements for a cost-efficient, large-pin-count ATE system with many power VI channels. The XPS uses Advantest’s Xtreme RegulationTM technology, enabling a seamless change of operating modes from a force voltage to a force or sink current mode. This is often required when testing power management components such as low-dropout (LDO) or DC/DC regulators. Another capability of the Xtreme RegulationTM is its sequencer-controlled range changes, allowing extremely fast, deterministic test times without signal spikes that can damage a device under test (DUT). The XPS128+HV instrument can supply ICs ranging from -10V to +24V with sufficient current rating on all 128 channels in parallel. Flexible ganging allows a combination of multiple channels to achieve an even higher current, enabling testing of DC/DC converters, which require multiple-ampere load current. In addition, the card offers excellent force and measurement accuracy, which is a prerequisite for precise device trimming. Besides being used for PMIC testing, the new card can act as a standard power supply for high-performance computing and automotive applications, as well as microcontrollers (MCUs).お知らせ • Sep 16Advantest Corporation to Report Q2, 2023 Results on Oct 27, 2022Advantest Corporation announced that they will report Q2, 2023 results on Oct 27, 2022お知らせ • Sep 15Advantest Corporation Launches ACS Solution Store to Enable Real-Time Data Analytics Solutions for Semiconductor TestAdvantest Corporation rolled out the Advantest ACS Solution Store, an advanced online platform that provides ease of access to ACS real-time data infrastructure solutions and software applications. Customers can conveniently discover, purchase and securely deploy all available ACS solutions from Advantest and a broad spectrum of analytics ecosystem partners across the semiconductor lifecycle process. In addition, the ACS Solution Store enables application developers from these partner firms to publish, promote, distribute and manage their Advantest-certified apps. Capabilities incorporated in the ACS Solution Store include browsing for available ACS solutions in an online catalog and discovering how the solutions help customers transform data into real-time production control, delivering significant ROI for the semiconductor manufacturing process. In addition, automated software distribution is enabled via the ACS Container Hub for containerized1 apps, which ensures an easy, secure and reliable deployment of the apps in the test fleet. Key benefits of the ACS Solution store include: Purpose Built: enabling customers to buy and deploy Advantest-certified ACS apps from ecosystem partners with assured quality, verified security and guaranteed compatibility on Advantest test equipment. Optimized and Integrated: to provide customers with solutions tailored to deliver improved yield, quality, OEE and time to market. Convenient: a one-stop ecosystem portal where customers can seamlessly and securely deploy ready-made or custom-built company and partner apps from a single, trusted source, maximizing the value they can realize from ACS Edge and ACS Nexus, the key building blocks of the ACS real-time data infrastructure. Versatile: open solution ecosystem enables third-party developers and customers to develop data analytics solutions powered by ACS real-time data infrastructure. Advantest launched ACS as part of its Grand Design strategy to enhance edge and cloud infrastructure services, data analytics and AI/machine learning solutions as a means of helping customers accomplish data-driven workflows. The ACS product family is based on a scalable data platform and forms an open solutions ecosystem for software apps developed by Advantest and ACS ecosystem partners. The ACS Solution Store is the next vital building block in advancing this platform.お知らせ • Jul 29Advantest Corporation (TSE:6857) announces an Equity Buyback for 10,000,000 shares, representing 5.26% for ¥50,000 million.Advantest Corporation (TSE:6857) announces a share repurchase program. Under the program, the company will repurchase up to 10,000,000 shares, representing 5.26% of outstanding shares for ¥50,000 million. The company will repurchase its shares for the purpose of shareholder returns, improving capital efficiency and future restricted stock compensation plans. The program will expire on December 23, 2022. As of June 30, 2022, the company had 190,168,871 shares in outstanding and 9,373,394 shares in treasury.お知らせ • Jul 28+ 2 more updatesAdvantest Corporation Revises Earnings Guidance for the Year Ending March 31, 2023Advantest Corporation revised earnings guidance for the year ending March 31, 2023. For the period, the company revised net sales from JPY 510,000 million to JPY 550,000 million, operating income from JPY 150,000 million to JPY 170,000 million and net income from JPY 112,500 million to JPY 130,000 million.お知らせ • Jul 27Advantest Corporation Adds System-Level Testing Capability for Advanced Memory ICs Used in High-Growth Automotive MarketAdvantest Corporation has installed its first enhanced T5851-STM16G tester capable of nonvolatile memory express (NVMe) system-level test coverage at a major manufacturer of IC memory devices. By expanding the capabilities of its established T5851 platform, Advantest is now able to address the growing market for testing NVMe solid-state drives (SSDs) using ball-grid arrays (BGAs), which are seeing rapidly increasing use in automotive applications including autonomous vehicles. Designed to perform system-level testing of NVMe BGA SSDs, the T5851-STM16G tester is ideally suited for evaluating any generation of BGA SSDs in either an engineering environment or a high-volume production site. The highly versatile platform can handle devices with multiple protocols, including NVMe, UFS and PCIe, at speeds up to 16 Gbps. The system’s modular, tester-per-DUT architecture supports test flows required for system-level testing of up to 768 devices simultaneously. These performance features help users get their newest memory designs to market faster. In addition, FutureSuite software ensures that the tester can be easily integrated with all other members of the T5800 product family to minimize learning curves. Advantest is now taking orders for the T5851-STM16G tester. It is available either as a new tester from Advantest’s factory or as a cost-effective enhancement to users’ existing T5851 or even T583X units.お知らせ • Jun 16Advantest Corporation to Report Q1, 2023 Results on Jul 28, 2022Advantest Corporation announced that they will report Q1, 2023 results on Jul 28, 2022お知らせ • Jun 02Advantest Corporation (TSE:6857) entered into an agreement to acquire Crea Collaudi Elettronici Automatizzati Srl.Advantest Corporation (TSE:6857) entered into an agreement to acquire Crea Collaudi Elettronici Automatizzati Srl on June 1, 2022. The closing of the transaction is subject to regulatory approvals. Pedersoli Studio Legale and Nagashima Ohno & Tsunematsu acted as Legal advisor and Houlihan Lokey acted as financial advisor in this transaction.お知らせ • May 16Advantest Launches Compact Test Station for V93000 Platform, Enabling 4X Capacity Increase in IC Engineering LabsAdvantest Corporation is continuing to increase the value of its V93000 platform in engineering environments with the introduction of its EXA Scale EX test station, designed for structural and functional test bring up, debugging and characterization of complex digital devices. The highly compact and cost-efficient EXA Scale EX provides an optimized solution for boosting the capacity of engineering labs while also being fully compatible with high-volume manufacturing, making it easy for engineers to integrate newly developed test content into production-worthy test programs. The EXA Scale EX is well suited for use by high-volume chip makers as well as startup companies and design houses. The three-slot test head presents the most economical means of setting up a heavily concentrated engineering lab that includes a minimal footprint, low power consumption and a highly automated engineering test cell with integrated temperature control. When the new test head is paired with Advantest’s M4171 handler, a lab’s testing capacity can be quadrupled, without augmenting the existing floor space. In addition, mounting cameras on the handler can allow engineers to monitor the test cell’s operation while working remotely. The EXA Scale EX facilitates the quick and easy transfer of test content between engineering and manufacturing because both environments can use identical instruments and software, including a V93000-compatible DUT board, digital channel cards, device power supplies and the SmarTest 8 tester software. The resulting benefits include faster bring up and pattern validation of digital devices, which speed up the pace of new product introductions.お知らせ • May 10Advantest Introduces Flexible DUT Interface Enabling Increased Parallelism on V93000 EXA Scale Test SystemsAdvantest Corporation has launched its DUT Scale Duo interface for the V93000 EXA Scale SoC test systems, enabling the industry’s highest level of parallelism for testing advanced semiconductors. With this revolutionary interface, the usable space on DUT boards and probe cards is increased by 50% or more while wafer probe and final-test set ups can accommodate component heights that are more than three times taller. In today’s testing environments, the number of devices that can be tested in parallel is most often limited by the component space on the probe card or DUT board, not by available tester resources. With fast-growing market segments including automotive, mobile and RF devices trending toward higher site counts, the need for more space on DUT boards for IC testing is becoming critical. In addition, leading-edge wafer probers and final-test handlers require more area on printed circuit boards to provide the most cost-efficient solutions, from single wafer touch-down capabilities in wafer probing to massively parallel final testing across 32 sites or more. Advantest offers the industry’s first DUT interface with the capability to adapt either to the existing standard DUT board or probe card size or to switch to the new, significantly larger size. Using a unique sliding mechanism, users can effortlessly switch back and forth between both formats to adapt to specific application requirements. Along with the new interface, a new super-stiff extended bridge achieves superior deflection performance in direct-probing set ups. The unit’s universal design gives it the versatility to support a wide range of applications including digital and RF device testing. With its sophisticated sensing capabilities, the extended bridge delivers the industry’s best planarity and high manufacturing yield, ensuring highly accurate positioning and verification of probe card clamping. The new interface’s performance has been verified by pilot customers before device ramp up for high-volume manufacturing. DUT Scale Duo is expected to be broadly available by the middle of this year.お知らせ • Apr 26Advantest Corporation Rolls Out ACS Adaptive Probe Cleaning to Optimize Probe Card Cleaning EfficiencyAdvantest Corporation announced its industry-first ACS Adaptive Probe Cleaning (APC) solution to optimize the probe card cleaning cycle with efficacy. Part of Advantest’s ACS open solution ecosystem, APC has been proven with customers throughout Asia and Europe. STMicroelectronics has installed ACS APC at two of its manufacturing sites and is seeing cleaning cycle times slashed significantly to effective improves yield, lengthen probe card life cycle and increase system available time for test. While there are many techniques aimed at reducing test time and cost, probe cards cost presents an emerging challenge as pin count and functional complexity increase, so does the ratio of probe card expenses in both maintenance and life cycle management. Typically, chipmakers implement a fixed-cycle online cleaning method, which requires a learning curve to determine the ideal cleaning-to-yield-loss tradeoff and thus takes longer time in new device ramp and incur more loss than necessary. ACS APC introduces Advantest’s “adaptive interval” approach to probe tip cleaning. It uses artificial intelligence (AI) algorithms to assess needles’ dirtiness and cleans them only when yields are being affected to drastically reduce cleaning frequency. The machine learning model takes test result from the first wafer with a pre-fixed cleaning cycle to learn the failure pattern, then it shifts to adaptive cleaning for the rest of the wafers in the same lot. The assessment takes negligible time per wafer, without impacting test throughput. Jean-Luc Mariani, EWS Europe Operations & Technology Director and Chris Portelli-Hale, Test Technology R&D Director, both of ST Microelectronics, confirmed that they have installed several Advantest ACS APC units to aid in testing a variety of complex devices, and are seeing impressive results. They noted that their cleaning cycles have been significantly reduced, which has enabled them to cut probe card maintenance costs in half and bring about more effective probe card spare and life cycle management.お知らせ • Apr 06Advantest Corporation Introduces New 3D Image ViewerAdvantest Corporation has introduced a new 3D image viewer, the Euclid, for its Hadatomo™ series of photoacoustic microscopes. The Euclid can display 3D images by superimposing data on melanin in the skin, the vascular network, and the skin structure, as measured by a Hadatomo™ tool, and can also easily create tomographic images. In addition, image display conditions can be imported as a configuration file, enabling easy comparisons of measurement data. The user-friendly 3D image viewer is an ideal tool for dermatological research in the fields of beauty and healthcare.お知らせ • Jan 28Advantest Corporation Revises Consolidated Earnings Guidance for the Fiscal Year Ending March 31, 2022Advantest Corporation revised consolidated earnings guidance for the fiscal year ending March 31, 2022. For the year, the company expects net sales to be JPY 410.0 billion against previous guidance of JPY 400.0 billion. Operating income and income before income taxes, both to be JPY 115.0 billion against previous guidance of JPY 105.0 billion. Net income to be JPY 86.3 billion against previous guidance of JPY 78.8 billion.お知らせ • Dec 09Advantest Corporation to Showcase Industry’s Most Advanced IC Test Solutions and Sponsor Industry Events at SEMICON Japan, December 15-17 in TokyoAdvantest Corporation will feature more than a dozen of its latest products and services at the SEMICON Japan trade show on December 15-17. This year’s exhibition is returning to Tokyo Big Sight as an in-person event, although some conference sessions will be offered online enabling remote participation as an option. Advantest’s exhibit in booth #2347 located in East Hall will demonstrate how the company is adding customer value in the evolving semiconductor value chain through a wide variety of test solutions and services. Displays will include: NEW: V93000 Link Scale channel cards for software-based functional and SCAN testing on the V93000 platform; NEW: T2000 ISS IP Engine 4, an image-processing engine for high-resolution and high-speed image processing; NEW: T5835 all-in-one high-speed memory test solution and T5221 NAND/NVM multi wafer-test solution, both software compatible with the industry-standard T583x test platform; NEW: Advantest Cloud Solutions™, a state-of-the-art, cloud-based ecosystem enabling users to manage test and equipment data as well as providing instant access to online training and service tools; MPT3000 test system for evaluating all solid-state drives; B6700 and H5620 series of burn-in memory testers; Remotely operable test handlers, enabling device and data handling from engineering labs to production test floors; Software tools and services including Advantest CONNECT+ remote support services and IQ Box for V93000 EXA Scale external calibration; E3650, a high-end MVM-SEM®, and E5610, a defect review SEM supporting next-generation photomasks; and Financing services providing pre-owned equipment solutions.お知らせ • Dec 02Advantest Introduces Latest Image-Processing Engine for Testing CIS Devices Used in High-Resolution Smart PhonesAdvantest Corporation has begun shipping the fourth generation of its high-speed image-processing engine that applies heterogeneous computing technology to detect defects in the data output from today’s most advanced CMOS image sensors (CIS). When integrated on the proven T2000 ISS platform, the new T2000 IP Engine 4 (Image Processing Engine 4) system provides the optimal means of evaluating the latest high-resolution, high-speed CIS devices used in advanced smart phone cameras. While the number of cameras in smart phones is increasing, so is the pixel count per camera. Currently available CIS devices within today’s most advanced smart phones incorporate more than 100 million pixels to achieve high resolution. The new T2000 IP Engine 4 features enhanced computing power to handle huge volumes of imaging data while also reducing test times and the cost of test. Used along with Advantest’s 4.8GICAP image capture module, the new tester can perform high-volume, at-speed testing of the most advanced mobile CIS including 3.5-Gsps C-PHY and 4.8-Gbps D-PHY devices. Image-processing accelerators enable fast testing of high-resolution CIS with more than 200 million pixels. The system is supported by a dedicated image-processing library optimized for the IP Engine 4. The algorithms provided are suitable for high-speed image-processing environments, helping to facilitate test program development. Designed for installation on the T2000 ISS platform, the IP Engine 4 is fully compatible with previous generations of image-processing engines and is easily upgradable, enabling users to leverage their existing assets including test programs and probe cards.お知らせ • Dec 01Advantest Corporation Introduces New T5835 Memory Tester for Advanced Drams and Nand Flash Devices with High-Speed InterfacesAdvantest Corporation announced the newest cost-efficient, high-volume memory tester in its T5800 product family. With its 5.4-Gbps operating speed and massive parallelism, the new T5835 system is a wide-coverage test solution for current and next-generation DRAM core and high-speed NAND devices. Interface speeds on both volatile and nonvolatile memory ICs are continuing to accelerate. Market trends indicate that mid-speed final testing of DRAM cores is increasing to achieve an optimal balance of reliability, test coverage and cost efficiency. Interface speeds for testing NAND memories can be more than 2 Gbps for today’s high-speed devices and are projected to exceed 4 Gbps for upcoming nonvolatile memories. IC makers need a test solution that can keep pace with escalating performance requirements while also maintaining or improving the overall cost of test. The new T5835 has full testing functionality for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to double-data-rate (DDR) and low-power double-data-rate (LPDDR) DRAM chips. In addition, the system’s built-in dedicated hardware functions allow it to reach throughput levels, lowering the cost of test. It can handle 768 devices simultaneously for final package-level testing. System capabilities include known-good-die (KGD) wafer-level testing of DRAMs, an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield. The T5835 is designed on the modular enhanced T5800 series platform to optimize scalability, flexibility and performance for both wafer sorting and final testing. It can be configured as either an engineering station for use in R&D environments or as a production-volume tester equipped with a small, medium or large test head. All system configurations are inherited from Advantest’s existing memory test system and leverage the Future Suite operating system to provide continuing test program compatibility. These features allow users to seamlessly transition from previous generations of the T5800 series while maintaining production efficiency.お知らせ • Nov 30Advantest Announces New Versatile, High-Throughput Test Solution for NAND/Nonvolatile Flash Memory ICsAdvantest Corporation has introduced a new high-throughput memory tester for NAND flash devices that can perform functional testing of chips while delivering highly accurate timing, repeatability and failure detection. With data-transfer speeds that are more than five times faster than its predecessor, the new T5221 system is designed to improve production efficiencies while reducing test costs for wafer sorting, built-in self-testing (BIST) and wafer-level burn-in (WLBI). Worldwide sales of NAND wafer test equipment for multi-stacked type probers are approximately USD 100 million per year, accounting for an estimated seven percent of the total memory market. As the market grows, customers are shifting away from high-functionality wafer-sorting test equipment toward more cost-effective design-for-test (DFT) and BIST strategies using multi-probe systems. The T5221 is optimized for use with a multi-wafer prober. The system controller can simultaneously manage up to 12 test stations, each with independent testing capabilities. The combined-array architecture reduces test times while the tester’s massive parallelism allows it to perform wafer-level testing on up to 1,152 devices at once. The system’s test stations do not add to the overall footprint because they are housed within the multi-wafer prober. This allows the T5221 platform to use much less floor space than Advantest’s previous nonvolatile memory tester and a standalone prober. The new tester can be docked with either a 12-stage multi-wafer prober for use in mass production or single- or dual-wafer probers in engineering environments. Probe card design has been simplified to lower both the cost of ownership and cost of test. The unit incorporates a combined performance board that eliminates the need for a printed circuit board on the probe card. System features include two driver pins and one I/O pin for each device under test as well as a flexible algorithmic pattern generator (ALPG), a waveform generator and various self-diagnostic functions. To further enhance the T5221’s performance range, an optional upgrade is available to boost the power-supply level as high as 28 volts while still measuring small currents down to one nanoampere (nA). These capabilities are not available in many competitive products. There is even a “green” element to the new tester. The environmentally friendly design eliminates the use of toxic substances in separating and disassembling the system’s parts. The T5221’s operation is fully compatible with Advantest’s legacy memory solutions to provide users with a seamless transition from previous generations of equipment. T5221 testers are expected to begin shipping to customers by the first quarter of 2022.お知らせ • Jul 01Advantest Corporation Announces Results of Clinical Study on the Identification of Covid-19 VirusesAdvantest Corporation has announced that the results of a clinical study on the identification of COVID-19 viruses using the company's nanoSCOUTER fine particle measurement instrument were published in Nature Communications, a peer-reviewed scientific journal, on June 17th. In the study, 100 saliva samples (50 negative for Covid-19 and 50 positive) were measured and analyzed within 5 minutes each. Sensitivity (the ability of the test to correctly identify positive samples) of 90% and specificity (the ability of the test to correctly identify negative samples) of 96% were achieved. A research group of the Institute of Scientific and Industrial Research at Osaka University is studying virus testing methods using the AI-based particle identification system developed by Aipore Inc.2 and the nanoSCOUTER™. The method used in the just-published study identifies viral particles by passing them through a nanoscale hole, through which a microcurrent is passed, and applying AI machine-learning to the highly accurate current waveform thus obtained. The results of this research3 can be expected to facilitate immediate diagnoses in hospitals as well as viral screening for large gatherings. In addition, machine-learning can be applied to many types of viruses, enabling early detection of novel pathogens. The nanoSCOUTER is a lightweight, desktop-sized fine particle measurement instrument that utilizes a precise nanopore (nanometer-scale pore) sensor module made with semiconductor manufacturing processes and Advantest's proprietary microcurrent measurement technology. It measures the quantity and particle size of fine particles on the order of 100 nanometers, such as viruses, exosomes, and liposomes, with great speed and accuracy. In addition, when the nanoSCOUTER is used in conjunction with Aipore Inc.'s AI-based particle identification system, it is possible to quickly identify the type of particles detected. At the present time, the product is a scientific instrument, not an approved medical device. Rapid and accurate testing methods, along with vaccines and therapeutic agents, are important measures for prevention of Covid-19 spread. Based on Advantest's corporate mission of "enabling technologies," the company will strive to further develop this technology so that the nanoSCOUTER™ can contribute to solving these vital issues.お知らせ • Jun 18Advantest Corporation Developing Innovative Methodologies for High-Speed Scan and Software-Based Functional TestingAdvantest Corporation is pilot testing a next-generation solution for performing both high-speed scan testing and software-driven functional device testing on the V93000 platform by leveraging the existing high-speed serial I/O interfaces on advanced integrated circuits . This novel approach can correlate scan testing results between established and new test routines, boot up and execute on-chip test software and achieve a seamless end-to-end data flow in conjunction with Advantest’s partners in electronic design automation. The new capabilities are being developed on a new, modular card architecture that is expected to be broadly available next year. The V93000 platform will be able to quickly and cost-effectively handle the growing volume of scan test data resulting from increasing gate counts in today’s highly integrated semiconductors. The new methodologies also will be used to perform system-level-type functional testing of the complex interactions among numerous cores within system-on-chip devices, including the communication to an external host. This will add to structural test coverage and facilitate the correlation between automated test equipment and system-level testing. Together, these innovations will help bring software-based functional testing into the production environment, where potential defects can be dentified earlier during wafer-sort and packaged-device testing.お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2021 Results on Apr 27, 2021Advantest Corporation announced that they will report fiscal year 2021 results on Apr 27, 2021お知らせ • Jan 31Advantest Corporation Revises Earnings Guidance for the Full Year Ending March 31, 2021Advantest Corporation revised earnings guidance for the full year ending March 31, 2021. For the year, the company expects to report net sales of JPY 305,000 million, operating income of JPY 67,000 million and net income of JPY 61,500 million compared to previous guidance of net sales of JPY 275,000 million, operating income of JPY 52,500 million and net income of JPY 42,500 million for the same period.お知らせ • Jan 13Advantest Corporation Ramps Production-Volume DC Scale XPS256 Device Power Supply (DPS) CardAdvantest Corporation announced that its DC Scale XPS256 Device Power Supply (DPS) card, developed for use with the V93000 EXA Scale™ SoC test system, is now ramping to production-volume test at leading makers of communications processors. Providing the industry’s first universal DPS pin capability, the XPS256 delivers high accuracy, performance and dynamic response for a variety of data-driven applications. Key markets such as mobile/broadband communications, high-performance computing (HPC) and artificial intelligence (AI) are driving unprecedented demand for massive data volumes. The XPS256 is designed to meet the associated stringent test-performance requirements, and leverages Advantest’s Xtreme Link™ technology to deliver massive scalability and flexibility. The XPS256 covers wide-ranging current requirements, implementing unlimited ganging to scale from milliamps (mA) to thousands of Amps with no performance degradation. Combining three instruments in a single power supply, the DPS pin delivers best-in-class flexibility, accuracy (± 150µV) and dynamic response, with full four-quadrant voltage-current (VI) capabilities and very small overshoot/undershoot, enabled by Advantest’s Xtreme Regulation. In addition, the card offers revolutionary probe needle protection and zero-overhead background profiling for current and voltage across the entire test flow; fine-granularity power delivery to ensure current balancing across the needles; and in-line contact-resistance monitoring for adaptive needle cleaning and preventive maintenance. With its ultra-fast hardware clamp, the XPS256 also protects the DUT, probe cards, and sockets against thermal runaways.お知らせ • Dec 19Advantest Corporation to Report Q3, 2021 Results on Jan 28, 2021Advantest Corporation announced that they will report Q3, 2021 results on Jan 28, 2021株主還元VANADE SemiconductorDE 市場7D3.2%8.9%-0.02%1Y309.1%106.4%0.1%株主還元を見る業界別リターン: VANA過去 1 年間で106.4 % の収益を上げたGerman Semiconductor業界を上回りました。リターン対市場: VANA過去 1 年間で0.1 % の収益を上げたGerman市場を上回りました。価格変動Is VANA's price volatile compared to industry and market?VANA volatilityVANA Average Weekly Movement11.0%Semiconductor Industry Average Movement8.9%Market Average Movement6.0%10% most volatile stocks in DE Market13.2%10% least volatile stocks in DE Market2.6%安定した株価: VANAの株価は、 German市場と比較して過去 3 か月間で変動しています。時間の経過による変動: VANAの weekly volatility ( 11% ) は過去 1 年間安定していますが、依然としてGermanの株式の 75% よりも高くなっています。会社概要設立従業員CEO（最高経営責任者ウェブサイト19467,001Douglas Lefeverwww.advantest.com株式会社アドバンテストは、日本、米州、欧州、アジアにおいて、半導体、コンポーネント・テストシステム製品、メカトロニクス関連製品の製造・販売を行っています。事業セグメントは3つ：半導体・部品テストシステム事業、メカトロニクス関連事業、サービス・サポート他事業。半導体・部品テストシステム事業では、半導体業界および電子部品業界向けにテストシステム製品を提供するとともに、SoC半導体デバイス向けテストシステム、メモリ半導体デバイス向けテストシステムを提供している。メカトロニクス関連事業」は、半導体デバイスをハンドリングするためのメカトロニクス応用製品であるテストハンドラー、被測定デバイスとのインターフェースであるデバイス・インターフェース、およびナノテクノロジー関連製品を提供しています。サービス・サポート他」は、半導体やモジュールのシステム・レベルのテスト・カスタマ・ソリューションのテスト・ソリューションとサポート・サービスを提供している。また、消耗品・中古品の販売、機器リース等の事業も行っている。また、研究開発活動や保守・サポートサービスも行っている。同社は1946年に設立され、東京に本社を置く。もっと見るAdvantest Corporation 基礎のまとめAdvantest の収益と売上を時価総額と比較するとどうか。VANA 基礎統計学時価総額€116.98b収益（TTM）€2.04b売上高(TTM)€6.13b57.4xPER（株価収益率19.1xP/SレシオVANA は割高か？公正価値と評価分析を参照収益と収入最新の決算報告書（TTM）に基づく主な収益性統計VANA 損益計算書（TTM）収益JP¥1.13t売上原価JP¥402.50b売上総利益JP¥726.11bその他の費用JP¥350.75b収益JP¥375.35b直近の収益報告Mar 31, 2026次回決算日該当なし一株当たり利益（EPS）517.73グロス・マージン64.34%純利益率33.26%有利子負債／自己資本比率0%VANA の長期的なパフォーマンスは？過去の実績と比較を見る配当金0.2%現在の配当利回り11%配当性向VANA 配当は確実ですか？VANA 配当履歴とベンチマークを見るVANA 、いつまでに購入すれば配当金を受け取れますか？Advantest 配当日配当落ち日Mar 30 2026配当支払日Jun 09 2026配当落ちまでの日数42 days配当支払日までの日数29 daysVANA 配当は確実ですか？VANA 配当履歴とベンチマークを見るView Valuation企業分析と財務データの現状データ最終更新日（UTC時間）企業分析2026/05/07 20:27終値2026/05/07 00:00収益2026/03/31年間収益2026/03/31データソース企業分析に使用したデータはS&P Global Market Intelligence LLC のものです。本レポートを作成するための分析モデルでは、以下のデータを使用しています。データは正規化されているため、ソースが利用可能になるまでに時間がかかる場合があります。パッケージデータタイムフレーム米国ソース例会社財務10年損益計算書キャッシュ・フロー計算書貸借対照表SECフォーム10-KSECフォーム10-Qアナリストのコンセンサス予想+プラス3年予想財務アナリストの目標株価アナリストリサーチレポートBlue Matrix市場価格30年株価配当、分割、措置ICEマーケットデータSECフォームS-1所有権10年トップ株主インサイダー取引SECフォーム4SECフォーム13Dマネジメント10年リーダーシップ・チーム取締役会SECフォーム10-KSECフォームDEF 14A主な進展10年会社からのお知らせSECフォーム8-K* 米国証券を対象とした例であり、非米国証券については、同等の規制書式および情報源を使用。特に断りのない限り、すべての財務データは1年ごとの期間に基づいていますが、四半期ごとに更新されます。これは、TTM（Trailing Twelve Month）またはLTM（Last Twelve Month）データとして知られています。詳細はこちら。分析モデルとスノーフレーク本レポートを生成するために使用した分析モデルの詳細は当社のGithubページでご覧いただけます。また、レポートの使用方法に関するガイドやYoutubeのチュートリアルも掲載しています。シンプリー・ウォールストリート分析モデルを設計・構築した世界トップクラスのチームについてご紹介します。業界およびセクターの指標私たちの業界とセクションの指標は、Simply Wall Stによって6時間ごとに計算されます。アナリスト筋Advantest Corporation 21 これらのアナリストのうち、弊社レポートのインプットとして使用した売上高または利益の予想を提出したのは、 。アナリストの投稿は一日中更新されます。32 アナリスト機関Steven LiuAletheia Analyst Network LimitedWarren LauAletheia Analyst Network LimitedStacy RasgonBernstein29 その他のアナリストを表示
お知らせ • Apr 28Advantest Corporation, Annual General Meeting, Jul 31, 2026Advantest Corporation, Annual General Meeting, Jul 31, 2026.
お知らせ • Apr 24Advantest Corporation Introduces Pin Scale 5000B Digital Test Solution To Extend Capabilities Of V93000 EXA Scale Test PlatformAdvantest Corporation announced Pin Scale 5000B, an enhanced digital test solution for the V93000 EXA Scale Platform designed to address the growing test requirements of advanced artificial intelligence (AI) and high-performance computing (HPC) devices. AI and HPC semiconductor capabilities and complexity are growing swiftly, driven by advanced process nodes, heterogeneous integration and chiplet-based architectures. These devices require significantly higher structural and functional test coverage and processing of rapidly increasing volumes of test data. The Pin Scale 5000B card significantly expands available vector memory, offering deep and scalable storage capacity aligned with industry demands. Hardware and software facilitate optimal memory usage in chiplet-based architectures, reducing customers’ overall consumption and associated costs while addressing evolving memory requirements for the future. The new card also enables customers to efficiently scale their existing test programs and hardware configurations in response to evolving device requirements. This solution is engineered to accommodate contemporary scan fabric architectures, enabling concurrent testing of multiple IP cores using a streaming approach. Its new hardware capabilities allow test results to be observed across multiple cores within a single test pattern execution, enabling instantaneous insights into error distribution among the cores. These capabilities help improve structural coverage and core-level visibility, significantly reducing test times and cost-of-test. The Pin Scale 5000B delivers high-bandwidth test access, offering data rates up to 5 Gbps through the proven pin electronics architecture of the Pin Scale 5000. Pin Scale 5000B is a fully compatible superset of the established Pin Scale 5000, complementing the V93000 portfolio. The Pin Scale 5000B digital test instrument is now ramping with key customers.
お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2026 Results on Apr 27, 2026Advantest Corporation announced that they will report fiscal year 2026 results at 3:30 PM, Tokyo Standard Time on Apr 27, 2026
お知らせ • Jan 28Advantest Corporation Revises Consolidated Earnings Guidance for the Year Ending March 31, 2026Advantest Corporation revised consolidated earnings guidance for the year ending March 31, 2026. For the year, the company expects the net sales to be JPY 1,070,000 million, operating income to be JPY 454,000 million, net income of JPY 328,500 million, net income attributable to owners of the parent to be JPY 328,500 million or basic earnings per share to be JPY 452.34 against net sales to be JPY 950.0 billion, operating income to be JPY 374.0 billion, net income of JPY 275.0 billion.
お知らせ • Dec 12Advantest Corporation to Report Q3, 2026 Results on Jan 28, 2026Advantest Corporation announced that they will report Q3, 2026 results on Jan 28, 2026
お知らせ • Dec 11+ 1 more updateAdvantest Corporation Unveils T2000 AiR2X Air-Cooled SoC and Power Analog Test SolutionAdvantest Corporation announced the T2000 AiR2X, a next-generation air-cooled test system engineered to meet rising demand for compact, cost-efficient testers in evaluation and high-mix, low-volume production environments. The new solution is fully compatible with the conventional T2000 test system and delivers twice the test resources of the previous air-cooled T2000 AiR test system, while maintaining low power and air-cooling requirements. The T2000 AiR2X addresses multiple converging market factors, including end-of-life support for legacy systems such as the T6500 series and T7700 series, and ongoing replacement needs across compact air-cooled testers. With a multitude of air-cooled SoC test systems in operation worldwide, the new T2000 AiR2X solution positions Advantest to meet sustained demand in this growing market. With its flexible measurement configuration, the T2000AR2X supports up to 12 measurement modules, including functional/SCAN test, high-precision DC and automotive device DC testing up to 320V. The system's unique multisite controller function significantly reduces test time during volume production. The T2000 AiR 2X incorporates Advantest's T2000 RECT550 performance board, which flexibly supports a wide range of configurations, along with a unified support infrastructure and expandable module options, adopting the same program environment used in the T2000. In addition, the Rapid Development Kit (RDK) significantly reduces the effort required for program creation and debugging, contributing to shorter platform migration and implementation times. Initial device evaluations are underway, confirming broad application coverage for the T2000 AiR2 X across industrial MCUs, consumer ASICs, battery-monitoring ICs for automotive and mobile devices, and power analog applications. The system will enter general availability later this month.
お知らせ • Apr 28Advantest Corporation, Annual General Meeting, Jul 31, 2026Advantest Corporation, Annual General Meeting, Jul 31, 2026.
お知らせ • Apr 24Advantest Corporation Introduces Pin Scale 5000B Digital Test Solution To Extend Capabilities Of V93000 EXA Scale Test PlatformAdvantest Corporation announced Pin Scale 5000B, an enhanced digital test solution for the V93000 EXA Scale Platform designed to address the growing test requirements of advanced artificial intelligence (AI) and high-performance computing (HPC) devices. AI and HPC semiconductor capabilities and complexity are growing swiftly, driven by advanced process nodes, heterogeneous integration and chiplet-based architectures. These devices require significantly higher structural and functional test coverage and processing of rapidly increasing volumes of test data. The Pin Scale 5000B card significantly expands available vector memory, offering deep and scalable storage capacity aligned with industry demands. Hardware and software facilitate optimal memory usage in chiplet-based architectures, reducing customers’ overall consumption and associated costs while addressing evolving memory requirements for the future. The new card also enables customers to efficiently scale their existing test programs and hardware configurations in response to evolving device requirements. This solution is engineered to accommodate contemporary scan fabric architectures, enabling concurrent testing of multiple IP cores using a streaming approach. Its new hardware capabilities allow test results to be observed across multiple cores within a single test pattern execution, enabling instantaneous insights into error distribution among the cores. These capabilities help improve structural coverage and core-level visibility, significantly reducing test times and cost-of-test. The Pin Scale 5000B delivers high-bandwidth test access, offering data rates up to 5 Gbps through the proven pin electronics architecture of the Pin Scale 5000. Pin Scale 5000B is a fully compatible superset of the established Pin Scale 5000, complementing the V93000 portfolio. The Pin Scale 5000B digital test instrument is now ramping with key customers.
お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2026 Results on Apr 27, 2026Advantest Corporation announced that they will report fiscal year 2026 results at 3:30 PM, Tokyo Standard Time on Apr 27, 2026
お知らせ • Jan 28Advantest Corporation Revises Consolidated Earnings Guidance for the Year Ending March 31, 2026Advantest Corporation revised consolidated earnings guidance for the year ending March 31, 2026. For the year, the company expects the net sales to be JPY 1,070,000 million, operating income to be JPY 454,000 million, net income of JPY 328,500 million, net income attributable to owners of the parent to be JPY 328,500 million or basic earnings per share to be JPY 452.34 against net sales to be JPY 950.0 billion, operating income to be JPY 374.0 billion, net income of JPY 275.0 billion.
お知らせ • Dec 12Advantest Corporation to Report Q3, 2026 Results on Jan 28, 2026Advantest Corporation announced that they will report Q3, 2026 results on Jan 28, 2026
お知らせ • Dec 11+ 1 more updateAdvantest Corporation Unveils T2000 AiR2X Air-Cooled SoC and Power Analog Test SolutionAdvantest Corporation announced the T2000 AiR2X, a next-generation air-cooled test system engineered to meet rising demand for compact, cost-efficient testers in evaluation and high-mix, low-volume production environments. The new solution is fully compatible with the conventional T2000 test system and delivers twice the test resources of the previous air-cooled T2000 AiR test system, while maintaining low power and air-cooling requirements. The T2000 AiR2X addresses multiple converging market factors, including end-of-life support for legacy systems such as the T6500 series and T7700 series, and ongoing replacement needs across compact air-cooled testers. With a multitude of air-cooled SoC test systems in operation worldwide, the new T2000 AiR2X solution positions Advantest to meet sustained demand in this growing market. With its flexible measurement configuration, the T2000AR2X supports up to 12 measurement modules, including functional/SCAN test, high-precision DC and automotive device DC testing up to 320V. The system's unique multisite controller function significantly reduces test time during volume production. The T2000 AiR 2X incorporates Advantest's T2000 RECT550 performance board, which flexibly supports a wide range of configurations, along with a unified support infrastructure and expandable module options, adopting the same program environment used in the T2000. In addition, the Rapid Development Kit (RDK) significantly reduces the effort required for program creation and debugging, contributing to shorter platform migration and implementation times. Initial device evaluations are underway, confirming broad application coverage for the T2000 AiR2 X across industrial MCUs, consumer ASICs, battery-monitoring ICs for automotive and mobile devices, and power analog applications. The system will enter general availability later this month.
お知らせ • Oct 30Advantest Corporation Unveils MTe - Unified, Scalable Test Platform for Power Semiconductor DevicesAdvantest Corporation announced the MTe power test platform. The cutting-edge MTe redefines test efficiency and scalability to address test requirements for the fast-growing power semiconductor market. Increasing market demand for electrification across automotive, industrial, renewable energy, telecommunication and data infrastructure applications is pushing semiconductor manufacturers to achieve higher performance and lower cost of test (CoT). The MTe platform responds to these needs by combining modular hardware architecture, ultimate system scalability and advanced digital control, redefining the standard in power semiconductor test performance and efficiency. Designed with Advantest technology, MTe provides significant footprint reduction and optimized resource distribution without performance degradation--a key enabler to attract major IDM and OSAT players. The MTe platform is able to address emerging wide-bandgap semiconductor (e.g., SiC and GaN) challenges, as well as the integration of digital IP cores on power devices (e.g., IPM and IPD), providing high bandwidth capture, best-in-class gate driver control, dynamic (and short-circuit) test up to 10kA, and flexible high-voltage digital capabilities. Aligned with Advantest's history of providing scalable test platforms, MTe distributed computing architecture provides significant multisite test efficiency, enabling a high-parallel-test solution with optimized throughput. The MTe platform is now available worldwide. Early evaluations by customers in automotive and industrial power applications have confirmed significant productivity and throughput gains compared with legacy testers.
お知らせ • Oct 28+ 2 more updatesAdvantest Corporation Revises Consolidated Earnings Guidance for the Year Ending March 31, 2026Advantest Corporation revised consolidated earnings guidance for the year ending March 31, 2026. For the year the company now expects the Net Sales of JPY 950,000 million, Operating income of JPY 374,000 million, Net income of JPY 275,000 million, Basic earnings per share of JPY 378.06 as compared to previous guidance of Net Sales of JPY 835,000 million, Operating income of JPY 300,000 million, Net income of JPY 221,500 million, Basic earnings per share of JPY 302.71. In CY2025, the semiconductor industry growth is likely to continue to be driven by AI-related semiconductors. In the semiconductor tester industry, tester demand is expected to exceed the previous year’s level, driven by factors such as the increasing complexity and enhanced performance, as well as rising production volumes of AI-related semiconductors. Based on this outlook and the progress made for the six-month period ended September 30, 2025, Advantest has revised its full-year consolidated earnings forecast for the current fiscal year as shown above. .
お知らせ • Oct 06+ 1 more updateAdvantest America, Inc. Announces It Is Reinventing Semiconductor Testing with the Power of Real-Time Artificial IntelligenceAdvantest America announced it is reinventing semiconductor testing with the power of real-time artificial intelligence (AI). Advantest is combining advanced machine learning (ML) from NVIDIA with the Advantest Cloud Solutions Real-Time Data Infrastructure (ACS RTDI™?) to drive a shift from traditional test workflows to adaptive AI-driven systems. NVIDIA has selected ACS RTDI for high-volume production to power its latest AI-enabled applications for Blackwell and next-generation devices --aiming to deliver breakthrough efficiency, reduced costs, and improved yields. Testing has long been the cornerstone of chip manufacturing, ensuring every device meets exacting standards of quality and performance. Traditionally, this required weeks of data collection, fault analysis, and test deployment cycles. ACS RTDI moves testing from validation to prediction--transforming semiconductor production into an AI-driven, continuously adaptive process. Integrated with NVIDIA AI inference, ACS RTDI could bring real-time intelligence to semiconductor testing. For NVIDIA Blackwell and future devices, massive data streams are ingested through ACS Data-Feed-Forward cross-insertion, where GPU-accelerated compute optimizes the test set for every chip. This scalable GPU architecture expands seamlessly, supporting the concurrent training of multiple ML models--enabling non-stop operation to drive yield gains, dynamically optimized test coverage, and sharp reductions in latency, power, and cost. Scaling AI Across Production: ACS RTDI has demonstrated its robustness at high-volume production sites worldwide, securely supporting AI/ML-driven test automation across diverse applications. Its flexible architecture --separating data preparation, algorithms, and decisioning--empowers manufacturers to rapidly adapt as production needs evolve. Advantest also plans to incorporate NVIDIA's NeMo and NVIDIA NIM microservices into ACS semiconductor test analytics solutions. These technologies will curate heterogeneous production data, evaluate models, and deploy AI agents capable of running generative AI applications directly in the test environment. Through this integration, Advantest is setting the stage for the next wave of semiconductor innovation --where AI not only accelerates the chip development process but also transforms how such chips are tested, validated, and delivered to market.
お知らせ • Sep 30Advantest Corporation Launches Power Optimization Solution to Enhance Energy Efficiency and Sustainability in Semiconductor TestingAdvantest Corporation launched its new Advantest Power Optimization Solution (APOS) for the V93000 system-on-chip (SoC) test platform. Designed to improve energy efficiency without compromising performance, the APOS software enables foundries and outsourced semiconductor assembly and test (OSAT) providers to achieve their sustainability goals while reducing operational costs. With energy consumption representing a significant operational expense, semiconductor companies are actively seeking ways to optimize power usage. Developed by Advantest's production service team, APOS provides a comprehensive power-saving framework, allowing users to visualize and manage V93000 tester power consumption in real time, helping to lower electricity costs while maintaining high throughput and test accuracy. In addition, APOS contributes to corporate sustainability efforts by improving tester energy efficiency and thereby reducing the overall carbon footprint. The APOS software has already been installed on V93000 test systems at multiple customer sites, yielding positive results in reducing test costs and strengthening environmental initiatives. Smart power management - APOS expands Advantest's Smart TestCell (STC) ecosystem, which leverages advanced automation and resource management to enable smart semiconductor manufacturing. APOS automatically enables/disables selected test cards based on real-world tester scenarios, reducing unnecessary power consumption. Real-time visualization - APOS Client Display provides an intuitive dashboard with real-time insights into power usage and card type, status and quantity used. Centralized control and reporting - The APOS Dashboard integrates with the Testcell Central System (TCS) Server Web Dashboard to centrally manage test-floor power-saving data and utilizes the history record for reporting and further optimization. The Advantest Power Optimization solution for the V93000 test platform is available now to the global market.
お知らせ • Sep 18Advantest Corporation Expands 7038 System-Level Test Platform with Right-Sized Single Test Rack Solution for High-Volume ManufacturingAdvantest Corporation announced its 7038 Single Test Rack (STR) system-level test (SLT) and burn-in test (BI) solution. The 7038 STR extends the company's proven 7038 SLT platform with a lower-cost architecture optimized for slot-based automated test solutions, enabling right-sized SLT deployment in the production of artificial intelligence (AI), high-performance compute (HPC), automotive, and other low- to mid-volume devices. The new 7038 STR delivers liquid-cooled thermal management of up to 1.4 kW per test site, enabling robust testing of today's most complex and power-hungry devices. Like the 7038 dual-rack test solution, the 7038 STR will also offer air-cooled thermal management for even more cost-effective test. With asynchronous test capability for up to 48 sites, the system offers a single-vendor turnkey solution that includes socket interface boards (SIBs), sockets, device multi-zone thermal management, software management and control, and an integrated automated handler. This single-source approach eliminates the need to obtain multiple components from different suppliers, streamlining deployment and reducing risk for customers. As device complexity and power requirements continue to rise in the HPC, AI, and automotive markets, the need for advanced SLT and BI solutions has grown significantly. In particular, automotive makers investing heavily in advanced driver assistance systems (ADAS) and telematics processing need a mid-power solution that goes beyond air-cooled thermal solutions for SLT. The 7038 STR provides a solution that can scale with the power and size increase of these processors. Air-cooled systems are limited to approximately 100 W per device, while the 7038 STR's liquid-cooled design supports the higher power levels demanded by next-generation processors with future upgrade capabilities exceeding 1.4 kW. "The 7038 STR represents the next evolution of system-level and burn-in test portfolio. The 7038 STR is especially suited for mid- to low-volume production environments where customers require advanced SLT/BI capabilities without the higher investment and larger footprint of dual-rack systems. Its compatibility with the broader 7038 product family means that customers can easily migrate test programs and hardware between the single- and dual-rack configurations as their production volumes grow. In addition, the system is fully compatible with ATS ActivATE360™?, Advantest's intuitive test management software. ActivATE provides turnkey real-time monitoring, logging, and control across device temperature, current, and power, simplifying program development and ensuring smooth integration into customer test environments. The 7038 Single Test Rack solution is available immediately, with pricing dependent on slot configuration, sites per slot, and thermal requirements.
お知らせ • Sep 12Advantest Corporation to Report Q2, 2026 Results on Oct 28, 2025Advantest Corporation announced that they will report Q2, 2026 results on Oct 28, 2025
お知らせ • Sep 09Advantest Introduces Advanced Mask CD-SEM* E3660Advantest Corporation announced the release of its next-generation CD-SEM* E3660, engineered for the dimensional metrology of photomasks and EUV masks used in cutting-edge semiconductor manufacturing. Compared to the previous generation's E3650, the E3660 delivers more than a 20% improvement in CD reproducibility, enabling process engineers to meet the stringent requirements of mask manufacturing at the 2nm node and beyond. By reinforcing lithography process control in advanced device fabrication, the E3660 furthers Advantest's vision of providing holistic test solutions across the semiconductor value chain. In semiconductor device fabrication, continuous scaling and pattern complexity are driving a sharp increase in lithographic hotspots--locations where multi-patterning and pattern transfer become particularly error-prone. Masks used to form wafer circuitry are evolving, with higher layer counts and more intricate geometries. This, in turn, has significantly increased the number of required metrology sites, demanding measurement systems with both higher throughput and superior reproducibility. The industry is also transitioning toward curvilinear mask patterns, enabled by advances in multi-beam mask writing and high-performance computing. These patterns are expected to see large-scale deployment around 2027 with the adoption of High Numerical Aperture EUV lithography in device production. To ensure design-to-mask fidelity under these conditions, CD-SEMs must not only provide highly reproducible critical dimension measurements but also generate SEM images with greater fidelity to true pattern contours. Moreover, metrology solutions must evolve to incorporate curvature-sensitive algorithms capable of quantifying deviations between complex mask features and original design intent. Leading up to the development of the E3660, Advantest has collaborated with imec, to validate the correlation of CD-SEM results obtained from the "E3650" with those from Advantest's previous generation CD-SEMs and EDA-based reference data. This enabled Advantest to improve metrology reliability and work with imec to advance the development and validation of new measurement techniques for curvilinear geometries. The E3660 platform reflects the outcome of this collaboration, achieving the reproducibility required for 2nm node mask manufacturing, enabling high-throughput measurement to handle increasing site counts, and providing unique measurement functions for curvilinear patterns. By integrating these capabilities, the E3660 is positioned to deliver robust metrology support for the next generation of mask R&D and production environments. Advantest will initially target the E3660 for deployment at Merchant Mask Shops, where commercial mask manufacturers produce masks for external customers, and Captive Mask Shops, which are in-house mask production facilities of semiconductor manufacturers. This activity establishes the E3660 as a core evaluation tool for advanced mask development and production qualification. Critical Dimension Scanning Electron Microscope: an electron microscope specialized for high-precision measurement of fine pattern dimensions on semiconductor wafers and masks.
お知らせ • Sep 04Advantest Corporation to Present Latest Test Solutions At SEMICON Taiwan 2025Advantest Corporation will present its latest test solutions at SEMICON Taiwan 2025 on Sept. 10-12 at the TaiNEX 1 & 2 in Taipei. At this year's SEMICON Taiwan, Advantest will present innovative, sustainable test technology guided by its new corporate vision, "Be the most trusted and valued test solution company in the semiconductor value chain." Moreover, Advantest's Taiwanese subsidiary will commemorate its 30th anniversary, celebrating decades of service to Taiwan's rapidly growing semiconductor market.
お知らせ • Aug 04Advantest Corporation to Showcase Latest Memory Test Solutions At Future of Memory and Storage 2025Advantest Corporation will showcase its latest memory test systems and solutions at the Future of Memory and Storage 2025 (formerly known as Flash Memory Summit) on Aug. 5-7 at the Santa Clara Convention Center in Santa Clara, California. Advantest is a gold sponsor of the event. Product Highlights: Advantest's booth #634 will be in Hall B of the convention center. The company will feature its end-to-end memory test solutions for testing next-generation memory chips, such as high-bandwidth memory (HBM), DRAM, NAND flash, non-volatile memory (NVM) and protocol storage devices. Advantest will also highlight its new T5801 ultra-high-speed DRAM test system that supports the latest advancements in high-speed memory technologies, including GDDR7, LPDDR6, and DDR6.
お知らせ • Jun 13Advantest Corporation to Report Q1, 2026 Results on Jul 29, 2025Advantest Corporation announced that they will report Q1, 2026 results at 9:00 AM, Tokyo Standard Time on Jul 29, 2025
お知らせ • May 12Advantest Corporation to Showcase Latest Test Solutions At Semicon Southeast Asia 2025Advantest Corporation will feature its latest test solutions at SEMICON Southeast Asia 2025 on May 20-22 at the Sands Expo and Convention Centre in Singapore. Located in Hall A on Level 1 at Booth #L1511, Advantest will showcase a wide range of solutions that address the technology challenges in the era of complexity. Through this broad product portfolio, Advantest can cater to diverse customer needs, optimizing efficiency to enable critical applications like high-performance computing (HPC), AI, automotive, and 5G/IoT, while supporting crucial technologies such as silicon photonics, high-bandwidth memory (HBM) and 2.5D/3D packaging. Advantest's product highlights will include: NEW SiConic, a scalable solution for automated silicon validation. Designed to address the increasing complexity of advanced systems-on-chip (SoCs), SiConic enables design verification (DV) and silicon validation (SV) engineers to achieve faster sign-off with unparalleled reliability, efficiency and collaboration. Solutions for the V93000 EXA Scale test system, including the Wave Scale RF20ex high-bandwidth RF IC test card, the PMUX02 advanced power multiplexer, the DC Scale XHC32 ultra-high-current power supply card, and the high-speed Pin Scale Multilevel Serial HSIO instrument. Extending the V93000 test system's capabilities to support high-volume production of silicon photonics and co-packaged optics devices via a partnership with FormFactor. The HA1200 die-level handler that can be linked with a tester to utilize Advantest's unique active thermal control technology to test singulated and/or partially assembled dies. ACS Real-Time Data Infrastructure (ACS RTDI™?), a solution platform that automates the process of converting insights into actionable production steps within the same test insertion in milliseconds, optimizing yield, improving quality and reducing time to market. ACS Gemini™? software development platform, which acts as the digital twin to ACS RTDI™? to allow customers to develop, simulate and debug machine learning applications in a virtual environment. NEW Advantest Power Optimization Solution (APOS), a software solution designed to optimize the power management during the V93000 tester's power-on period. It enables foundries and outsourced semiconductor assembly and test (OSAT) providers to achieve their sustainability goals while reducing operational costs.
お知らせ • May 08Advantest Corporation Unveils SiConic Test Engineering: Unified, Scalable Bench Environment for Debug and ValidationAdvantest Corporation unveiled SiConic Test Engineering (TE), the newest addition to the SiConic family introduced in February 2025. SiConic TE offers test engineers the ability to bring up and validate structural and functional tests over high-speed I/O (HSIO) interfaces in a scalable bench environment, enabling earlier validation and debug without occupying valuable ATE systems. SiConic Link flexibly connects to standard evaluation boards through functional interfaces like USB, PCIe, control interfaces, and GPIOs. This is the foundation for SiConic TE to enable test engineers to rapidly validate and debug design verification (DV) and design for test (DFT) content in SiConic's unified environment on the bench. Building on the V93000 test system's leadership in scan over USB or PCIe, SiConic's unified environment brings native DV test content to test engineering without the error-prone and lengthy conversion and debug cycles typical for bring-up of advanced functional tests on ATE. Integrating seamlessly with SiConic Link hardware and the SmarTest 8 software platform, SiConic TE provides users with comprehensive access to functional HSIO links for enhanced throughput and rich trace capabilities during test execution. By enabling smoother handoffs between silicon validation (SV), DV and TE teams, SiConic TE fosters tighter cross-domain collaboration. Through its unified test environment and shared ecosystem, SiConic TE improves the correlation between bench, ATE and SLT systems. The tool's optimized engineering resources allow bring-up and debug to be offloaded from ATE to the bench, freeing up valuable tester capacity and enabling more effective scaling. In addition, tight integration with leading EDA partners enables cross-functional collaboration with leading EDA partners enables Cross-functional collaboration with DV and DFT teams, improving test content development and speeding first-silicon success. Advantest developed SiConic TE in close collaboration with leading customers and EDA partners to ensure seamless integration into existing design and validation flows.
お知らせ • Apr 25+ 1 more updateAdvantest Corporation, Annual General Meeting, Jun 27, 2025Advantest Corporation, Annual General Meeting, Jun 27, 2025.
お知らせ • Mar 18Advantest Corporation to Showcase Latest IC Test Solutions at SEMICON China 2025, March 26-28 in ShanghaiAdvantest Corporation will showcase its latest test solutions at SEMICON China 2025 on March 26-28 at the Shanghai New International Expo Centre in Shanghai. Advantest will highlight its broad portfolio of test technology for applications, including advanced memory, automotive, RF wireless communications and CMOS image sensors. Advantest will be located at booth #4431 in Hall N4. This year's digital display will feature key test solutions that enable innovation and technology essential to daily lives, including: NEW T5801 Ultra-High-Speed DRAM test system, engineered to support the latest advancements in high-speed memory technologies, including GDDR7, LPDDR6 and DDR6. NEW solutions for the V93000 EXA Scale test system, including the Wave Scale RF20ex high-bandwidth RF IC test card, the PMUX02 advanced power multiplexer, the DC Scale XHC32 ultra-high-current power supply card, and the high-speed Pin Scale Multilevel Serial HSIO instrument. T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive, power analog and CMOS image sensors. T6391 test system for high-speed, high-accuracy and high-voltage measurement demands to test emerging display driver ICs. ACS TE-Cloud™?, a one-stop test engineering solution platform, offering a complete test development environment with an integrated set of software tools for V93000 test program development. ACS Real-Time Data Infrastructure (ACS RTDI™?), a solution platform that automates the process of converting insights into actionable production steps within the same test insertion in milliseconds, optimizing yield, improving quality and reducing time to market.
お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2025 Results on Apr 25, 2025Advantest Corporation announced that they will report fiscal year 2025 results on Apr 25, 2025
お知らせ • Feb 27Advantest Corporation to Showcase IC Test Solutions at IESA Vision Summit 2025Advantest Corporation will showcase its latest test solutions at IESA Vision Summit 2025 on March 5-7 at the Mahatma Mandir, Convention and Exhibition Centre in Gandhinagar, Gujarat, India. Advantest will highlight its broad portfolio of leading-edge test technology for applications, including advanced memory, automotive, artificial intelligence (AI) and high-performance computing (HPC). The IESA Vision Summit is the premier platform dedicated to advancing India's semiconductor and electronics ecosystem, bringing together industry leaders, government policymakers, innovators and experts to discuss cutting-edge technologies, emerging trends and transformative collaborations. As a global leader in providing semiconductor test solutions, Advantest is eager to show its support for India's emerging semiconductor industry. The company is a gold sponsor for this year's event. Product Displays: Advantest will be located at booth #212 in Hall 1. This year's digital display will feature key test solutions that enable innovation and technology essential to daily lives, including: NEW SiConic, a scalable solution for automated silicon validation. Designed to address the increasing complexity of advanced systems-on-chip (SoCs), SiConic enables design verification (DV) and silicon validation (SV) engineers to achieve faster sign-off with unparalleled reliability, efficiency and collaboration. NEW solutions for the V93000 EXA Scale test system, including the Wave Scale RF20ex high-bandwidth RFIC test card, the DC Scale XHC32 ultra-high-current power supply card and the high-speed Pin Scale Multilevel Serial HSIO instrument. NEW T5801 Ultra-High-Speed DRAM test system, engineered to support the latest advancements in high-speed memory technologies - including GDDR7, LPDDR6 and DDR6 - critical to meeting the growing demands of artificial intelligence (AI), high-performance computing (H PC) and edge applications. Instruments for the V93000EXA Scale test system that enable the testing of power and analog devices, such as battery management systems (BMS), automotive and power ICs, including the new PMUX02 advanced power multiplexer and the Pin Scale 5000 digital card.
お知らせ • Feb 20Advantest Introduces Siconic: Groundbreaking Solution for Automated Silicon ValidationAdvantest Corporation unveiled SiConic: a scalable solution for automated silicon validation. Designed to address the increasing complexity of advanced systems-on-chip (SoCs), SiConic enables design verification (DV) and silicon validation (SV) engineers to achieve faster sign-off with unparalleled reliability, efficiency and collaboration. Debuting next week at DVCon in San Jose, Calif., SiConic signals Advantest’s commitment to transforming the R&D process for its customers. The semiconductor industry is facing unprecedented challenges. Growing SoC design complexity, together with the adoption of 3D packaging and heterogeneous integration, is straining traditional validation workflows. DV and SV teams are under pressure to reduce time-to-market and time-to-quality – even as more devices with more intricate features are being developed within constrictive timelines. Reusing the wealth of verification content developed in pre-silicon would provide an efficiency and quality breakthrough. However, the industry lacks the automated flow and tools to reliably re-use and extend verification tests for silicon validation. SiConic’s ecosystem – including EDA partners such as Cadence, Siemens and Synopsys – overcomes this barrier to reuse, enabling engineering efficiency and accelerated test execution on real silicon. SiConic Explorer, the platform’s software backbone, offers an automated flow by integrating seamlessly with EDA verification tools based on the Accellera Portable Test and Stimulus Standard (PSS), e.g., the Cadence Perspec System Verifier. In addition, integration with debuggers, such as Lauterbach’s TRACE32 debugging tool, accelerates the bring-up of complex multi-IP test cases. SiConic Link is the hardware foundation of the SiConic solution on a bench. With its high-speed I/O (HSIO) capability, SiConic Link supports protocols such as PCIe and USB to enable functional validation with high throughput and rich tracing capabilities during test execution. The test instrument provides control interfaces (e.g., JTAG, SPI) and general-purpose I/Os, improves the debugging workflow and provides extensive control and observability of the device in its target board environment. With SiConic, DV engineers can now leverage familiar pre-silicon techniques, expanding their functional coverage in post-silicon. Similarly, SV engineers benefit from seamless load, set parameters and debug of PSS-based or manually directed content on silicon, thereby enabling rapid and reliable device bring-up and functional characterization. The highly portable solution can be easily scaled for use by distributed global R&D teams collaborating on a complex SoC with diverse IP blocks. SiConic enables confident sign-off decisions through team collaboration and data-driven insights – building trust with customers receiving early samples and expecting reliable ramp and operation during the lifetime of their systems. Leading Advantest IC customers and EDA partners are already working with SiConic and seeing the benefits of its performance and productivity advantages.
お知らせ • Feb 13Advantest Corporation to Showcase Latest Test Solutions at SEMICON Korea 2025, Feb. 19-21, in SeoulAdvantest Corporation will showcase its latest test solutions at SEMICON Korea 2025 on Feb. 19-21 at COEX in Seoul, South Korea. Advantest will highlight its broad portfolio of test technology for applications, including advanced memory, 5G, artificial intelligence (AI) and high-performance computing (HPC). In addition, as one of the founding members of SEMI's Semiconductor Climate Consortium (SCC), the company plans to promote its ESG initiatives at this year's show.
お知らせ • Feb 12Advantest Corporation Unveils T5801 Ultra-High-Speed Memory Test System to Power Next-Generation DRAM DevicesAdvantest Corporation announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge platform is engineered to support the latest advancements in high-speed memory technologies – including GDDR7, LPDDR6, and DDR6 – critical to meeting the growing demands of artificial intelligence (AI), high-performance computing (HPC) and edge applications. Increasingly complex, high-speed memory technologies are pushing the boundaries of data center and AI performance. The T5801 is tailored to address this challenge by enabling accurate and efficient mass production testing for the highest-speed memory devices. Featuring an innovative Front-End Unit (FEU) architecture, the system is uniquely equipped to handle the rigorous requirements of next-generation DRAM modules, delivering industry-leading performance of up to 36Gbps PAM3 and 18Gbps NRZ. The T5801 builds on Advantest’s market leadership in DRAM test solutions, including the proven T5503 series and V93000HSM systems. Its support for PAM3, a first in JEDEC-standard DRAMs, highlights the system’s capacity to handle memory innovations such as GDDR7, which is central to achieving ultra-low latency in all AI environments. Its scalable testing infrastructure enables a seamless transition from engineering R&D to production, offering flexible configurations and full compatibility with existing handlers and interfaces. Already in use by strategic memory customers, the T5801 DRAM test system will be released to the global market early next year. To learn more about the ultra-high-speed T5801, as well as Advantest’s full line of automated test equipment and materials, visit booth P201 at SEMICON Korea 2025, February 19-21, at COEX in Seoul, South Korea. Note to Editors: GDDR7 = Graphics Double Data Rate 7; LPDDR6 = Low Power Double Data Rate 6; DDR6 = Double Data Rate 6; PAM3 = Pulse Amplitude Modulation 3.
お知らせ • Dec 13Advantest Corporation to Report Q3, 2025 Results on Jan 29, 2025Advantest Corporation announced that they will report Q3, 2025 results on Jan 29, 2025
お知らせ • Dec 09Advantest Corporation Launches KGD Test Cell for Power SemiconductorsAdvantest Corporation announced an integrated test cell designed to maximize die-level test yields for wide-bandgap (WBG) devices essential to power semiconductors. The Advantest Known Good Die (KGD) Test Cell combines the company’s CREA MT series power device testers with the new HA1100 die prober. Demand for power semiconductors continues to grow with the rapid escalation of electric vehicles (EV) and power infrastructure. WBG devices, particularly silicon carbide (SiC) and gallium nitride (GaN), are essential for the design and manufacture of power semiconductors, enabling them to be smaller, faster and more efficient than silicon-based devices. However, screening for failures in WBG devices is challenging, as the probe card, chuck and devices can be damaged due to the high voltage and current at which they operate. Essentially serving as a one-stop shop for efficient equipment management, the Advantest KGD test cell solution helps reduce customers’ manufacturing costs. CREA’s proprietary probe card interface (PCI) technology can eliminate damage risk. However, if damage does occur, Advantest can investigate it using the test cell, allowing customers to minimize downtime. The HA1100 die prober for the CREA MT series test systems enables the assembly of dies in power modules using only passed (KGD) die, ensuring no failed die find their way into the module. This prevents yield loss at module test, thus reducing the loss of final multi-die assembled power modules. Currently under development, the HA1100 die prober will be released to the global market in the second quarter of 2025.
お知らせ • Dec 05Advantest Launches ACS Gemini – New Developer Platform for Accelerating ACS RTDI Application DevelopmentAdvantest Corporation announced the launch of its new software development platform ACS Gemini, which allows customers to develop, simulate and debug machine learning applications in a virtual environment. The digital twin of ACS RTDI, ACS Gemini is part of Advantest’s mission to enable customers and partners to utilize data analytics in developing artificial intelligence (AI) and machine learning (ML) solutions for semiconductor testing. In recent years, manufacturing costs for semiconductors have increased significantly due to their growing complexity. Analysts at McKinsey & Company predict that implementing AI and ML could lower manufacturing costs by 40%, as many engineers use these technologies to optimize efficiency in manufacturing. ACS Gemini improves efficiency by providing customers with a seamlessly integrated experience that optimizes design-to-production proficiency in the virtual ACS RTDI environment. The digital twin software solution is composed of the ACS Software Development Kit, Reference Application Development Model, and Containerized applications publishable to the ACS Container Hub™. These elements enable customers to simulate valuable test results in a virtual production setting. ACS Gemini saves customers time and cost in engineering debugging, design vs. production correlation, and cloud deployment of apps – ultimately saving valuable tester time. Overall, the solution accelerates ML application development, simulates testing results, and shortens the time-to-deployment of ML applications on the production test floor. Advantest’s ACS RTDI is a real-time data infrastructure platform-as-a-service that securely collects, analyzes, stores and monitors semiconductor test data to empower customers to automate the process of converting insights into actionable test decisions within milliseconds. This helps customers and partners reduce test time, optimize quality and reliability and enhance smart packaging. The solution will be available to the global market in early 2025.
お知らせ • Nov 19+ 1 more updateAdvantest Announces Advanced Power Multiplexer for V93000 EXA Scale Test PlatformAdvantest Corporation announced a new power multiplexer developed specifically for use on the V93000 EXA Scale SoC test platform. The PMUX02 Power MUX offers unprecedented capabilities for multi-site testing of power and analog devices, including battery management systems (BMS), automotive, and power management ICs. With 22 switches – nearly double the switch density of its predecessor – and an extended voltage range of ±160 volts (V), PMUX02 will help streamline and reduce the cost-of-test for these high-pin-count, mixed-signal devices. A power mux switches between multiple power sources and instruments to provide uninterrupted power and measurement to devices under test (DUTs). Electric vehicles (EVs) are a key driver behind the need for advanced power muxes. Increasing the number of cells stacked in an EV’s battery module improves its efficiency, and stacks of 24+ cells require the BMS to operate at 150V or higher. Moreover, as automotive ICs become increasingly complex with higher pin counts, more parallel sites are required to increase throughput, requiring more multiplexers. PMUX02 provides a denser array of relays in the test head and uses the system bus for communication, eliminating I2C driver circuitry and freeing up valuable loadboard space. Up to 16 PMUX02 cards can be installed in an EXA Scale system; the exact number depends heavily on the specific customer application and site count. An optional air cooling kit is also available. PMUX02 is fully compatible with its predecessor, PMUX01, enabling customers to utilize the same loadboards for their applications. In addition, PMUX02 is integrated into Advantest’s SmarTest 8 control software environment and takes advantage of the same powerful routing tools as PMUX01—which is crucial for agile application development. Customers are already harnessing the power of the PMUX02 Power MUX for BMS and power management IC projects. The PMUX02 will be available to the global market beginning in early 2025.
お知らせ • Oct 30+ 1 more updateAdvantest Corporation Declares Interim Dividend for the Year Ending March 31, 2025Advantest Corporation at its board meeting held on October 30, 2024 resolved interim dividend of JPY 19.00 per share for the year ending March 31, 2025, the company paid JPY 65.00 per share in the previous year. Record date is September 30, 2024. Effective Date is December 2, 2024.
お知らせ • Sep 13Advantest Corporation to Report Q2, 2025 Results on Oct 30, 2024Advantest Corporation announced that they will report Q2, 2025 results on Oct 30, 2024
お知らせ • Jul 03Advantest Corporation to Showcase Latest Test Technology at SEMICON West 2024Advantest Corporation will showcase its latest IC test solutions at SEMICON West 2024 on July 9-11 at the Moscone Center in San Francisco. Advantest will highlight its broad portfolio of test technology for applications, including AI and high-performance computing (HPC), 5G, automotive and advanced memory. In addition, as one of the founding members of SEMI's Semiconductor Climate Consortium (SCC), the company plans to promote its ESG initiatives at 2024's SEMICON West. Product Displays: Advantest will be located at booth #1039 in the South Hall. This year’s display will feature key test solutions that enable innovation and technology essential to its daily lives. Products include: NEW: The DC Scale XHC32 power supply, offering 32 channels with an unprecedented total current of up to 640A and unique safety capabilities for unmatched equipment protection to optimize test of AI, HPC, and other high-current devices; Pin Scale Multilevel Serial that is both the first native and fully integrated HSIO instrument expanding the V93000 EXA Scale platform to address signaling requirements for advanced communication interfaces; HA1200, offering die test capability with active thermal control to enable at-speed 100% test coverage before the dies are assembled into 2.5D/3D packages; CREA’s power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer, single-die, substrate, PKG, and module, typically used in industrial and automotive applications; T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive and power analog, and IP Engine 4 test solutions for fastest image processing to reduce CIS testing time and costs; ACS Real-Time Data Infrastructure (ACS RTDI™), an open solutions ecosystem enabling streaming data access and real-time analytics with integrated test software and hardware monitoring and control to improve semiconductor device yield, quality, and capacity; Next-generation Flash/NVM test solutions, such as T5851-STM32G, capable of testing and covering the latest generation of embedded protocol NAND devices with UFS/PCIe interface up to 32 Gbps and T5230 with a combined array architecture to reduce test cost for NAND/NVM wafer test, including DRAM wafer-level burn-in (WLBI).
お知らせ • Jun 15Advantest Corporation to Report Q1, 2025 Results on Jul 31, 2024Advantest Corporation announced that they will report Q1, 2025 results on Jul 31, 2024
お知らせ • May 22Advantest Corporation to Exhibit Latest Test Solutions At SEMICON Southeast Asia, May 28-30, 2024Advantest Corporation will feature its latest test solutions at SEMICON Southeast Asia 2024 on May 28-30, 2024 at the Malaysia International Trade and Exhibition Centre (MITEC) in Kuala Lumpur, Malaysia. Advantest is a gold sponsor of this year's event. In Hall 3 booth #1008, Advantest will exhibit a broad range of test solutions that enable critical applications like high-performance computing (HPC), AI, automotive, and 5G/IoT. Advantest's digital display will include: Test Platforms and Handlers: NEW: The DC Scale XHC32 power supply offers 32 channels with an unprecedented total current of up to 640A and unique safety capabilities for unmatched equipment protection to optimize test of AI, HPC, and other high-current devices. Pin Scale Multilevel Serial that is both the first native and fully integrated HSIO instrument expanding the V93000 EXA Scale platform to address signaling requirements for advanced communication interfaces. HA1200, offering die test capability with active thermal control to enable at-speed 100% test coverage before the dies are assembled into 2.5D/3D packages. CREA's power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer, single-die, substrate, PKG, and module, typically used in industrial and automotive applications. Next-generation Flash/NVM test solutions, such as T5851-STM32G capable of testing and covering the latest generation of embedded protocol NAND devices with UFS/PCIe interface up to 32 Gbps and T5230 with a combined array architecture to reduce test cost for NAND/NVM wafer test, including DRAM wafer-level burn-in (WLBI). Global Services Field service solutions focused on increasing customers' automation efficiency by creating a test cell solution complete with handlers and testers for high-volume manufacturing.
お知らせ • Apr 28+ 2 more updatesAdvantest Corporation, Annual General Meeting, Jun 28, 2024Advantest Corporation, Annual General Meeting, Jun 28, 2024.
お知らせ • Mar 15Advantest Corporation to Report Fiscal Year 2024 Results on Apr 26, 2024Advantest Corporation announced that they will report fiscal year 2024 results on Apr 26, 2024
お知らせ • Mar 12Advantest to Exhibit Latest Test Solutions at SEMICON China, March 20-22 in ShanghaiAdvantest Corporation will feature its latest test solutions at SEMICON China 2024 on March 20-22 at the Shanghai New International Exhibit Center (SNIEC). In a unique application-based exhibit, Advantest will highlight how its test technology enables innovations in high-performance computing (HPC), AI, automotive, IoT and 5G. Advantest aims to develop test technology that supports a safe, secure and sustainable society, showcasing its sustainability initiatives at this year's event. AI/HPC: NEW: Pin Scale Multilevel Serial that is both the first native and fully integrated HSIO instrument expanding the V93000 EXA Scale platform to address signaling requirements for advanced communication interfaces. NEW: HA1200, offering die test capability with active thermal control to enable at-speed 100% test coverage before the dies are assembled into 2.5D/3D packages. NEW: 2kW active thermal solution for M487x package handler series, offering thermal control capabilities to enable 100% test coverage for high computing ICs at final test. Automotive: CREA’s power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer, single-die, substrate, PKG, and module, typically used in industrial and automotive applications. T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive and power analog, and IP Engine 4 test solutions for fastest image processing to reduce CIS testing time and costs. T6391 test system with LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs. IoT/5G: V93000 Wave Scale millimeter OTA enables far-field/near-field parametric OTA testing for millimeter wave applications (5GNR2, WiGiG, Car Radar). The solution covers multi-site testing for mass production and could be easily integrated into existing test infrastructure. Wave Scale RF, designed for cost-efficient production of 5G and Wi-Fi communication ICs, including WiFi 7 and WiFi 6E devices. Data Storage and Management: NEW: T5230 memory test system adopts a combined array architecture to reduce test cost for NAND/NVM wafer test, including wafer-level burn-in (WLBI). Wide-ranging DRAM turn-key test solutions, including wafer-level burn-in, DRAM wafer test, core final test, and at-speed interface test. T5830 SSTH memory wafer test system, offering a small economic footprint and full CP test coverage for eFlash/Smart Card and NOR/NAND flash.
お知らせ • Feb 29Advantest Corporation Announces Management Changes, Effective April 1, 2024Advantest Corporation announced that the Board of Directors at its meeting held on February 28, 2024, resolved to change the company’s representative directors as follows. Reason for the changes: As the company’s next mid-term management plan starts in fiscal year 2024, the Chief Executive Officer of the Advantest Group and the President of Advantest Corporation are to be changed in order to realize even greater progress for the Advantest Group in the rapidly changing, fast-growing semiconductor industry. The company appointed Douglas Lefever as Representative Director, Senior Executive Officer, Group CEO from Representative Director, Corporate Vice President, Group COO; Yoshiaki Yoshida as Director, Chairperson of the Board from Representative Director, President, Group CEO. Effective date: April 1, 2024. Douglas Lefever (December 10, 1970): May 1993- Completed BSE of Mechanical Engineering, The University of Michigan; May 1995- Completed Master of Science in Mechanical Engineering, The University of Texas at Austin; June 1998- Joined Advantest America Inc.; June 2004- Completed Master of Business Administration (MBA) Northwestern University; September 2008- Vice President, Business Development, Advantest America Inc.; August 2014-Executive Officer, Advantest Corporation; September 2014- Director, President and CEO, Advantest America Inc.; June 2017- Managing Executive Officer, Advantest Corporation; June 2019- Executive Vice President, System Test Business Unit (present position); June 2020- Director, Managing Executive Officer Customer Relations & Corporate Strategy Leader, Applied Research & Venture Team; June 2021- Director, Senior Executive Officer CSO (Chief Strategy Officer); January 2023- Representative Director, Corporate Vice President, Group COO (present position).
お知らせ • Feb 02Advantest Corporation Revises Earnings Forecast for the Year Ending March 31, 2024Advantest Corporation revised earnings forecast for the year ending March 31, 2024. For the period, the company expected net sales of ¥480,000 million, operating income of ¥85,000 million and net income attributable to owners of the parent of ¥64,500 million.
お知らせ • Dec 16Advantest Corporation to Report Q3, 2024 Results on Jan 31, 2024Advantest Corporation announced that they will report Q3, 2024 results on Jan 31, 2024
お知らせ • Dec 12+ 1 more updateAdvantest Corporation Launches Real-Time Data Infrastructure (Rtdi™?) Platform Driving the Next Generation of Semiconductor TestAdvantest Corporation announced that its newly launched ACS Real-Time Data Infrastructure (RTDI™?) has been accepted by multiple major data analytics companies as part of an industry-wide collaboration to accelerate data analytics and artificial intelligence (AI)/machine learning (ML) decision-making within a single, integrated platform. ACS RTDI is a real-time data infrastructure that securely collects, analyzes, stores and monitors semiconductor test data to empower customers to automate the process of converting insights into actionable test decisions within milliseconds. This helps customers and partners reduce test time, optimize quality and reliability and enhance smart packaging. The ACS RTDI platform integrates data sources across the entire IC manufacturing supply chain while employing low-latency edge computing and analytics in a secure True Zero Trust™? environment. This innovative infrastructure minimizes the need for human intervention, streamlining overall data utilization across multiple inserted and supporting customers' databases. Because cyber security remains a top concern among customers, the ACS RTDI platform was architected to be reliable and safe, ensuring hassle-free OS revisions, which protects data from unauthorized access or loss by leveraging True Zero Trust. Overall, the new ACS ecosystem will enable customers to boost quality, yield, and operational efficiencies, and to accelerate product development and new product introductions for years to come.
お知らせ • Dec 07Advantest Corporation Targets NAND Flash/NVM Market with New Group of Memory Test ProductsAdvantest Corporation announced three new additions to its suite of memory test products. The new offerings are designed to target NAND Flash and non-volatile memory (NVM) devices, which face extreme pressure to bring down test costs and cost of ownership on the test floor. The new products include the T5230 memory wafer test solution; the STM32G third-generation protocol NAND system-level test module for the T5851 memory tester; and the T5835 high-speed wafer-sort interface option. The T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability. The T5851-STM32G module is designed to cover the latest generation of protocol NAND devices, including UFS4.0 and PCIe Gen 5 ball grid array (BGA) packaged devices for high-speed system-level NAND testing at up to 32Gbps. Fully upgradeable and compatible with existing T5851 systems, the new module delivers tester-per-DUT (device under test) performance and is qualified for high-volume manufacturing, qualification, reliability and characterization. Created as an option for the proven T5835 multifunction memory test system, the new high-speed wafer- Sort interface enables high-speed NAND Flash/NVM wafer probing (up to 5.4Gbps) with 4,096 full I/O channels. Raw NAND die inside solid-state drives (SSDs) require increasingly higher-speed functionality, necessitating evaluation and test of die performance at the wafer level, not just in package-level final test. The solution delivers high-speed probe interface with wafer-level evaluation of memory core test functionalities during engineering production, contributing to the T5835's overall value by delivering wider test coverage.
お知らせ • Nov 10Advantest Corporation to Showcase Latest Test Solutions at SEMICON Europa 2023, Nov. 14-17, in Munich, GermanyAdvantest Corporation will showcase its latest IC test solutions at SEMICON Europa 2023 on Nov. 14-17 at the Messe Munich in Munich, Germany. Under the theme "Beyond the Technology Horizon," Advantest will highlight its wide portfolio of test technology for applications including automotive, 5G, AI and high-performance computing (HPC). This year's SEMICON Europa will happen in conjunction with productronica, a trade fair focusing on the newest innovations and trends in electronics manufacturing. Advantest will be located at booth #317 in Hall B1. This year's digital display will feature key products, including: V93000 EXA Scale SoC test systems, highlighting automotive test solutions and the new XPS128+HV universal VI and power supply card that lowers the cost of test for power management ICs and other high-voltage devices. CREA's power semiconductor test equipment for a wide variety of power devices, including SiC and GaN power testing on wafer DIE and module, typically used in industrial and automotive applications. ACS open solutions ecosystem enabling streaming data access and real-time analytics with integrated test software and hardware monitoring and control to improve semiconductor device yield, quality, and capacity.
お知らせ • Nov 01+ 1 more updateAdvantest Corporation Provides Earnings Forecast for the Year Ending March 31, 2024Advantest Corporation provided Earnings Forecast for the year ending March 31, 2024. For the period, the company expected Net sales of JPY 470,000 million, Operating income of JPY 80,000 million, Net income of JPY 60,000 million, Net income attributable to owners of the parent of JPY 60,000 million.
お知らせ • Oct 25Advantest Corporation Announces A New Active Thermal Control (ATC) Option for Its M4841 High-Volume Device HandlerAdvantest Corporation announced a new Active Thermal Control (ATC) option for its M4841 high-volume device handler. ATC 2.0 provides dynamic regulation of temperature fluctuations caused by automotive semiconductors self-heating during test, helping to ensure more accurate production test of up to 16 advanced systems-on-chip (SoCs) in parallel with higher throughput and shorter test times. Massive amounts of data processing are required for devices used to power electric vehicles (EVs) and other fast-growing, data-intensive automotive applications such as infotainment systems and forthcoming Level 4 autonomous driving. Advances in semiconductor manufacturing processes bring improvements in functionality as well as enhanced power efficiency for these advanced devices. As a result, thermal design power is actually increasing, causing devices to self-heat during test and making it more difficult to control test temperature. This creates a need for handlers that can perform prompt, stable device temperature management. Replacing the handler’s prior passive thermal control technology, integrated ATC enables the M4841 to provide a stable, consistent test environment with fast response and high load-tracking characteristics that maintain the device’s internal temperature at the set test temperature, even if dynamic heat fluctuation occurs during the test. This stability enables users to build test programs with unparalleled implementation flexibility – in turn, significantly enhancing overall test productivity. Advantest’s M4841 handler with ATC 2.0 enables high-throughput test of up to 16 devices in parallel, yielding very high device volumes and supporting a range of complex ICs and packages. Its advanced performance capabilities and features make the M4841 the optimal test handler for high-volume production of devices used in consumer products such as portable digital equipment and automotive systems. The new ATC option for the M4841 handler will be available in April 2024.
お知らせ • Oct 05Advantest Corporation to Showcase Latest Semiconductor Test Solutions At the International Test Conference in Anaheim, CaliforniaAdvantest Corporation announced that it will feature its latest test solutions for advanced ICs at the 2023 International Test Conference (ITC) on Oct. 8-13 at the Disneyland Convention Center in Anaheim, California. International Test Conference is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. Advantest is a proud Platinum sponsor of ITC 2023 and will also sponsor the IEEE Automotive, Reliability, Test & Safety Workshop (ARTS) and Silicon Lifecycle Management Workshop (SLM), which will take place in conjunction with this year’s event. Products and Demos: Advantest's product showcase in booth #217 will highlight the company’s broad portfolio, including ATE, device interface, System Level Test (SLT) and analytics solutions that add customer value to the evolving semiconductor value chain. This year's digital displays will include: V93000 EXA Scale SoC test systems, including the new XPS128+HV universal VI and power supply card that lowers the cost of test for power management ICs and other high-voltage devices; DUT Scale Duo interface for the V93000 EXA Scale SoC test systems that extends DUT board space for high-volume testing and is compatible with existing DUT boards; Link Scale channel cards for the V93000 platform that improve test coverage and boost throughput in high-quality testing of complex SoCs, adding software-based functional test and HSIO SCAN test capabilities; The ACS open solutions ecosystem that is a family of products and services based on a single scalable data platform that enables third-party developers and customers to develop valuable data insights powered by the ACS Real-Time Data Infrastructure. Using real-time machine learning solutions, customers can turn these valuable insights into production-worthy actions across the entire semiconductor value chain resulting in increased yields, more rapid time-to-market, accelerated time-to-volume, and superior quality for suppliers; Advantest’s System Level Test platforms that achieve cost-effective structural test coverage (SCAN, MBIST, LBIST etc.) over functional high-speed IO interface, which can be leveraged to test over 700 DFT-enabled DUTs on ATS 7038. The seamless portability of the structural test patterns developed for ATE platform (Advantest V93000) on to ATS 7038 will be featured as well.
お知らせ • Sep 28Advantest Corporation Receives PCI Express(R) Gen 5 Certification for MPT3000 Solid-State Drive Test SystemsAdvantest Corporation announced that its MPT3000 solid-state drive (SSD) test system has become the world's first SSD production tester to be certified by PCI-SIG(R) for high-speed compliance testing of PCI Express(R) (PCIe(R)) fifth-generation (Gen 5 or 5.0) devices. Advantest completed the rigorous testing process and was awarded certification in August 2023. Previously approved for PCIe 4.0 compliance testing, the MPT3000 is now also approved for official PCIe 5.0 compliance and certification testing. The PCIe 5.0 certification was awarded specifically to two key products in the MPT3000 family: the MPT3000ES3 for engineering and the MPT3000HVM3 for high-volume manufacturing.
お知らせ • Sep 16Advantest Corporation to Report Q2, 2024 Results on Oct 31, 2023Advantest Corporation announced that they will report Q2, 2024 results on Oct 31, 2023
お知らせ • Aug 03Advantest Corporation to Showcase Latest Memory and SSD System-Level Test Solutions At Flash Memory Summit 2023Advantest Corporation will showcase its latest storage and memory test solutions at Flash Memory Summit 2023 on Aug. 8-10 at the Santa Clara Convention Center in Santa Clara, California. Advantest is again a gold sponsor of this year's event. Advantest's booth #634 will be located in Hall B of the convention center. This year's display will feature the MPT3000HVM3 test system that addresses test requirements associated with PCI Express fifth generation (PCIe Gen 5), Compute Express Link (CXL) and NVMe solid state drives (SSDs). Its latest innovation, the HVM3, provides broad capabilities to handle virtually any SSD, from the highest-performing enterprise drives to the most cost-effective client devices. Advantest will also exhibit its all-in-one, turnkey NAND test solution, the T5835, as well as the T5503HS2, a DRAM tester for LPDDR5/X, DDR5 and GDDR6 devices. Additionally, Advantest will display its inteXcell, the first-ever fully integrated and unified test infrastructure to combine broad test coverage with high-throughput handling. The platform integrates the T5835 tester with minimal-footprint test cells for high-speed, parallel final test of up to 1,536 advanced memory ICs. Two new additions to Advantest's lineup this year are the Independent Thermal Control (ITC) device interface board and the Engineering Thermal Chamber (ETC) for the MPT3000. Both provide QA and R&D teams with advanced, accurate thermal control on a per-DUT level during device characterization or small lot production testing, helping QA and engineering teams to characterize and qualify Gen 5 products, including SSDs and CXL memory solutions. Both extend MPT3000's feature set to a wider set of use cases.
お知らせ • Jun 21Advantest Corporation to Exhibit Latest IC Test Solutions at SEMICON China, June 29- July 1 in ShanghaiAdvantest Corporation will feature its latest test solutions at SEMICON China 2023 on June 29-July 1 at the Shanghai New International Expo Center in Shanghai. Under the theme "Beyond the Technology Horizon," Advantest will highlight its contributions to test technology, including advanced memory, 5G, AI, high-performance computing (HPC) and nanotechnology, as well as its ESG initiatives. Advantest's product showcase in booth #E3423 in Hall E3 will feature how the company is adding customer value to the evolving semiconductor value chain through its broad range of test solutions and services. This year's exhibit will include: EXA Scale EX test station for the V93000 platform, which increases tester capacity in IC engineering labs by four times without increased footprint, supporting a seamless transition of test content from lab to fab and lowering facility costs. DUT Scale Duo interface for the V93000 EXA Scale SoC test systems extends DUT board space for high-volume testing and is compatible with existing DUT boards. Link Scale channel cards for the V93000 platform that improve test coverage and boost throughput in high-quality testing of complex SoCs, adding software-based functional test and HSIO SCAN test capabilities. T2000 SoC test systems with Rapid Development Kit (RDK) for all SoCs, including automotive and power analog, and IP Engine 4 test solutions for fastest image processing to reduce CIS testing time and costs. LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs when combined with the T6391 test system. inteXcell, the first-ever fully integrated and unified test infrastructure to combine the T5835 tester into minimal-footprint test cells, ideal for advanced memory IC final testing. T5830ES memory test system that is highly flexible and offers all of the capabilities needed to perform wafer testing and final testing of price-sensitive flash memories.
お知らせ • Jun 16Advantest Corporation to Report Q1, 2024 Results on Jul 26, 2023Advantest Corporation announced that they will report Q1, 2024 results on Jul 26, 2023
お知らせ • May 19Advantest Corporation Declares Year End Dividend for the Year Ended March 31, 2023, Payable on June 5, 2023Advantest Corporation declared year-end dividend of JPY 70.00 per share against JPY 70.00 per share paid a year ago. Effective date is June 5, 2023. Record date is March 31, 2023.
お知らせ • May 09Advantest Corporation Ships 10,000th V93000 SoC Test SystemAdvantest Corporation announced it has shipped its 10,000(th) V93000 system-on-chip (SoC) test system to longtime customer Infineon Technologies, the world's number one automotive semiconductor supplier. The milestone system is a V93000 configuration developed to address the diverse test needs of power, analog, microcontroller and sensor ICs used in automotive and microcontroller applications. Ever-increasing semiconductor content in today's automobiles is creating a pressing need for the V93000's combination of advanced test capabilities and leading cost-of-test savings. In the more than two decades since its introduction, the flexible, scalable V93000 has become Advantest's SoC test platform. The company offers a wide range of V93000 options together with complementary test instruments including universal analog and digital test cards, RF instrumentation and mixed-signal cards, and best-in-class DPS and floating-power VI cards as well as the user-friendly SmarTest system software environment. The newest V93000 offering is the EXA Scale generation system for testing a wide range of devices, from current and future generations of low-costInternet of Things (IoT) chips to high-end automotive devices, highly integrated multicore processors, and advanced digital ICs up to the exascale performance class.
お知らせ • Feb 01+ 2 more updatesAdvantest Corporation Provides Dividend Guidance for the Year Ending March 31, 2023Advantest Corporation provided dividend guidance for the year ending March 31, 2023. For the year, the company expects to pay dividend of ¥70.00 against ¥70.00 paid last year.
お知らせ • Jan 25Advantest Corporation to Showcase Latest Semiconductor Test Solutions At SEMICON KoreaAdvantest Corporation will feature its latest test solutions for advanced ICs at SEMICON Korea on Feb. 1-3 at COEX in Seoul, South Korea. The company will highlight its contributions to leading-edge test technology, including advanced memory, 5G, AI, high-performance computing (HPC) and nanotechnology, as well as its ESG initiatives. Exhibition: The company's product showcase in booth #C510 will feature how the company is adding customer value to the evolving semiconductor value chain through its broad range of test solutions and services. This year's digital displays will include: New inteXcell, first-ever fully integrated and unified test infrastructure to combine the T5835 tester into minimal-footprint test cells, ideal for advanced memory IC final testing; New E5620 Defect Review Scanning Electron Microscope (DR-SEM) for precision review and classification of ultra-small photomask defects; New XPS128+HV universal VI and power supply card for V93000 EXA Scale SoC test system that lowers the cost of test for power management ICs and other high-voltage devices; New DUT Scale Duo interface for the V93000 EXA Scale SoC test systems extends DUT board space for high-volume testing and is compatible with existing DUT boards; New LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs when combined with the T6391 SoC tester; T2000 SoC test systems with improving Rapid Development Kit (RDK) usability, which accelerates test program development for all SoCs, including complex automotive and power analog applications; MPT3000 solid state drive (SSD) test systems addressing test requirements associated with PCI Express fifth generation (PCIe Gen 5), Compute Express Link™ (CXL™) and NVMe SSDs.
お知らせ • Dec 16Advantest Corporation to Report Q3, 2023 Results on Jan 31, 2023Advantest Corporation announced that they will report Q3, 2023 results on Jan 31, 2023
お知らせ • Dec 08Advantest Corporation to Showcase Latest IC Test Solutions At SEMICON JapanAdvantest Corporation will feature over a dozen of its latest products and services at the SEMICON Japan trade show on December 14-16 in Tokyo. Under the theme Beyond the Technology Horizon, Advantest’s exhibit will showcase its contributions to accelerating the development of revolutionary test technology, including AI, high-performance computing (HPC), cloud-based technologies and high-power ICs. In addition to showcasing advanced test technologies, Advantest will also highlight its ESG initiatives and action plans. Exhibition: The company’s product showcase in booth #1549, located in East Hall 1, will demonstrate how the company is adding customer value to the evolving semiconductor value chain through various test solutions and services. This year’s displays will include: NEW: inteXcell, first-ever fully integrated and unified test infrastructure to combine the T5835 tester into minimal-footprint test cells, ideal for advanced memory IC final testing; NEW: E5620 Defect Review Scanning Electron Microscope (DR-SEM) for precision review and classification of ultra-small photomask defects; NEW: XPS128+HV universal VI and power supply card for V93000 EXA Scale SoC test system that lowers the cost of test for power management ICs and other high-voltage devices; NEW: LCD HP multi-channel digitizer module that addresses high-accuracy and high-voltage measurement demands for testing emerging display driver ICs when combined with the T6391 SoC tester; T2000 SoC test systems with improving Rapid Development Kit (RDK) usability, which accelerates test program development for all SoCs, including complex automotive and power analog applications; NEW: MPT3000 solid state drive (SSD) test systems addressing test requirements associated with PCI Express fifth generation (PCIe Gen 5), Compute Express Link™ (CXL™) and NVMe SSDs; Die level test for 2.5D and 3D package devices with accurate die alignment technology; ACS open ecosystem enabling streaming data access and real-time analytics with integrated test software and hardware monitoring and control to improve semiconductor device yield, quality, and capacity; Software solutions and services, including CONNECT+ and Adaptive Probe Cleaning.
お知らせ • Dec 03Advantest Corporation Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask DefectsAdvantest Corporation unveiled the E5620 Defect Review Scanning Electron Microscope its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to contribute appreciably to production quality improvements in next-generation photomasks and shorter mask manufacturing turnaround times. Like its predecessor, the E5620 implements Advantest's highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. The system has a number of improvements specifically to target future mask requirements. E5620 Key New Features, HigSpatatial Resolution, Highly Stable, Fully Automatic Image Capture, mpatible with Mask Inspection n Systems, Elemental Composition Analysis Option, Backscattered Electron Analysis Option, T E5620 0 DR-SEM is available for purchase now. Advantest will share further details regarding its new E5620 DR-SEM during SEMICON Japan 2022, December 14-16, at Tokyo Big Sight.
お知らせ • Nov 30Advantest Introduces New inteXcell Series of High-Performance, Economical Test Cells for Advanced Memory ICsAdvantest Corporation has launched inteXcell, a new line of minimal-footprint test cells designed to address demanding final-test requirements presented by the increasing bit densities, lower power consumption and faster interface speeds of future memory devices. This new final test cell infrastructure integrates a T5835 memory tester optimized for use in high-productivity test cells and is designed to adopt future memory solutions. With inteXcell, ICs can be tested on the same platform from initial engineering through mass production. inteXcell is the first ever fully integrated and unified test solution to combine broad test coverage with high-throughput handling in a highly flexible system architecture. Early units can test up to 1,536 devices in parallel with high speed and high accuracy. The new test cells have a compact structure that enables up to 384 simultaneous measurements per cell and uses only one-third of the floor space occupied by conventional test systems. Since each cell uses independent asynchronous testing, inteXcell can be configured anywhere from one to four testers, enabling high equipment utilization and streamlined cell-based maintenance. The inteXcell platform is expected to begin shipping to customers in the second quarter of 2023. Orders are now being taken by Advantest.
お知らせ • Nov 23+ 1 more updateAdvantest Corporation Expands T6391 Display Driver Tester Capabilities with New Per-Pin Digitizer and Comparator (LCD HP)Advantest Corporation announced its new LCD HP (high-performance) per-pin digitizer and comparator module. Developed for use with the T6391 display driver test system, the LCD HP module features two key performance improvements. First, it improves measurement precision 5x compared to the previous module, making it ideally suited to accommodate the testing demands of advanced display driver ICs (DDICs) for high-end smartphones and augmented/virtual reality (AR/VR) applications. Second, it can handle high-voltage testing up to ±40V, enabling the module to address the high-reliability testing demands of brand-new automotive DDICs. Display panels used in devices such as OLEDs for smartphones and AR/VR glasses require very high gradation. In turn, the DDICs for these displays need to subdivide the output voltage into finer, more narrow steps, so high-precision voltage measurement is needed to test them. The higher the gradation, the more precise the voltage measurement must be. At the same time, DDICs for the automotive market have typically contained separate chips for the source and gate drivers and the timing and touch controllers. Now that these functions will all be integrated into a single chip, demand for a tester capable of testing all device functionality in one insertion is growing rapidly. The LCD HP module achieves noise reduction and uniform measurement accuracy between channels in the test system to enable high-precision measurement. It covers test requirements of new advanced DDICs for high-end smartphone and AR/VR applications, enabling the tester to support high-gradation testing with measurement accuracy of ±200mV. In addition, by supporting high-voltage testing up to ±40V with certain loads, the module enables functional testing of automotive DDICs that reflect their actual operations. The T6391 LCD HP module is highly compatible with existing modules, enabling fast, easy integration with the customer’s test setup. Currently in evaluation with a leading display IC provider, the new module is expected to be available for customer purchase in the second quarter of 2023. To learn more about the LCD HP module and Advantest’s full line of test and measurement offerings, please visit the company in booth 1549 during SEMICON Japan 2022, December 14-16, at Tokyo Big Sight.
お知らせ • Oct 26Advantest Launches Universal VI and Power Supply Card for V93000EXA Scale SoC Test SystemAdvantest Corporation announced the latest addition to its Extended Power Supply (XPS) card series: the DC Scale XPS128+HV. This universal voltage-current (VI) instrument combines a high channel count (128 channels per card) with per-channel voltage ranges of up to +24V creating a test solution that efficiently addresses the test requirements for high-voltage devices such as USB Power Delivery components and charger functionalities in power management ICs (PMICs). The XPS128+HV provides full channel compatibility with the existing XPS256 card, enabling efficient, highly parallel test of power management devices with enhanced capability for high-voltage applications while continuing to cover existing applications in the low-voltage domain. The new card meets these device requirements for a cost-efficient, large-pin-count ATE system with many power VI channels. The XPS uses Advantest’s Xtreme RegulationTM technology, enabling a seamless change of operating modes from a force voltage to a force or sink current mode. This is often required when testing power management components such as low-dropout (LDO) or DC/DC regulators. Another capability of the Xtreme RegulationTM is its sequencer-controlled range changes, allowing extremely fast, deterministic test times without signal spikes that can damage a device under test (DUT). The XPS128+HV instrument can supply ICs ranging from -10V to +24V with sufficient current rating on all 128 channels in parallel. Flexible ganging allows a combination of multiple channels to achieve an even higher current, enabling testing of DC/DC converters, which require multiple-ampere load current. In addition, the card offers excellent force and measurement accuracy, which is a prerequisite for precise device trimming. Besides being used for PMIC testing, the new card can act as a standard power supply for high-performance computing and automotive applications, as well as microcontrollers (MCUs).
お知らせ • Sep 16Advantest Corporation to Report Q2, 2023 Results on Oct 27, 2022Advantest Corporation announced that they will report Q2, 2023 results on Oct 27, 2022
お知らせ • Sep 15Advantest Corporation Launches ACS Solution Store to Enable Real-Time Data Analytics Solutions for Semiconductor TestAdvantest Corporation rolled out the Advantest ACS Solution Store, an advanced online platform that provides ease of access to ACS real-time data infrastructure solutions and software applications. Customers can conveniently discover, purchase and securely deploy all available ACS solutions from Advantest and a broad spectrum of analytics ecosystem partners across the semiconductor lifecycle process. In addition, the ACS Solution Store enables application developers from these partner firms to publish, promote, distribute and manage their Advantest-certified apps. Capabilities incorporated in the ACS Solution Store include browsing for available ACS solutions in an online catalog and discovering how the solutions help customers transform data into real-time production control, delivering significant ROI for the semiconductor manufacturing process. In addition, automated software distribution is enabled via the ACS Container Hub for containerized1 apps, which ensures an easy, secure and reliable deployment of the apps in the test fleet. Key benefits of the ACS Solution store include: Purpose Built: enabling customers to buy and deploy Advantest-certified ACS apps from ecosystem partners with assured quality, verified security and guaranteed compatibility on Advantest test equipment. Optimized and Integrated: to provide customers with solutions tailored to deliver improved yield, quality, OEE and time to market. Convenient: a one-stop ecosystem portal where customers can seamlessly and securely deploy ready-made or custom-built company and partner apps from a single, trusted source, maximizing the value they can realize from ACS Edge and ACS Nexus, the key building blocks of the ACS real-time data infrastructure. Versatile: open solution ecosystem enables third-party developers and customers to develop data analytics solutions powered by ACS real-time data infrastructure. Advantest launched ACS as part of its Grand Design strategy to enhance edge and cloud infrastructure services, data analytics and AI/machine learning solutions as a means of helping customers accomplish data-driven workflows. The ACS product family is based on a scalable data platform and forms an open solutions ecosystem for software apps developed by Advantest and ACS ecosystem partners. The ACS Solution Store is the next vital building block in advancing this platform.
お知らせ • Jul 29Advantest Corporation (TSE:6857) announces an Equity Buyback for 10,000,000 shares, representing 5.26% for ¥50,000 million.Advantest Corporation (TSE:6857) announces a share repurchase program. Under the program, the company will repurchase up to 10,000,000 shares, representing 5.26% of outstanding shares for ¥50,000 million. The company will repurchase its shares for the purpose of shareholder returns, improving capital efficiency and future restricted stock compensation plans. The program will expire on December 23, 2022. As of June 30, 2022, the company had 190,168,871 shares in outstanding and 9,373,394 shares in treasury.
お知らせ • Jul 28+ 2 more updatesAdvantest Corporation Revises Earnings Guidance for the Year Ending March 31, 2023Advantest Corporation revised earnings guidance for the year ending March 31, 2023. For the period, the company revised net sales from JPY 510,000 million to JPY 550,000 million, operating income from JPY 150,000 million to JPY 170,000 million and net income from JPY 112,500 million to JPY 130,000 million.
お知らせ • Jul 27Advantest Corporation Adds System-Level Testing Capability for Advanced Memory ICs Used in High-Growth Automotive MarketAdvantest Corporation has installed its first enhanced T5851-STM16G tester capable of nonvolatile memory express (NVMe) system-level test coverage at a major manufacturer of IC memory devices. By expanding the capabilities of its established T5851 platform, Advantest is now able to address the growing market for testing NVMe solid-state drives (SSDs) using ball-grid arrays (BGAs), which are seeing rapidly increasing use in automotive applications including autonomous vehicles. Designed to perform system-level testing of NVMe BGA SSDs, the T5851-STM16G tester is ideally suited for evaluating any generation of BGA SSDs in either an engineering environment or a high-volume production site. The highly versatile platform can handle devices with multiple protocols, including NVMe, UFS and PCIe, at speeds up to 16 Gbps. The system’s modular, tester-per-DUT architecture supports test flows required for system-level testing of up to 768 devices simultaneously. These performance features help users get their newest memory designs to market faster. In addition, FutureSuite software ensures that the tester can be easily integrated with all other members of the T5800 product family to minimize learning curves. Advantest is now taking orders for the T5851-STM16G tester. It is available either as a new tester from Advantest’s factory or as a cost-effective enhancement to users’ existing T5851 or even T583X units.
お知らせ • Jun 16Advantest Corporation to Report Q1, 2023 Results on Jul 28, 2022Advantest Corporation announced that they will report Q1, 2023 results on Jul 28, 2022
お知らせ • Jun 02Advantest Corporation (TSE:6857) entered into an agreement to acquire Crea Collaudi Elettronici Automatizzati Srl.Advantest Corporation (TSE:6857) entered into an agreement to acquire Crea Collaudi Elettronici Automatizzati Srl on June 1, 2022. The closing of the transaction is subject to regulatory approvals. Pedersoli Studio Legale and Nagashima Ohno & Tsunematsu acted as Legal advisor and Houlihan Lokey acted as financial advisor in this transaction.
お知らせ • May 16Advantest Launches Compact Test Station for V93000 Platform, Enabling 4X Capacity Increase in IC Engineering LabsAdvantest Corporation is continuing to increase the value of its V93000 platform in engineering environments with the introduction of its EXA Scale EX test station, designed for structural and functional test bring up, debugging and characterization of complex digital devices. The highly compact and cost-efficient EXA Scale EX provides an optimized solution for boosting the capacity of engineering labs while also being fully compatible with high-volume manufacturing, making it easy for engineers to integrate newly developed test content into production-worthy test programs. The EXA Scale EX is well suited for use by high-volume chip makers as well as startup companies and design houses. The three-slot test head presents the most economical means of setting up a heavily concentrated engineering lab that includes a minimal footprint, low power consumption and a highly automated engineering test cell with integrated temperature control. When the new test head is paired with Advantest’s M4171 handler, a lab’s testing capacity can be quadrupled, without augmenting the existing floor space. In addition, mounting cameras on the handler can allow engineers to monitor the test cell’s operation while working remotely. The EXA Scale EX facilitates the quick and easy transfer of test content between engineering and manufacturing because both environments can use identical instruments and software, including a V93000-compatible DUT board, digital channel cards, device power supplies and the SmarTest 8 tester software. The resulting benefits include faster bring up and pattern validation of digital devices, which speed up the pace of new product introductions.
お知らせ • May 10Advantest Introduces Flexible DUT Interface Enabling Increased Parallelism on V93000 EXA Scale Test SystemsAdvantest Corporation has launched its DUT Scale Duo interface for the V93000 EXA Scale SoC test systems, enabling the industry’s highest level of parallelism for testing advanced semiconductors. With this revolutionary interface, the usable space on DUT boards and probe cards is increased by 50% or more while wafer probe and final-test set ups can accommodate component heights that are more than three times taller. In today’s testing environments, the number of devices that can be tested in parallel is most often limited by the component space on the probe card or DUT board, not by available tester resources. With fast-growing market segments including automotive, mobile and RF devices trending toward higher site counts, the need for more space on DUT boards for IC testing is becoming critical. In addition, leading-edge wafer probers and final-test handlers require more area on printed circuit boards to provide the most cost-efficient solutions, from single wafer touch-down capabilities in wafer probing to massively parallel final testing across 32 sites or more. Advantest offers the industry’s first DUT interface with the capability to adapt either to the existing standard DUT board or probe card size or to switch to the new, significantly larger size. Using a unique sliding mechanism, users can effortlessly switch back and forth between both formats to adapt to specific application requirements. Along with the new interface, a new super-stiff extended bridge achieves superior deflection performance in direct-probing set ups. The unit’s universal design gives it the versatility to support a wide range of applications including digital and RF device testing. With its sophisticated sensing capabilities, the extended bridge delivers the industry’s best planarity and high manufacturing yield, ensuring highly accurate positioning and verification of probe card clamping. The new interface’s performance has been verified by pilot customers before device ramp up for high-volume manufacturing. DUT Scale Duo is expected to be broadly available by the middle of this year.
お知らせ • Apr 26Advantest Corporation Rolls Out ACS Adaptive Probe Cleaning to Optimize Probe Card Cleaning EfficiencyAdvantest Corporation announced its industry-first ACS Adaptive Probe Cleaning (APC) solution to optimize the probe card cleaning cycle with efficacy. Part of Advantest’s ACS open solution ecosystem, APC has been proven with customers throughout Asia and Europe. STMicroelectronics has installed ACS APC at two of its manufacturing sites and is seeing cleaning cycle times slashed significantly to effective improves yield, lengthen probe card life cycle and increase system available time for test. While there are many techniques aimed at reducing test time and cost, probe cards cost presents an emerging challenge as pin count and functional complexity increase, so does the ratio of probe card expenses in both maintenance and life cycle management. Typically, chipmakers implement a fixed-cycle online cleaning method, which requires a learning curve to determine the ideal cleaning-to-yield-loss tradeoff and thus takes longer time in new device ramp and incur more loss than necessary. ACS APC introduces Advantest’s “adaptive interval” approach to probe tip cleaning. It uses artificial intelligence (AI) algorithms to assess needles’ dirtiness and cleans them only when yields are being affected to drastically reduce cleaning frequency. The machine learning model takes test result from the first wafer with a pre-fixed cleaning cycle to learn the failure pattern, then it shifts to adaptive cleaning for the rest of the wafers in the same lot. The assessment takes negligible time per wafer, without impacting test throughput. Jean-Luc Mariani, EWS Europe Operations & Technology Director and Chris Portelli-Hale, Test Technology R&D Director, both of ST Microelectronics, confirmed that they have installed several Advantest ACS APC units to aid in testing a variety of complex devices, and are seeing impressive results. They noted that their cleaning cycles have been significantly reduced, which has enabled them to cut probe card maintenance costs in half and bring about more effective probe card spare and life cycle management.
お知らせ • Apr 06Advantest Corporation Introduces New 3D Image ViewerAdvantest Corporation has introduced a new 3D image viewer, the Euclid, for its Hadatomo™ series of photoacoustic microscopes. The Euclid can display 3D images by superimposing data on melanin in the skin, the vascular network, and the skin structure, as measured by a Hadatomo™ tool, and can also easily create tomographic images. In addition, image display conditions can be imported as a configuration file, enabling easy comparisons of measurement data. The user-friendly 3D image viewer is an ideal tool for dermatological research in the fields of beauty and healthcare.
お知らせ • Jan 28Advantest Corporation Revises Consolidated Earnings Guidance for the Fiscal Year Ending March 31, 2022Advantest Corporation revised consolidated earnings guidance for the fiscal year ending March 31, 2022. For the year, the company expects net sales to be JPY 410.0 billion against previous guidance of JPY 400.0 billion. Operating income and income before income taxes, both to be JPY 115.0 billion against previous guidance of JPY 105.0 billion. Net income to be JPY 86.3 billion against previous guidance of JPY 78.8 billion.
お知らせ • Dec 09Advantest Corporation to Showcase Industry’s Most Advanced IC Test Solutions and Sponsor Industry Events at SEMICON Japan, December 15-17 in TokyoAdvantest Corporation will feature more than a dozen of its latest products and services at the SEMICON Japan trade show on December 15-17. This year’s exhibition is returning to Tokyo Big Sight as an in-person event, although some conference sessions will be offered online enabling remote participation as an option. Advantest’s exhibit in booth #2347 located in East Hall will demonstrate how the company is adding customer value in the evolving semiconductor value chain through a wide variety of test solutions and services. Displays will include: NEW: V93000 Link Scale channel cards for software-based functional and SCAN testing on the V93000 platform; NEW: T2000 ISS IP Engine 4, an image-processing engine for high-resolution and high-speed image processing; NEW: T5835 all-in-one high-speed memory test solution and T5221 NAND/NVM multi wafer-test solution, both software compatible with the industry-standard T583x test platform; NEW: Advantest Cloud Solutions™, a state-of-the-art, cloud-based ecosystem enabling users to manage test and equipment data as well as providing instant access to online training and service tools; MPT3000 test system for evaluating all solid-state drives; B6700 and H5620 series of burn-in memory testers; Remotely operable test handlers, enabling device and data handling from engineering labs to production test floors; Software tools and services including Advantest CONNECT+ remote support services and IQ Box for V93000 EXA Scale external calibration; E3650, a high-end MVM-SEM®, and E5610, a defect review SEM supporting next-generation photomasks; and Financing services providing pre-owned equipment solutions.
お知らせ • Dec 02Advantest Introduces Latest Image-Processing Engine for Testing CIS Devices Used in High-Resolution Smart PhonesAdvantest Corporation has begun shipping the fourth generation of its high-speed image-processing engine that applies heterogeneous computing technology to detect defects in the data output from today’s most advanced CMOS image sensors (CIS). When integrated on the proven T2000 ISS platform, the new T2000 IP Engine 4 (Image Processing Engine 4) system provides the optimal means of evaluating the latest high-resolution, high-speed CIS devices used in advanced smart phone cameras. While the number of cameras in smart phones is increasing, so is the pixel count per camera. Currently available CIS devices within today’s most advanced smart phones incorporate more than 100 million pixels to achieve high resolution. The new T2000 IP Engine 4 features enhanced computing power to handle huge volumes of imaging data while also reducing test times and the cost of test. Used along with Advantest’s 4.8GICAP image capture module, the new tester can perform high-volume, at-speed testing of the most advanced mobile CIS including 3.5-Gsps C-PHY and 4.8-Gbps D-PHY devices. Image-processing accelerators enable fast testing of high-resolution CIS with more than 200 million pixels. The system is supported by a dedicated image-processing library optimized for the IP Engine 4. The algorithms provided are suitable for high-speed image-processing environments, helping to facilitate test program development. Designed for installation on the T2000 ISS platform, the IP Engine 4 is fully compatible with previous generations of image-processing engines and is easily upgradable, enabling users to leverage their existing assets including test programs and probe cards.
お知らせ • Dec 01Advantest Corporation Introduces New T5835 Memory Tester for Advanced Drams and Nand Flash Devices with High-Speed InterfacesAdvantest Corporation announced the newest cost-efficient, high-volume memory tester in its T5800 product family. With its 5.4-Gbps operating speed and massive parallelism, the new T5835 system is a wide-coverage test solution for current and next-generation DRAM core and high-speed NAND devices. Interface speeds on both volatile and nonvolatile memory ICs are continuing to accelerate. Market trends indicate that mid-speed final testing of DRAM cores is increasing to achieve an optimal balance of reliability, test coverage and cost efficiency. Interface speeds for testing NAND memories can be more than 2 Gbps for today’s high-speed devices and are projected to exceed 4 Gbps for upcoming nonvolatile memories. IC makers need a test solution that can keep pace with escalating performance requirements while also maintaining or improving the overall cost of test. The new T5835 has full testing functionality for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to double-data-rate (DDR) and low-power double-data-rate (LPDDR) DRAM chips. In addition, the system’s built-in dedicated hardware functions allow it to reach throughput levels, lowering the cost of test. It can handle 768 devices simultaneously for final package-level testing. System capabilities include known-good-die (KGD) wafer-level testing of DRAMs, an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield. The T5835 is designed on the modular enhanced T5800 series platform to optimize scalability, flexibility and performance for both wafer sorting and final testing. It can be configured as either an engineering station for use in R&D environments or as a production-volume tester equipped with a small, medium or large test head. All system configurations are inherited from Advantest’s existing memory test system and leverage the Future Suite operating system to provide continuing test program compatibility. These features allow users to seamlessly transition from previous generations of the T5800 series while maintaining production efficiency.
お知らせ • Nov 30Advantest Announces New Versatile, High-Throughput Test Solution for NAND/Nonvolatile Flash Memory ICsAdvantest Corporation has introduced a new high-throughput memory tester for NAND flash devices that can perform functional testing of chips while delivering highly accurate timing, repeatability and failure detection. With data-transfer speeds that are more than five times faster than its predecessor, the new T5221 system is designed to improve production efficiencies while reducing test costs for wafer sorting, built-in self-testing (BIST) and wafer-level burn-in (WLBI). Worldwide sales of NAND wafer test equipment for multi-stacked type probers are approximately USD 100 million per year, accounting for an estimated seven percent of the total memory market. As the market grows, customers are shifting away from high-functionality wafer-sorting test equipment toward more cost-effective design-for-test (DFT) and BIST strategies using multi-probe systems. The T5221 is optimized for use with a multi-wafer prober. The system controller can simultaneously manage up to 12 test stations, each with independent testing capabilities. The combined-array architecture reduces test times while the tester’s massive parallelism allows it to perform wafer-level testing on up to 1,152 devices at once. The system’s test stations do not add to the overall footprint because they are housed within the multi-wafer prober. This allows the T5221 platform to use much less floor space than Advantest’s previous nonvolatile memory tester and a standalone prober. The new tester can be docked with either a 12-stage multi-wafer prober for use in mass production or single- or dual-wafer probers in engineering environments. Probe card design has been simplified to lower both the cost of ownership and cost of test. The unit incorporates a combined performance board that eliminates the need for a printed circuit board on the probe card. System features include two driver pins and one I/O pin for each device under test as well as a flexible algorithmic pattern generator (ALPG), a waveform generator and various self-diagnostic functions. To further enhance the T5221’s performance range, an optional upgrade is available to boost the power-supply level as high as 28 volts while still measuring small currents down to one nanoampere (nA). These capabilities are not available in many competitive products. There is even a “green” element to the new tester. The environmentally friendly design eliminates the use of toxic substances in separating and disassembling the system’s parts. The T5221’s operation is fully compatible with Advantest’s legacy memory solutions to provide users with a seamless transition from previous generations of equipment. T5221 testers are expected to begin shipping to customers by the first quarter of 2022.
お知らせ • Jul 01Advantest Corporation Announces Results of Clinical Study on the Identification of Covid-19 VirusesAdvantest Corporation has announced that the results of a clinical study on the identification of COVID-19 viruses using the company's nanoSCOUTER fine particle measurement instrument were published in Nature Communications, a peer-reviewed scientific journal, on June 17th. In the study, 100 saliva samples (50 negative for Covid-19 and 50 positive) were measured and analyzed within 5 minutes each. Sensitivity (the ability of the test to correctly identify positive samples) of 90% and specificity (the ability of the test to correctly identify negative samples) of 96% were achieved. A research group of the Institute of Scientific and Industrial Research at Osaka University is studying virus testing methods using the AI-based particle identification system developed by Aipore Inc.2 and the nanoSCOUTER™. The method used in the just-published study identifies viral particles by passing them through a nanoscale hole, through which a microcurrent is passed, and applying AI machine-learning to the highly accurate current waveform thus obtained. The results of this research3 can be expected to facilitate immediate diagnoses in hospitals as well as viral screening for large gatherings. In addition, machine-learning can be applied to many types of viruses, enabling early detection of novel pathogens. The nanoSCOUTER is a lightweight, desktop-sized fine particle measurement instrument that utilizes a precise nanopore (nanometer-scale pore) sensor module made with semiconductor manufacturing processes and Advantest's proprietary microcurrent measurement technology. It measures the quantity and particle size of fine particles on the order of 100 nanometers, such as viruses, exosomes, and liposomes, with great speed and accuracy. In addition, when the nanoSCOUTER is used in conjunction with Aipore Inc.'s AI-based particle identification system, it is possible to quickly identify the type of particles detected. At the present time, the product is a scientific instrument, not an approved medical device. Rapid and accurate testing methods, along with vaccines and therapeutic agents, are important measures for prevention of Covid-19 spread. Based on Advantest's corporate mission of "enabling technologies," the company will strive to further develop this technology so that the nanoSCOUTER™ can contribute to solving these vital issues.
お知らせ • Jun 18Advantest Corporation Developing Innovative Methodologies for High-Speed Scan and Software-Based Functional TestingAdvantest Corporation is pilot testing a next-generation solution for performing both high-speed scan testing and software-driven functional device testing on the V93000 platform by leveraging the existing high-speed serial I/O interfaces on advanced integrated circuits . This novel approach can correlate scan testing results between established and new test routines, boot up and execute on-chip test software and achieve a seamless end-to-end data flow in conjunction with Advantest’s partners in electronic design automation. The new capabilities are being developed on a new, modular card architecture that is expected to be broadly available next year. The V93000 platform will be able to quickly and cost-effectively handle the growing volume of scan test data resulting from increasing gate counts in today’s highly integrated semiconductors. The new methodologies also will be used to perform system-level-type functional testing of the complex interactions among numerous cores within system-on-chip devices, including the communication to an external host. This will add to structural test coverage and facilitate the correlation between automated test equipment and system-level testing. Together, these innovations will help bring software-based functional testing into the production environment, where potential defects can be dentified earlier during wafer-sort and packaged-device testing.
お知らせ • Mar 14Advantest Corporation to Report Fiscal Year 2021 Results on Apr 27, 2021Advantest Corporation announced that they will report fiscal year 2021 results on Apr 27, 2021
お知らせ • Jan 31Advantest Corporation Revises Earnings Guidance for the Full Year Ending March 31, 2021Advantest Corporation revised earnings guidance for the full year ending March 31, 2021. For the year, the company expects to report net sales of JPY 305,000 million, operating income of JPY 67,000 million and net income of JPY 61,500 million compared to previous guidance of net sales of JPY 275,000 million, operating income of JPY 52,500 million and net income of JPY 42,500 million for the same period.
お知らせ • Jan 13Advantest Corporation Ramps Production-Volume DC Scale XPS256 Device Power Supply (DPS) CardAdvantest Corporation announced that its DC Scale XPS256 Device Power Supply (DPS) card, developed for use with the V93000 EXA Scale™ SoC test system, is now ramping to production-volume test at leading makers of communications processors. Providing the industry’s first universal DPS pin capability, the XPS256 delivers high accuracy, performance and dynamic response for a variety of data-driven applications. Key markets such as mobile/broadband communications, high-performance computing (HPC) and artificial intelligence (AI) are driving unprecedented demand for massive data volumes. The XPS256 is designed to meet the associated stringent test-performance requirements, and leverages Advantest’s Xtreme Link™ technology to deliver massive scalability and flexibility. The XPS256 covers wide-ranging current requirements, implementing unlimited ganging to scale from milliamps (mA) to thousands of Amps with no performance degradation. Combining three instruments in a single power supply, the DPS pin delivers best-in-class flexibility, accuracy (± 150µV) and dynamic response, with full four-quadrant voltage-current (VI) capabilities and very small overshoot/undershoot, enabled by Advantest’s Xtreme Regulation. In addition, the card offers revolutionary probe needle protection and zero-overhead background profiling for current and voltage across the entire test flow; fine-granularity power delivery to ensure current balancing across the needles; and in-line contact-resistance monitoring for adaptive needle cleaning and preventive maintenance. With its ultra-fast hardware clamp, the XPS256 also protects the DUT, probe cards, and sockets against thermal runaways.
お知らせ • Dec 19Advantest Corporation to Report Q3, 2021 Results on Jan 28, 2021Advantest Corporation announced that they will report Q3, 2021 results on Jan 28, 2021
